DK3475681T3 - Fremgangsmåde og apparat til forberedelse af prøver til billeddannelse eller diffraktionsforsøg under kryogene forhold - Google Patents

Fremgangsmåde og apparat til forberedelse af prøver til billeddannelse eller diffraktionsforsøg under kryogene forhold Download PDF

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Publication number
DK3475681T3
DK3475681T3 DK17731174.3T DK17731174T DK3475681T3 DK 3475681 T3 DK3475681 T3 DK 3475681T3 DK 17731174 T DK17731174 T DK 17731174T DK 3475681 T3 DK3475681 T3 DK 3475681T3
Authority
DK
Denmark
Prior art keywords
imagination
cryogenic conditions
under cryogenic
tests under
preparing samples
Prior art date
Application number
DK17731174.3T
Other languages
English (en)
Inventor
Franciscus Johannes Theresia Nijpels
Raimond Ravelli
Jacobus Peter Johannes Peters
Iglesias Carmen López
Original Assignee
Univ Maastricht
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=56203216&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DK3475681(T3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Univ Maastricht filed Critical Univ Maastricht
Application granted granted Critical
Publication of DK3475681T3 publication Critical patent/DK3475681T3/da

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/42—Low-temperature sample treatment, e.g. cryofixation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/2813—Producing thin layers of samples on a substrate, e.g. smearing, spinning-on
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
    • F25D—REFRIGERATORS; COLD ROOMS; ICE-BOXES; COOLING OR FREEZING APPARATUS NOT OTHERWISE PROVIDED FOR
    • F25D2400/00—General features of, or devices for refrigerators, cold rooms, ice-boxes, or for cooling or freezing apparatus not covered by any other subclass
    • F25D2400/30—Quick freezing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2001—Maintaining constant desired temperature

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
DK17731174.3T 2016-06-22 2017-06-22 Fremgangsmåde og apparat til forberedelse af prøver til billeddannelse eller diffraktionsforsøg under kryogene forhold DK3475681T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP16175829.7A EP3260839B1 (en) 2016-06-22 2016-06-22 Method for preparing samples for imaging or diffraction experiments under cryogenic conditions
PCT/EP2017/065466 WO2017220750A1 (en) 2016-06-22 2017-06-22 Method of and apparatus for preparing samples for imaging or diffraction experiments under cryogenic conditions

Publications (1)

Publication Number Publication Date
DK3475681T3 true DK3475681T3 (da) 2020-08-10

Family

ID=56203216

Family Applications (2)

Application Number Title Priority Date Filing Date
DK16175829.7T DK3260839T3 (da) 2016-06-22 2016-06-22 Fremgangsmåde til forberedelse af prøver til billeddannelses- eller diffraktionseksperimenter under kyrogene betingelser
DK17731174.3T DK3475681T3 (da) 2016-06-22 2017-06-22 Fremgangsmåde og apparat til forberedelse af prøver til billeddannelse eller diffraktionsforsøg under kryogene forhold

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DK16175829.7T DK3260839T3 (da) 2016-06-22 2016-06-22 Fremgangsmåde til forberedelse af prøver til billeddannelses- eller diffraktionseksperimenter under kyrogene betingelser

Country Status (5)

Country Link
US (1) US11796432B2 (da)
EP (2) EP3260839B1 (da)
CN (1) CN109690281B (da)
DK (2) DK3260839T3 (da)
WO (1) WO2017220750A1 (da)

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* Cited by examiner, † Cited by third party
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CN112292033B (zh) * 2018-04-05 2023-02-28 韩旭 改进的超快冷却系统和使用方法
CN111337521B (zh) * 2018-11-30 2021-03-05 浙江大学 一种多自由度样品杆
US11035766B2 (en) 2019-02-14 2021-06-15 Nanosoft, Llc. Cryogenic transmission electron microscopy sample preparation
US11703429B2 (en) 2019-02-14 2023-07-18 Nanosoft, LLC Cryogenic transmission electron microscopy sample preparation
EP3739615A1 (en) 2019-05-14 2020-11-18 Universiteit Maastricht Sample carrier for electron microscopy
CN112444530A (zh) * 2019-09-04 2021-03-05 浙江大学 一种用于冷冻电镜的微量样品制备装置及其制样方法
EP4067860A1 (en) * 2021-03-31 2022-10-05 FEI Company Method of preparing a cryogenic sample with improved cooling characteristics
NL2028288B1 (en) 2021-05-26 2022-12-12 Bormans Beheer B V Method and apparatus for preparing samples under cryogenic conditions for imaging or diffraction experiments in an electron microscope
CN113484108B (zh) * 2021-05-31 2022-03-11 中国科学院生物物理研究所 应用界面电荷制备冷冻电镜样品的方法
WO2024061904A1 (en) * 2022-09-20 2024-03-28 Cryowrite Ag Gripper unit and transfer system
EP4394348A1 (en) 2022-12-30 2024-07-03 Universiteit Maastricht Method of and apparatus for vitrifying aqueous samples
CN116698894B (zh) * 2023-08-01 2023-10-24 中国科学院生物物理研究所 一种灭活冷冻电镜样品制备系统及制备方法
CN117054183B (zh) * 2023-08-09 2024-04-02 青岛海洋地质研究所 一种表面平整水合物的生成装置及生成方法

