DK134687C - - Google Patents
Info
- Publication number
- DK134687C DK134687C DK581972A DK581972A DK134687C DK 134687 C DK134687 C DK 134687C DK 581972 A DK581972 A DK 581972A DK 581972 A DK581972 A DK 581972A DK 134687 C DK134687 C DK 134687C
- Authority
- DK
- Denmark
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/203—Measuring back scattering
Landscapes
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Toxicology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DK581972AA DK134687B (da) | 1972-11-22 | 1972-11-22 | Apparat til måling af koncentrationen af et eller flere grundstoffer i et bæremedium ved hjælp af gamma- eller rontgenstråler. |
| US417407A US3928765A (en) | 1972-11-22 | 1973-11-19 | Determining composition of a substance by the use of both reflected and transmitted radiation |
| FR7341600A FR2208529A5 (de) | 1972-11-22 | 1973-11-22 | |
| JP48132090A JPS5825976B2 (ja) | 1972-11-22 | 1973-11-22 | 媒質中の少くともひとつの元素の電磁輻射線法による定量装置 |
| NL7316006A NL7316006A (de) | 1972-11-22 | 1973-11-22 | |
| GB5417773A GB1455869A (en) | 1972-11-22 | 1973-11-22 | Method for the determination of the content of at least one chemical element in a medium by an electromagnetic method |
| AT982573A AT342898B (de) | 1972-11-22 | 1973-11-22 | Vorrichtung zur gehaltsermittlung fur wenigstens ein chemisches element eines mediums mit hilfe einer elektromagnetischen strahlung |
| DE2358237A DE2358237C2 (de) | 1972-11-22 | 1973-11-22 | Verfahren zur Bestimmung des Gehalts an mindestens einem chemischen Element in einer Substanz, insbesondere zur Bestimmung des Schwefelgehalts in Kohlenwasserstoff-Brennstoffen |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DK581972AA DK134687B (da) | 1972-11-22 | 1972-11-22 | Apparat til måling af koncentrationen af et eller flere grundstoffer i et bæremedium ved hjælp af gamma- eller rontgenstråler. |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DK134687B DK134687B (da) | 1976-12-20 |
| DK134687C true DK134687C (de) | 1977-05-23 |
Family
ID=8145471
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DK581972AA DK134687B (da) | 1972-11-22 | 1972-11-22 | Apparat til måling af koncentrationen af et eller flere grundstoffer i et bæremedium ved hjælp af gamma- eller rontgenstråler. |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US3928765A (de) |
| JP (1) | JPS5825976B2 (de) |
| AT (1) | AT342898B (de) |
| DE (1) | DE2358237C2 (de) |
| DK (1) | DK134687B (de) |
| FR (1) | FR2208529A5 (de) |
| GB (1) | GB1455869A (de) |
| NL (1) | NL7316006A (de) |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4081676A (en) * | 1976-12-17 | 1978-03-28 | Sentrol Systems Ltd. | On-line system for monitoring sheet material additives |
| USRE30884E (en) * | 1976-12-17 | 1982-03-16 | Sentrol Systems Ltd. | On-line system for monitoring sheet material additives |
| US4194114A (en) * | 1978-01-03 | 1980-03-18 | Ukrainsky Nauchno-Issledovatelsky Institut Tselljulozno-Bumazhoi Promyshlennosti (UKRNIIB) | Device for non-contact gauging of thickness or weight per unit area of sheet and like materials |
| US4494001A (en) * | 1979-07-30 | 1985-01-15 | United Kingdom Atomic Energy Authority | Detection of concealed materials |
| FI61361C (fi) * | 1980-09-15 | 1982-07-12 | Outokumpu Oy | Foerfarande och anordning foer analys av malm med anvaendning av gammastraolning |
| US4799247A (en) * | 1986-06-20 | 1989-01-17 | American Science And Engineering, Inc. | X-ray imaging particularly adapted for low Z materials |
| USRE39396E1 (en) * | 1996-02-12 | 2006-11-14 | American Science And Engineering, Inc. | Mobile x-ray inspection system for large objects |
| US5764683B1 (en) | 1996-02-12 | 2000-11-21 | American Science & Eng Inc | Mobile x-ray inspection system for large objects |
