DK1733399T3 - System og fremgangsmåde til detektering af forskydningen af flere mikro- og nanomekaniske elementer, såsom mikro-kantilevere - Google Patents

System og fremgangsmåde til detektering af forskydningen af flere mikro- og nanomekaniske elementer, såsom mikro-kantilevere

Info

Publication number
DK1733399T3
DK1733399T3 DK05715774T DK05715774T DK1733399T3 DK 1733399 T3 DK1733399 T3 DK 1733399T3 DK 05715774 T DK05715774 T DK 05715774T DK 05715774 T DK05715774 T DK 05715774T DK 1733399 T3 DK1733399 T3 DK 1733399T3
Authority
DK
Denmark
Prior art keywords
light beam
displacement
micro
detecting
array
Prior art date
Application number
DK05715774T
Other languages
English (en)
Inventor
Gomez Laura M Lechuga
Sanchez Mar Alvarez
De Miguel Francisco Javier Tamayo
Original Assignee
Consejo Superior Investigacion
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Consejo Superior Investigacion filed Critical Consejo Superior Investigacion
Application granted granted Critical
Publication of DK1733399T3 publication Critical patent/DK1733399T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/06—Probe tip arrays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q20/00—Monitoring the movement or position of the probe
    • G01Q20/02—Monitoring the movement or position of the probe by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/04—Display or data processing devices
DK05715774T 2004-03-08 2005-03-04 System og fremgangsmåde til detektering af forskydningen af flere mikro- og nanomekaniske elementer, såsom mikro-kantilevere DK1733399T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP04381004A EP1575058A1 (en) 2004-03-08 2004-03-08 System and method for detecting the displacement of a plurality of micro- and nanomechanical elements, such as micro-cantilevers
PCT/EP2005/002356 WO2005086172A1 (en) 2004-03-08 2005-03-04 System and method for detecting the displacement of a plurality of micro- and nanomechanical elements, such as micro-cantilevers

Publications (1)

Publication Number Publication Date
DK1733399T3 true DK1733399T3 (da) 2009-01-05

Family

ID=34814440

Family Applications (1)

Application Number Title Priority Date Filing Date
DK05715774T DK1733399T3 (da) 2004-03-08 2005-03-04 System og fremgangsmåde til detektering af forskydningen af flere mikro- og nanomekaniske elementer, såsom mikro-kantilevere

Country Status (9)

Country Link
US (1) US7646494B2 (da)
EP (2) EP1575058A1 (da)
JP (1) JP4603036B2 (da)
AT (1) ATE404977T1 (da)
DE (1) DE602005008926D1 (da)
DK (1) DK1733399T3 (da)
ES (1) ES2314631T3 (da)
PL (1) PL1733399T3 (da)
WO (1) WO2005086172A1 (da)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ES2546789T3 (es) * 2005-07-14 2015-09-28 Consejo Superior De Investigaciones Cientificas (Csic) Sistema y procedimiento de inspección de superficies de estructuras micro y nanomecánicas
EP2053400A1 (en) * 2007-10-22 2009-04-29 Consejo Superior De Investigaciones Cientificas Method and system for detection of a selected type of molecules in a sample
US8045859B2 (en) * 2008-05-02 2011-10-25 The United States Of America As Represented By The Secretary Of The Navy High-speed underwater data transmission system and method
US8274053B2 (en) * 2009-03-10 2012-09-25 GM Global Technology Operations LLC System and method for valve seat gap evaluation
ES2442767T3 (es) 2010-01-21 2014-02-13 Consejo Superior De Investigaciones Científicas Procedimiento de bioanálisis de moléculas de ácido nucleico en una muestra y biosensor para su implementación
JP5093276B2 (ja) * 2010-03-26 2012-12-12 ブラザー工業株式会社 液体カートリッジ、及び、液体供給装置
EP2860154A4 (en) * 2012-06-07 2016-01-20 Consejo Superior Investigacion METHOD AND SYSTEM FOR CHARACTERIZING NANO AND MICROMECHANICAL STRUCTURES
US8804136B2 (en) * 2012-12-06 2014-08-12 Asm Technology Singapore Pte Ltd Apparatus and method for locating a plurality of placement positions on a carrier object
US20160146600A1 (en) * 2013-11-22 2016-05-26 Shervin Taghavi Larigani Novel technique of displacement and rotation measurement
US9851256B2 (en) 2014-06-26 2017-12-26 MP High Tech Solutions Pty Ltd Apparatus and method for electromagnetic radiation sensing
US9810581B1 (en) 2014-07-28 2017-11-07 MP High Tech Solutions Pty Ltd Micromechanical device for electromagnetic radiation sensing
US9857229B1 (en) 2015-06-24 2018-01-02 MP High Tech Solutions Pty Ltd Fabrication method for micromechanical sensors
US11051270B2 (en) * 2017-11-03 2021-06-29 Regents Of The University Of Minnesota Single lamp localization system and method
WO2021093586A1 (zh) 2019-11-11 2021-05-20 北京嘀嘀无限科技发展有限公司 一种数据同步系统和方法
CN111813716A (zh) * 2019-11-11 2020-10-23 北京嘀嘀无限科技发展有限公司 多传感器数据同步、电子设备及存储介质
CN114322836B (zh) * 2022-03-17 2022-05-27 板石智能科技(深圳)有限公司 基于启发式搜索的周期纳米结构形貌参数测量方法及装置

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US5253515A (en) * 1990-03-01 1993-10-19 Olympus Optical Co., Ltd. Atomic probe microscope and cantilever unit for use in the microscope
JP3000492B2 (ja) * 1991-04-22 2000-01-17 キヤノン株式会社 情報処理装置
JP3005077B2 (ja) * 1991-08-02 2000-01-31 キヤノン株式会社 記録及び／又は再生方法及び装置
US6337479B1 (en) * 1994-07-28 2002-01-08 Victor B. Kley Object inspection and/or modification system and method
JP3608009B2 (ja) * 1995-07-05 2005-01-05 株式会社ニコン 原子間力顕微鏡
US5929440A (en) * 1996-10-25 1999-07-27 Hypres, Inc. Electromagnetic radiation detector
US5923421A (en) * 1997-07-24 1999-07-13 Lockheed Martin Energy Research Corporation Chemical detection using calorimetric spectroscopy
US6138503A (en) * 1997-10-16 2000-10-31 Raymax Technology, Inc. Scanning probe microscope system including removable probe sensor assembly
US6008489A (en) * 1997-12-03 1999-12-28 Digital Instruments Method for improving the operation of oscillating mode atomic force microscopes
JP2000056211A (ja) * 1998-08-11 2000-02-25 Nikon Corp 走査型プローブ顕微鏡
JP2000338025A (ja) * 1999-05-31 2000-12-08 Canon Inc 複数のプローブを備えた情報検出装置および複数のプローブによる情報検出方法
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Also Published As

Publication number Publication date
JP4603036B2 (ja) 2010-12-22
EP1733399A1 (en) 2006-12-20
EP1733399B1 (en) 2008-08-13
EP1575058A1 (en) 2005-09-14
ATE404977T1 (de) 2008-08-15
PL1733399T3 (pl) 2009-04-30
DE602005008926D1 (de) 2008-09-25
WO2005086172A1 (en) 2005-09-15
US7646494B2 (en) 2010-01-12
JP2007528000A (ja) 2007-10-04
ES2314631T3 (es) 2009-03-16
US20080259356A1 (en) 2008-10-23

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