Family Cites Families (22)

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US2680371A (en) 1951-07-13 1954-06-08 Illinois Testing Laboratories Dew point measuring device
US4336691A (en) * 1979-12-13 1982-06-29 The Board Of Trustees Of The Leland Stanford Junior University Cryojet rapid freezing apparatus
US4753887A (en) * 1986-08-07 1988-06-28 Regents Of The University Of Minnesota Controlled environment vitrification system for preparation of liquids
US6893877B2 (en) * 1998-01-12 2005-05-17 Massachusetts Institute Of Technology Methods for screening substances in a microwell array
NL1017669C2 (nl) * 2001-03-22 2002-09-24 Univ Maastricht Inrichting voor het vervaardigen van preparaten voor een cryo-elektronenmicroscoop.
NL1023717C2 (nl) 2003-06-20 2004-12-21 Fei Co Preparaatdrager voor het dragen van een met een elektronenbundel te doorstralen preparaat.
US20080268164A1 (en) * 2007-04-26 2008-10-30 Air Products And Chemicals, Inc. Apparatuses and Methods for Cryogenic Cooling in Thermal Surface Treatment Processes
EP2224800B1 (en) * 2007-11-20 2013-01-09 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Ultra-rapid freezing device and method
AT507079B1 (de) * 2009-01-22 2010-02-15 Leica Mikrosysteme Gmbh Vorrichtung und verfahren zum präparieren von proben
US9312095B2 (en) * 2010-03-24 2016-04-12 Brown University Method and system for automating sample preparation for microfluidic cryo TEM
US8445874B2 (en) * 2010-04-11 2013-05-21 Gatan Inc. Ion beam sample preparation apparatus and methods
EP2381236A1 (en) 2010-04-23 2011-10-26 Fei Company Apparatus for preparing a cryogenic TEM specimen
JP5608409B2 (ja) 2010-04-23 2014-10-15 ルネサスエレクトロニクス株式会社 自己診断システム及び検査回路判定方法
WO2012138944A1 (en) 2011-04-06 2012-10-11 Celltronix Method and scalable devices for hyper-fast cooling
US9594008B2 (en) 2012-01-17 2017-03-14 The Scripps Research Institute Preparation of specimen arrays on an EM grid
WO2013109406A1 (en) 2012-01-17 2013-07-25 The Scripps Research Institute Apparatus and method for producing specimens for electron microscopy
US9541476B2 (en) * 2012-04-04 2017-01-10 National University Of Singapore Cryo-preparation systems and methods for near-instantaneous vitrification of biological samples
EP2853847B1 (en) 2013-09-30 2016-02-03 Fei Company Preparation of cryogenic sample for charged-particle microscopy
GB2537579A (en) * 2014-11-07 2016-10-26 Linkam Scient Instr Ltd Microscopic sample preparation
EP3062082B1 (en) * 2015-02-25 2018-04-18 Fei Company Preparation of sample for charged-particle microscopy
WO2017005297A1 (en) 2015-07-06 2017-01-12 Universität Basel Lossless cryo-grid preparation stage for high-resolution electron microscopy
EP3179229B1 (en) * 2015-12-11 2019-01-30 FEI Company Preparation of cryogenic sample for charged-particle microscopy

Also Published As

Publication number Publication date
EP3475681A1 (en) 2019-05-01
US20190170625A1 (en) 2019-06-06
EP3475681B1 (en) 2020-06-17
US11796432B2 (en) 2023-10-24
WO2017220750A1 (en) 2017-12-28
DK3260839T3 (da) 2021-04-19
CN109690281B (zh) 2023-04-28
EP3260839A1 (en) 2017-12-27
CN109690281A (zh) 2019-04-26
EP3260839B1 (en) 2021-01-27

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