DK3566063T3 - Aktiv belastning med lav effekt - Google Patents

Aktiv belastning med lav effekt Download PDF

Info

Publication number
DK3566063T3
DK3566063T3 DK18736348.6T DK18736348T DK3566063T3 DK 3566063 T3 DK3566063 T3 DK 3566063T3 DK 18736348 T DK18736348 T DK 18736348T DK 3566063 T3 DK3566063 T3 DK 3566063T3
Authority
DK
Denmark
Prior art keywords
low power
active load
load
active
power
Prior art date
Application number
DK18736348.6T
Other languages
English (en)
Inventor
Kangfei Zhou
Patrick G Sullivan
Original Assignee
Elevate Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elevate Semiconductor Inc filed Critical Elevate Semiconductor Inc
Application granted granted Critical
Publication of DK3566063T3 publication Critical patent/DK3566063T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Amplifiers (AREA)
DK18736348.6T 2017-01-06 2018-01-08 Aktiv belastning med lav effekt DK3566063T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201762443505P 2017-01-06 2017-01-06
PCT/US2018/012837 WO2018129477A1 (en) 2017-01-06 2018-01-08 Low power active load

Publications (1)

Publication Number Publication Date
DK3566063T3 true DK3566063T3 (da) 2022-03-14

Family

ID=62791268

Family Applications (1)

Application Number Title Priority Date Filing Date
DK18736348.6T DK3566063T3 (da) 2017-01-06 2018-01-08 Aktiv belastning med lav effekt

Country Status (7)

Country Link
US (1) US11209485B2 (da)
EP (1) EP3566063B1 (da)
JP (1) JP7321094B2 (da)
CN (1) CN110291410B (da)
DK (1) DK3566063T3 (da)
ES (1) ES2903433T3 (da)
WO (1) WO2018129477A1 (da)

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5010297A (en) 1989-12-01 1991-04-23 Analog Devices, Incorporated Automatic test equipment with active load having high-speed inhibit mode switching
JPH03277983A (ja) * 1990-03-28 1991-12-09 Ando Electric Co Ltd Ｄｂ型ａｓによるｄｕｔ負荷切換回路
JPH04356799A (ja) * 1990-08-29 1992-12-10 Mitsubishi Electric Corp 半導体記憶装置
JPH0595231A (ja) * 1991-10-03 1993-04-16 Nec Corp 出力回路
US5493519A (en) * 1993-08-16 1996-02-20 Altera Corporation High voltage driver circuit with fast current limiting for testing of integrated circuits
JPH07218596A (ja) * 1994-02-03 1995-08-18 Mitsubishi Electric Corp 半導体試験装置
JP2892287B2 (ja) * 1994-02-04 1999-05-17 松下電器産業株式会社 演算増幅器
KR0181307B1 (ko) * 1994-05-27 1999-04-01 오우라 히로시 반도체 시험장치용 드라이버회로
US5521493A (en) * 1994-11-21 1996-05-28 Megatest Corporation Semiconductor test system including a novel driver/load circuit
JP3640441B2 (ja) * 1995-09-22 2005-04-20 株式会社アドバンテスト Ｖｌｓｉテストシステム用ピンエレクトロニクス回路
US5945822A (en) * 1996-09-05 1999-08-31 Advantest Corporation Programmable load circuit
JPH1082831A (ja) * 1996-09-09 1998-03-31 Yokogawa Electric Corp 能動負荷回路
US6211723B1 (en) * 1999-01-20 2001-04-03 Ltx Corporation Programmable load circuit for use in automatic test equipment
US6275023B1 (en) * 1999-02-03 2001-08-14 Hitachi Electronics Engineering Co., Ltd. Semiconductor device tester and method for testing semiconductor device
US6172551B1 (en) * 1999-04-22 2001-01-09 Analog Devices, Inc. Wide dynamic-range current switches and switching methods
US6166569A (en) * 1999-04-23 2000-12-26 Analog Devices, Inc. Test interface circuits with waveform synthesizers having reduced spurious signals
US6232815B1 (en) * 1999-05-06 2001-05-15 Analog Devices, Inc. ATE pin electronics with complementary waveform drivers
US6717450B1 (en) * 2002-05-13 2004-04-06 Telasic Communications, Inc. Monolithic I-load architecture for automatic test equipment
US8582266B2 (en) * 2006-02-17 2013-11-12 Broadcom Corporation Current-monitoring apparatus
US7663439B2 (en) * 2007-12-06 2010-02-16 Himax Technologies Limited Operational amplifier
JP5727211B2 (ja) * 2010-12-17 2015-06-03 ピーエスフォー ルクスコ エスエイアールエルＰＳ４ Ｌｕｘｃｏ Ｓ．ａ．ｒ．ｌ． 半導体装置
CN203025328U (zh) * 2012-12-26 2013-06-26 深圳市振华微电子有限公司 一种可调节的有源负载电路
CN103794188A (zh) * 2014-02-10 2014-05-14 北京京东方显示技术有限公司 一种输出缓冲电路、阵列基板和显示装置
US9419571B2 (en) * 2014-09-15 2016-08-16 Xcelsem, Llc Precision, high voltage, low power differential input stage with static and dynamic gate protection

Also Published As

Publication number Publication date
EP3566063A4 (en) 2020-09-09
US20190346507A1 (en) 2019-11-14
EP3566063B1 (en) 2021-12-15
CN110291410A (zh) 2019-09-27
ES2903433T3 (es) 2022-04-01
US11209485B2 (en) 2021-12-28
CN110291410B (zh) 2021-10-26
JP7321094B2 (ja) 2023-08-04
WO2018129477A1 (en) 2018-07-12
EP3566063A1 (en) 2019-11-13
JP2020504303A (ja) 2020-02-06

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