GB1316108A - Apparatus for testing printed circuit boards - Google Patents
Apparatus for testing printed circuit boardsInfo
- Publication number
- GB1316108A GB1316108A GB1316108DA GB1316108A GB 1316108 A GB1316108 A GB 1316108A GB 1316108D A GB1316108D A GB 1316108DA GB 1316108 A GB1316108 A GB 1316108A
- Authority
- GB
- United Kingdom
- Prior art keywords
- probe
- probes
- conductive
- bores
- aug
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
Abstract
1316108 Probes BRITISH AIRCRAFT CORP Ltd 19 Aug 1970 [27 Aug 1969] 42595/69 Heading H2E An apparatus (Fig. 1) for testing printed circuit boards comprises a dowelled jig 21 for locating a circuit board 23 with respect to a probe carrying member of insulating material 1 (Fig. 2). The conductive probes 5 and insulating pistons 6 are mounted in bores 2 and pass through sealed apertures in plate 7. Electrical connections are provided to each probe via wire 16, the conductive bush 15, and wire 18. The probes may be held in retracted position, by air pressure, applied down tube 12, and out of contact with the circuit by flange 8. To extend a selected probe, air pressure is equalized via tube 19 and due to the difference in surface areas under pressure the probe extends. Control means to select the probe(s) required may be automatic or manual, e.g. as indicated in Fig. 3 (not shown) where a programme plate is inserted to direct air flow as required. The probe may be provided with a buffer circuit. The probes may be actuated by hydraulic, vacuum, or spring means, and may extend to different lengths. The block 1 may be of conductive material, the bores having an insulated lining.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB4259569 | 1969-08-27 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB1316108A true GB1316108A (en) | 1973-05-09 |
Family
ID=10425133
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB1316108D Expired GB1316108A (en) | 1969-08-27 | 1969-08-27 | Apparatus for testing printed circuit boards |
Country Status (1)
| Country | Link |
|---|---|
| GB (1) | GB1316108A (en) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2617190A1 (en) * | 1975-05-17 | 1976-12-02 | Int Computers Ltd | DEVICES FOR TESTING ELECTRICAL DEVICES |
| US4465972A (en) * | 1982-04-05 | 1984-08-14 | Allied Corporation | Connection arrangement for printed circuit board testing apparatus |
| US4600878A (en) * | 1982-08-25 | 1986-07-15 | Siemens Aktiengesellschaft | Apparatus for testing electrical microprinted circuits utilizing ionizing gas for providing electrical connections |
| US4656419A (en) * | 1984-09-20 | 1987-04-07 | Hughes Aircraft Company | Simplified solar cell material tester |
| DE4333304C1 (en) * | 1993-09-30 | 1995-07-20 | Ptr Mestechnik Gmbh & Co Kg | Adaptor for testing circuit boards |
| GB2294365A (en) * | 1994-10-18 | 1996-04-24 | Bath Scient Ltd | Electrical test apparatus with individually actuable probes |
| WO1997039362A1 (en) * | 1994-10-18 | 1997-10-23 | Bath Scientific Limited | Apparatus for testing products with electrically interconnected networks |
| EP1422530A2 (en) * | 2002-11-19 | 2004-05-26 | Yokowo Co., Ltd. | Inspection jig for radio frequency device, and contact probe incorporated in the jig |
| EP1925944A2 (en) * | 2006-11-27 | 2008-05-28 | Feinmetall GmbH | Contacting device for performing contacting on electric devices to be tested and corresponding contacting method |
| WO2018086809A1 (en) * | 2016-11-10 | 2018-05-17 | Rosenberger Hochfrequenztechnik Gmbh & Co. Kg | Contact system and contact module |
-
1969
- 1969-08-27 GB GB1316108D patent/GB1316108A/en not_active Expired
Cited By (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2617190A1 (en) * | 1975-05-17 | 1976-12-02 | Int Computers Ltd | DEVICES FOR TESTING ELECTRICAL DEVICES |
| US4465972A (en) * | 1982-04-05 | 1984-08-14 | Allied Corporation | Connection arrangement for printed circuit board testing apparatus |
| US4600878A (en) * | 1982-08-25 | 1986-07-15 | Siemens Aktiengesellschaft | Apparatus for testing electrical microprinted circuits utilizing ionizing gas for providing electrical connections |
| US4656419A (en) * | 1984-09-20 | 1987-04-07 | Hughes Aircraft Company | Simplified solar cell material tester |
| DE4333304C1 (en) * | 1993-09-30 | 1995-07-20 | Ptr Mestechnik Gmbh & Co Kg | Adaptor for testing circuit boards |
| GB2294365A (en) * | 1994-10-18 | 1996-04-24 | Bath Scient Ltd | Electrical test apparatus with individually actuable probes |
| WO1997039362A1 (en) * | 1994-10-18 | 1997-10-23 | Bath Scientific Limited | Apparatus for testing products with electrically interconnected networks |
| EP1422530A2 (en) * | 2002-11-19 | 2004-05-26 | Yokowo Co., Ltd. | Inspection jig for radio frequency device, and contact probe incorporated in the jig |
| EP1422530A3 (en) * | 2002-11-19 | 2005-01-19 | Yokowo Co., Ltd. | Inspection jig for radio frequency device, and contact probe incorporated in the jig |
| EP1925944A2 (en) * | 2006-11-27 | 2008-05-28 | Feinmetall GmbH | Contacting device for performing contacting on electric devices to be tested and corresponding contacting method |
| EP1925944A3 (en) * | 2006-11-27 | 2011-05-04 | Feinmetall GmbH | Contacting device for performing contacting on electric devices to be tested and corresponding contacting method |
| WO2018086809A1 (en) * | 2016-11-10 | 2018-05-17 | Rosenberger Hochfrequenztechnik Gmbh & Co. Kg | Contact system and contact module |
| CN109314333A (en) * | 2016-11-10 | 2019-02-05 | 罗森伯格高频技术有限及两合公司 | Contact system and contact module |
| CN109314333B (en) * | 2016-11-10 | 2019-12-17 | 罗森伯格高频技术有限及两合公司 | Contact system and contact module |
| US10658780B2 (en) | 2016-11-10 | 2020-05-19 | Rosenberger Hochfrequenztechnik Gmbh | Contact system and contact module |
| TWI732054B (en) * | 2016-11-10 | 2021-07-01 | 德商羅森伯格高頻技術公司 | Contact system and contact module |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PS | Patent sealed | ||
| PLNP | Patent lapsed through nonpayment of renewal fees |