EP0102565A2 - Méthode et dispositif pour tester électriquement des micro-câblages - Google Patents

Méthode et dispositif pour tester électriquement des micro-câblages Download PDF

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Publication number
EP0102565A2
EP0102565A2 EP83108084A EP83108084A EP0102565A2 EP 0102565 A2 EP0102565 A2 EP 0102565A2 EP 83108084 A EP83108084 A EP 83108084A EP 83108084 A EP83108084 A EP 83108084A EP 0102565 A2 EP0102565 A2 EP 0102565A2
Authority
EP
European Patent Office
Prior art keywords
tested
micro
electrodes
wiring
grid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP83108084A
Other languages
German (de)
English (en)
Other versions
EP0102565B1 (fr
EP0102565A3 (en
Inventor
Günter Dr. Ing. Doemens
Peter Dr. Rer.Nat. Mengel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Publication of EP0102565A2 publication Critical patent/EP0102565A2/fr
Publication of EP0102565A3 publication Critical patent/EP0102565A3/de
Application granted granted Critical
Publication of EP0102565B1 publication Critical patent/EP0102565B1/fr
Expired legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G01R1/072—Non contact-making probes containing ionised gas

Definitions

  • the invention relates to a method and a device for the electrical testing of micro-wirings that are wired in grid dimensions, for example printed circuit boards.
  • needle adapters are used in which a resilient contact pin is arranged in a support block serving as a grid body in each grid point.
  • the scanning elements consist of the above-mentioned pins, on which separate compression springs act.
  • the end region of the pins facing the contact points to be scanned is shaped into a tip or cutting edge, which ensure good contact . should.
  • the other end regions of the pins are connected to flexible electrical conductors, which in turn lead to the external electrical connections of the contacting device.
  • Gas discharge is based on the same principle as with a glow lamp: there are two electrodes in a glass vessel filled with noble gas. Due to external influences, few gas atoms are ionized. This ionization can be increased in a known manner. A highly percentage ionized gas, consisting of an equal number of free ions and electrons, which is quasi-neutral, is called plasma. The gas is a good insulator between the electrodes. If the applied voltage is increased, the glow path is ignited. The current flow through the gas ionizes it and the glow path emits light.
  • the invention has for its object to use simple means to design a method and a device that allow an alternative contact also for the electrical testing of microwiring with pitches of less than one millimeter.
  • the invention makes use of the knowledge of the structure of gas discharge displays.
  • the method according to the invention is that between two grid points, which are connected by a conductor track of a micro-wiring to be tested, a gas discharge occurs by applying a sufficiently high voltage to two electrodes, which enables a current to be transported, which is evaluated for test purposes. For example, the voltage is modulated and the current measured.
  • the main advantage of the invention is that the method for very small grid spacings, which can no longer be checked with an adapter can be used. In addition, it is an inexpensive solution, the implementation of which presents no technical difficulties.
  • alternating voltage is additionally applied to the electrodes to be tested and the resulting change in current is detected in a phase-sensitive manner to the applied alternating voltage. In this way, only partially interrupted conductor tracks or conductor tracks that have undergone a significant increase in resistance as a result of the etching process can be recognized and detected.
  • a device for performing the method according to the invention is that in the form of a contact plate, an insulator with parallel holes corresponding to the grid points of the micro-wiring to be tested is provided, that electrodes are arranged in these holes as the lower part of the hole facing the base plate as Leave the combustion chamber free for a gas discharge, that this combustion chamber is filled with a gas under a certain pressure and that the insulator rests firmly on the micro wiring to be tested in a gas atmosphere with reduced pressure, the combustion chambers being arranged directly above the grid points of the micro wiring.
  • Devices of this type can be produced in a simple manner using the techniques known in lithography and with physico-chemical processes in semiconductor technology and do not require any additional development work.
  • the electrical control of the gas discharge paths can largely rely on commercial electronics of the plasma displays can be used.
  • the invention is explained on the basis of a schematic illustration of an exemplary embodiment for the electrical testing of a printed circuit board.
  • a circuit board 1 carries on its top surface a conductor track 2 with pads 3.
  • pads 3 In an insulating body 4, which lies flat on the circuit board 1 to be tested, holes are made in the grid, of which only two are shown in section in the figure. These bores are partially filled with electrodes 5 so that a cavity 6 is formed between the circuit board surface and the electrode end. The entire arrangement is under reduced pressure (for example a few torr).
  • Insulating bodies can be used which are specially adapted to the circuit board to be tested and which have only as many holes as the grid points to be tested are provided. However, it is also conceivable to use insulating bodies which have a hole in each grid point and only fill the required holes with electrodes.
  • the device is sealed against the outside air pressure and is filled with a gas, which can also be air.
  • a gas which can also be air.
  • a certain reduced pressure compared to normal pressure is then produced in the vacuum system. This pressure depends on the voltage applied and the type of gas used as well as the size of the combustion chamber.
  • the insulator is placed on the contact plate with the micro-wiring to be tested. Then the electrical test is carried out.
  • the method and the device according to the invention are not restricted to use with grid dimensions of less than one millimeter, but can also be used, for example, in the border area in which adapter devices could just be used.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Relating To Insulation (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
EP83108084A 1982-08-25 1983-08-16 Méthode et dispositif pour tester électriquement des micro-câblages Expired EP0102565B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE3231598 1982-08-25
DE19823231598 DE3231598A1 (de) 1982-08-25 1982-08-25 Verfahren und vorrichtung zur elektrischen pruefung von mikroverdrahtungen