| US20040256565A1 (en) * | 2002-11-06 | 2004-12-23 | William Adams | X-ray backscatter mobile inspection van |
| US20090257555A1 (en) * | 2002-11-06 | 2009-10-15 | American Science And Engineering, Inc. | X-Ray Inspection Trailer |
| US7505556B2 (en) * | 2002-11-06 | 2009-03-17 | American Science And Engineering, Inc. | X-ray backscatter detection imaging modules |
| US7551715B2 (en) * | 2005-10-24 | 2009-06-23 | American Science And Engineering, Inc. | X-ray inspection based on scatter detection |
| US7099434B2 (en) | 2002-11-06 | 2006-08-29 | American Science And Engineering, Inc. | X-ray backscatter mobile inspection van |
| US7447298B2 (en) * | 2003-04-01 | 2008-11-04 | Cabot Microelectronics Corporation | Decontamination and sterilization system using large area x-ray source |
| JP2005127983A (ja) * | 2003-09-30 | 2005-05-19 | Mitsubishi Heavy Ind Ltd | 硬Ｘ線又はγ線を利用した埋没物評価方法、地下資源評価方法、地下廃棄物評価方法、地下貯蔵物評価方法、地層構造評価方法及び建造物内監視方法 |
| US20060245548A1 (en) * | 2005-04-22 | 2006-11-02 | Joseph Callerame | X-ray backscatter inspection with coincident optical beam |
| US20080297355A1 (en) * | 2007-06-04 | 2008-12-04 | Seiji Matsumoto | Container with Electronic Tag and RFID System Using the Container with Electronic Tag |
| US7593510B2 (en) * | 2007-10-23 | 2009-09-22 | American Science And Engineering, Inc. | X-ray imaging with continuously variable zoom and lateral relative displacement of the source |
| US8824632B2 (en) | 2009-07-29 | 2014-09-02 | American Science And Engineering, Inc. | Backscatter X-ray inspection van with top-down imaging |
| EP2459991B1 (de) | 2009-07-29 | 2019-09-11 | American Science & Engineering, Inc. | Anhänger für röntgenstrahleninspektion von oben nach unten |
| US8532823B2 (en) | 2010-02-12 | 2013-09-10 | American Science And Engineering, Inc. | Disruptor guidance system and methods based on scatter imaging |
| US9739727B2 (en) * | 2015-01-21 | 2017-08-22 | The Boeing Company | Systems and methods for aligning an aperture |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2642537A (en) * | 1949-12-22 | 1953-06-16 | United States Steel Corp | Apparatus for determining coating thickness |
| BE628322A (de) * | 1962-02-12 | |||
| GB1067430A (en) * | 1964-09-11 | 1967-05-03 | Atomic Energy Authority Uk | Improvements in or relating to x-ray analysis |
| US3764805A (en) * | 1967-07-06 | 1973-10-09 | Us Army | Control of propellant compositions by x-ray fluorescence analysis |
| GB1259771A (en) * | 1967-10-27 | 1972-01-12 | Hilger & Watts Ltd | Improvements in radiometric analysis |
| FI40753B (de) * | 1968-04-03 | 1969-01-31 | Valmet Oy | |
| US3746874A (en) * | 1969-10-08 | 1973-07-17 | Yokogawa Electric Works Ltd | Apparatus using x-rays for measuring the content of an element having a higher mass absorption coefficient than hydrogen and carbon in hydrocarbon compounds |
-
1972
- 1972-11-22 DK DK581972AA patent/DK134687B/da unknown
-
1973
- 1973-11-19 US US417407A patent/US3928765A/en not_active Expired - Lifetime
- 1973-11-22 NL NL7316006A patent/NL7316006A/xx not_active Application Discontinuation
- 1973-11-22 GB GB5417773A patent/GB1455869A/en not_active Expired
- 1973-11-22 AT AT982573A patent/AT342898B/de not_active IP Right Cessation
- 1973-11-22 FR FR7341600A patent/FR2208529A5/fr not_active Expired
- 1973-11-22 JP JP48132090A patent/JPS5825976B2/ja not_active Expired
- 1973-11-22 DE DE2358237A patent/DE2358237C2/de not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| DK134687B (da) | 1976-12-20 |
| US3928765A (en) | 1975-12-23 |
| FR2208529A5 (de) | 1974-06-21 |
| GB1455869A (en) | 1976-11-17 |
| NL7316006A (de) | 1974-05-27 |
| ATA982573A (de) | 1977-08-15 |
| DE2358237A1 (de) | 1974-05-30 |
| DE2358237C2 (de) | 1984-10-31 |
| JPS5047692A (de) | 1975-04-28 |
| AT342898B (de) | 1978-04-25 |
| JPS5825976B2 (ja) | 1983-05-31 |