DK1606579T3 - Kappefladesensor - Google Patents

Kappefladesensor

Info

Publication number
DK1606579T3
DK1606579T3 DK04720012T DK04720012T DK1606579T3 DK 1606579 T3 DK1606579 T3 DK 1606579T3 DK 04720012 T DK04720012 T DK 04720012T DK 04720012 T DK04720012 T DK 04720012T DK 1606579 T3 DK1606579 T3 DK 1606579T3
Authority
DK
Denmark
Prior art keywords
angle
imaging
reflecting element
reduces
emanating
Prior art date
Application number
DK04720012T
Other languages
Danish (da)
English (en)
Inventor
Martin Schumacher
Norbert Lehn
Original Assignee
Vitronic Dr Ing Stein Bildvera
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vitronic Dr Ing Stein Bildvera filed Critical Vitronic Dr Ing Stein Bildvera
Application granted granted Critical
Publication of DK1606579T3 publication Critical patent/DK1606579T3/da

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8806Specially adapted optical and illumination features
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952Inspecting the exterior surface of cylindrical bodies or wires
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901Optical details; Scanning details
    • G01N2021/8905Directional selective optics, e.g. slits, spatial filters
    • G01N2021/8907Cylindrical optics
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9054Inspection of sealing surface and container finish

Landscapes

  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Lenses (AREA)
  • Surgical Instruments (AREA)
  • Investigating Or Analyzing Materials By The Use Of Fluid Adsorption Or Reactions (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Studio Devices (AREA)
DK04720012T 2003-03-18 2004-03-12 Kappefladesensor DK1606579T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10312051A DE10312051A1 (de) 2003-03-18 2003-03-18 Mantelflächensensor sowie Abbildungsoptik hierfür
PCT/EP2004/050305 WO2004083777A1 (fr) 2003-03-18 2004-03-12 Detecteur de surfaces laterales et optique de reproduction pour ce detecteur

Publications (1)

Publication Number Publication Date
DK1606579T3 true DK1606579T3 (da) 2008-09-01

Family

ID=32920923

Family Applications (1)

Application Number Title Priority Date Filing Date
DK04720012T DK1606579T3 (da) 2003-03-18 2004-03-12 Kappefladesensor

Country Status (10)

Country Link
US (1) US7522277B2 (fr)
EP (1) EP1606579B1 (fr)
JP (1) JP4695589B2 (fr)
AT (1) ATE396379T1 (fr)
AU (1) AU2004221688A1 (fr)
CA (1) CA2517633A1 (fr)
DE (2) DE10312051A1 (fr)
DK (1) DK1606579T3 (fr)
ES (1) ES2305750T3 (fr)
WO (1) WO2004083777A1 (fr)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1864081B1 (fr) * 2005-03-24 2014-05-07 SAC Sirius Advanced Cybernetics GmbH Dispositif pour detecter optiquement la forme d'objets et de surfaces
FR2896041B1 (fr) * 2006-01-11 2012-02-17 Michel Cayment Dispositif d'inspection en vue d'une face visible et d'une face normalement cachee d'objets et installation d'inspection comprenant un tel dispositif.
EP1826556A3 (fr) * 2006-02-22 2009-02-11 Helmut A. Kappner Dispositif de vérification
US7869021B2 (en) * 2007-04-05 2011-01-11 Asti Holdings Limited Multiple surface inspection system and method
US7768633B2 (en) * 2007-04-05 2010-08-03 Asti Holdings Limited Multiple surface inspection system and method
BRPI1000301B1 (pt) * 2010-01-27 2017-04-11 Photonita Ltda dispositivo óptico para medição e identificação de superfícies cilíndricas por deflectometria aplicado para identificação balística
US8629977B2 (en) 2010-04-14 2014-01-14 Digital Ally, Inc. Traffic scanning LIDAR
DE102010032410B4 (de) * 2010-07-27 2014-11-13 Mall + Herlan Schweiz Ag Inspektionsvorrichtung, Fertigungsanlage mit Inspektionsvorrichtung und Inspektionsverfahren für Gefäße
US10184858B2 (en) 2012-02-07 2019-01-22 CommScope Connectivity Belgium BVBA Visually inspecting optical fibers
FR3027391B1 (fr) 2014-10-17 2024-05-24 Msc & Sgcc Procedes, dispositif et ligne d'inspection pour visualiser la planeite d'une surface de bague de recipient
DE102015001332B4 (de) 2015-02-03 2017-09-28 Mühlbauer Gmbh & Co. Kg Gefäß-Inspektionseinrichtung
FR3053792B1 (fr) 2016-07-06 2023-07-14 Tiama Procede, dispositif et ligne d'inspection pour la determination d'une bavure a l'endroit d'un bord interne d'une surface de bague
EP3364174A1 (fr) 2017-02-15 2018-08-22 Christian Koller Systeme d'inspection optique et procede d 'inspection visuelle d'un objet
FR3076619B1 (fr) 2018-01-05 2020-01-24 Tiama Procede, dispositif et ligne d'inspection pour determiner la geometrie tridimensionnelle d'une surface de bague de recipient
IT201800005959A1 (it) * 2018-06-01 2019-12-01 Sistema ottico per analisi periferica
CN112987184A (zh) * 2021-03-10 2021-06-18 南京英田光学工程股份有限公司 一种提高自由空间激光通信光路隔离度的方法