Publications (3)

Publication Number Publication Date
EP0102565A2 true EP0102565A2 (fr) 1984-03-14
EP0102565A3 EP0102565A3 (en) 1984-05-02
EP0102565B1 EP0102565B1 (fr) 1987-12-23

Family

ID=6171672

Family Applications (1)

Application Number Title Priority Date Filing Date
EP83108084A Expired EP0102565B1 (fr) 1982-08-25 1983-08-16 Méthode et dispositif pour tester électriquement des micro-câblages

Country Status (4)

Country Link
US (1) US4600878A (fr)
EP (1) EP0102565B1 (fr)
JP (1) JPS5965268A (fr)
DE (2) DE3231598A1 (fr)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0216135A1 (fr) * 1985-09-04 1987-04-01 Siemens Aktiengesellschaft Dispositif pour tester le fonctionnement électrique des interconnexions des circuits électriques, en particulier des circuits imprimés
EP0218058A1 (fr) * 1985-09-04 1987-04-15 Siemens Aktiengesellschaft Procédé pour tester le fonctionnement électrique de plage de connexion, en particulier d'un circuit imprimé
EP0285798A2 (fr) * 1987-03-31 1988-10-12 Siemens Aktiengesellschaft Dispositif de test électrique du fonctionnement de rangées de fils électriques, en particulier pour cartes de circuit
EP0285799A2 (fr) * 1987-03-31 1988-10-12 Siemens Aktiengesellschaft Dispositif de test électrique du fonctionnement de rangées de fils électriques, en particulier pour cartes de circuit
WO1991002986A1 (fr) * 1989-08-23 1991-03-07 Siemens Nixdorf Informationssysteme Aktiengesellschaft Dispositif pour le controle du fonctionnement electrique de champs de cablage, en particulier de cartes de circuits imprimes
EP0498007A1 (fr) * 1991-02-06 1992-08-12 International Business Machines Corporation Méthode et appareil pour l'essai sans contact
DE4310573A1 (de) * 1993-03-31 1994-10-06 Siemens Ag Plasmaadapter mit Matrixadressierung für die elektrische Funktionsprüfung von Verdrahtungsfeldern, insbesondere von Leiterplatten

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4771230A (en) * 1986-10-02 1988-09-13 Testamatic Corporation Electro-luminescent method and testing system for unpopulated printed circuit boards, ceramic substrates, and the like having both electrical and electro-optical read-out
EP0286814A3 (fr) * 1987-03-31 1990-03-21 Siemens Aktiengesellschaft Dispositif de commande
DE3888946D1 (de) * 1987-12-21 1994-05-11 Siemens Ag Ansteuereinrichtung für die Vorrichtung zur elektrischen Funktionsprüfung von Verdrahtungsfeldern.
JPH07140209A (ja) 1993-09-20 1995-06-02 Fujitsu Ltd 回路配線基板の検査装置およびその検査方法
US5587664A (en) * 1995-07-12 1996-12-24 Exsight Ltd. Laser-induced metallic plasma for non-contact inspection
US5818239A (en) * 1997-03-05 1998-10-06 International Business Machines Corporation Simplified contactless test of MCM thin film I/O nets using a plasma
US6118285A (en) * 1998-01-28 2000-09-12 Probot, Inc Non-contact plasma probe for testing electrical continuity of printed wire boards
AT507322B1 (de) * 2008-10-07 2011-07-15 Nanoident Technologies Ag Schaltvorrichtung zur elektrischen kontaktprüfung

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3096478A (en) * 1959-08-18 1963-07-02 Okonite Co Apparatus with conductive gas electrodes for detecting non-uniformity in electrically insulating and electrically semi-conducting materials
GB1316108A (en) * 1969-08-27 1973-05-09 British Aircraft Corp Ltd Apparatus for testing printed circuit boards
US4186338A (en) * 1976-12-16 1980-01-29 Genrad, Inc. Phase change detection method of and apparatus for current-tracing the location of faults on printed circuit boards and similar systems

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
ELEKTROTECHNISCHE ZEITSCHRIFT (E.T.Z.) Ausgabe A, Band 94, Nr. 2, 1973, Berlin L. BÖHME et al. "Lichtbogenstromabnehmer für Schnellbahnen", Seiten 128-130 *
IBM TECHNICAL DISCLOSURE BULLETIN, vol.14, no.5, October 1971; H.BOHLEN et al. "Tester for electric conductors", page 1601 *

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0216135A1 (fr) * 1985-09-04 1987-04-01 Siemens Aktiengesellschaft Dispositif pour tester le fonctionnement électrique des interconnexions des circuits électriques, en particulier des circuits imprimés
EP0218058A1 (fr) * 1985-09-04 1987-04-15 Siemens Aktiengesellschaft Procédé pour tester le fonctionnement électrique de plage de connexion, en particulier d'un circuit imprimé
US4705329A (en) * 1985-09-04 1987-11-10 Siemens Aktiengesellschaft Apparatus for electrical function checking of wiring matrices
US4777432A (en) * 1985-09-04 1988-10-11 Siemens Aktiengesellschaft Device for electrically checking printed circuit boards
US4891578A (en) * 1987-03-31 1990-01-02 Siemens Aktiengesellschaft Device for the electrical function testing of wiring matrices, particularly of printed circuit boards
EP0285799A2 (fr) * 1987-03-31 1988-10-12 Siemens Aktiengesellschaft Dispositif de test électrique du fonctionnement de rangées de fils électriques, en particulier pour cartes de circuit
EP0285798A2 (fr) * 1987-03-31 1988-10-12 Siemens Aktiengesellschaft Dispositif de test électrique du fonctionnement de rangées de fils électriques, en particulier pour cartes de circuit
US4897598A (en) * 1987-03-31 1990-01-30 Siemens Aktiengesellschaft Apparatus for electrical function testing of wiring matrices, particularly of printed circuit boards
EP0285798A3 (fr) * 1987-03-31 1990-03-07 Siemens Aktiengesellschaft Dispositif de test électrique du fonctionnement de rangées de fils électriques, en particulier pour cartes de circuit
EP0285799A3 (en) * 1987-03-31 1990-03-28 Siemens Aktiengesellschaft Device for the functional electric testing of wiring arrays, in particular of circuit boards
US4967148A (en) * 1987-03-31 1990-10-30 Siemens Aktiengesellschaft Apparatus for electrical function testing of wiring matrices, particularly of printed circuit boards
WO1991002986A1 (fr) * 1989-08-23 1991-03-07 Siemens Nixdorf Informationssysteme Aktiengesellschaft Dispositif pour le controle du fonctionnement electrique de champs de cablage, en particulier de cartes de circuits imprimes
US5148102A (en) * 1989-08-23 1992-09-15 Siemens Aktiengesellschaft Apparatus for the electrical function testing of wiring matrices, particularly of printed circuit boards
EP0498007A1 (fr) * 1991-02-06 1992-08-12 International Business Machines Corporation Méthode et appareil pour l'essai sans contact
DE4310573A1 (de) * 1993-03-31 1994-10-06 Siemens Ag Plasmaadapter mit Matrixadressierung für die elektrische Funktionsprüfung von Verdrahtungsfeldern, insbesondere von Leiterplatten

Also Published As

Publication number Publication date
JPH0324634B2 (fr) 1991-04-03
JPS5965268A (ja) 1984-04-13
EP0102565B1 (fr) 1987-12-23
EP0102565A3 (en) 1984-05-02
DE3231598A1 (de) 1984-03-01
DE3375046D1 (en) 1988-02-04
US4600878A (en) 1986-07-15

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