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4025201A (en) * 1975-04-21 1977-05-24 Ball Brothers Service Corporation Method and apparatus for video inspection of articles of manufacture by decussate paths of light
JPS5858020B2 (ja) 1978-08-17 1983-12-23 日立造船株式会社 びん状体のクラツク検出方法
DE3035082A1 (de) * 1980-09-17 1982-04-22 Siemens AG, 1000 Berlin und 8000 München Verfahren und anordnung zur optischelektronischen erfassung von oberflaechenstrukturen an rotationssymmetrischen koerpern
DE3109270A1 (de) * 1981-03-11 1982-09-30 Siemens AG, 1000 Berlin und 8000 München Anordnung zur flascheninspektion
JPS6212845A (ja) 1985-07-10 1987-01-21 Kirin Brewery Co Ltd 壜のねじ口部欠陥検出装置
NL8802933A (nl) * 1988-11-28 1990-06-18 Heuft Qualiplus Bv Werkwijze en inrichting voor het inspekteren van de binnenwand van een lichaam.
CH679698A5 (fr) * 1989-10-06 1992-03-31 Elpatronic Ag
DE3938471A1 (de) * 1989-11-20 1991-05-23 Freudenberg Carl Fa Verfahren zur optischen oberflaechenkontrolle
US5491904A (en) * 1990-02-23 1996-02-20 Mcmurtry; David R. Touch probe
DE4209417A1 (de) * 1992-03-24 1993-10-07 Hans Dieter Richter Optische Prüfvorrichtung für Innengewinde
DE4320845C1 (de) * 1993-06-23 1994-10-27 Fraunhofer Ges Forschung Anordnung zur Messung von Streulicht in Bohrungen von Werkstücken oder in Rohren
EP0657732A1 (fr) 1993-12-06 1995-06-14 Elpatronic Ag Méthode et appareil d'inspection optique d'une zone transparente d'un récipient, notamment le goulot
DE19618558C2 (de) * 1994-11-09 2003-09-25 Jopp Gmbh Vorrichtung zur Prüfung von Tieflochbohrungen
JPH09196856A (ja) * 1996-01-23 1997-07-31 Tsubakimoto Chain Co 表面検査方法、表面検査装置及びプリズム
DE19634881C1 (de) * 1996-08-29 1998-02-12 Basler Gmbh Optische Prüfvorrichtung
JP3614597B2 (ja) * 1996-10-24 2005-01-26 三菱原子燃料株式会社 内面撮像装置
JP3181605B2 (ja) * 1996-10-30 2001-07-03 クロネス・アクチェンゲゼルシャフト びん等の検査装置
JP2000206411A (ja) * 1999-01-19 2000-07-28 Sharp Corp 光学素子、光学ヘッド及びそれらを用いた情報再生装置
DE19940363C2 (de) * 1999-08-25 2003-08-07 Krones Ag Vorrichtung und Verfahren zur optischen Inspektion offener Getränkebehälter
JP2001208515A (ja) * 2000-01-26 2001-08-03 Shimadzu Corp 全外周同時結像装置
JP2002310629A (ja) * 2001-04-13 2002-10-23 Toyo Seikan Kaisha Ltd 周面撮像装置及び周面検査装置
US6825925B2 (en) * 2002-05-14 2004-11-30 Scan Technology Co., Ltd. Inspecting apparatus for foreign matter

Also Published As

Publication number Publication date
US7522277B2 (en) 2009-04-21
DE10312051A1 (de) 2004-09-30
AU2004221688A1 (en) 2004-09-30
JP2006520486A (ja) 2006-09-07
JP4695589B2 (ja) 2011-06-08
CA2517633A1 (fr) 2004-09-30
EP1606579B1 (fr) 2008-05-21
EP1606579A1 (fr) 2005-12-21
ES2305750T3 (es) 2008-11-01
ATE396379T1 (de) 2008-06-15
DE502004007225D1 (de) 2008-07-03
US20060176474A1 (en) 2006-08-10
WO2004083777A1 (fr) 2004-09-30

Similar Documents

Publication Publication Date Title
DK1606579T3 (da) Kappefladesensor
US7307789B2 (en) Photoelectric encoder
GB2438315B (en) Position detector
WO2006059330A3 (fr) Systeme optique reflechissant
DE60236538D1 (de) Transflektor, transflektorsysteme und -anzeigen un
DE60224635D1 (de) Optisches System, Bildanzeigegerät und Bildaufnahmeapparat
ATE333668T1 (de) Strahlungsquelle hoher luminosität für die euv- lithographie
GB2442627A (en) Achieving convergent light rays emitted by planar array of light sources
WO2009095220A3 (fr) Collecteur à incidence rasante pour sources de plasma produit par laser
TW200712597A (en) Optical module of a light source module and a sensor module positioned on a frame
WO2002063390A3 (fr) Moteur d'eclairage pour affichage de projection utilisant un conducteur de lumiere conique
WO2002075348A3 (fr) Source de rayonnements omni-directionnels et localisateur d'objet
WO2003062853A3 (fr) Capteur vcsel compact a multiple capacites de detection
WO2007112210A3 (fr) Conception optique d'un système de mesure de particules
EP3591568A3 (fr) Procédés, systèmes et appareils pour balayer et décoder des indices de marquage à partie directe
SE0102332D0 (sv) Anordning vid optiskt system
JP6241061B2 (ja) 形状計測装置
GB2370371B (en) Use of distorting optics in imaging systems
US7023626B1 (en) Optical device, lens and optical element for focusing a laser beam and apparatus and method for assembling the optical device
TWI359936B (fr)
DE50007703D1 (de) Abbildungssystem
TW200604577A (en) Photoelectric sensor
US10401632B2 (en) Planar high angle line generator
JPH0754822Y2 (ja) 光学センサ
JPH03131790A (ja) 車両用障害物検知装置