DK122675A - - Google Patents

Info

Publication number
DK122675A
DK122675A DK122675A DK122675A DK122675A DK 122675 A DK122675 A DK 122675A DK 122675 A DK122675 A DK 122675A DK 122675 A DK122675 A DK 122675A DK 122675 A DK122675 A DK 122675A
Authority
DK
Denmark
Application number
DK122675A
Other languages
Danish (da)
Other versions
DK144898C (da
DK144898B (da
Inventor
W Heiland
E Taglauer
M Grundner
Original Assignee
Max Planck Gesellschaft
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Max Planck Gesellschaft filed Critical Max Planck Gesellschaft
Publication of DK122675A publication Critical patent/DK122675A/da
Publication of DK144898B publication Critical patent/DK144898B/da
Application granted granted Critical
Publication of DK144898C publication Critical patent/DK144898C/da

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/14Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/142Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using a solid target which is not previously vapourised
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/44Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46Static spectrometers
    • H01J49/48Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
DK122675A 1974-03-25 1975-03-24 Ionoptisk apparat til undersoegelse af et proeveemnes overfladeved ionbeskydning og analyse af de fra det beskudte overfladeomraade udgaaende ioner DK144898C (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE2414221 1974-03-25
DE19742414221 DE2414221C3 (de) 1974-03-25 1974-03-25 Ionenoptisches Gerät zur Untersuchung der Oberfläche einer Probe durch IonenbeschuB und Analyse der vom beschossenen Oberflächenbereich ausgehenden Ionen

Publications (3)

Publication Number Publication Date
DK122675A true DK122675A (enrdf_load_stackoverflow) 1975-09-26
DK144898B DK144898B (da) 1982-06-28
DK144898C DK144898C (da) 1982-11-22

Family

ID=5911045

Family Applications (1)

Application Number Title Priority Date Filing Date
DK122675A DK144898C (da) 1974-03-25 1975-03-24 Ionoptisk apparat til undersoegelse af et proeveemnes overfladeved ionbeskydning og analyse af de fra det beskudte overfladeomraade udgaaende ioner

Country Status (8)

Country Link
JP (1) JPS5199094A (enrdf_load_stackoverflow)
BE (1) BE826966A (enrdf_load_stackoverflow)
DE (1) DE2414221C3 (enrdf_load_stackoverflow)
DK (1) DK144898C (enrdf_load_stackoverflow)
FR (1) FR2266166B3 (enrdf_load_stackoverflow)
GB (1) GB1445963A (enrdf_load_stackoverflow)
IT (1) IT1034386B (enrdf_load_stackoverflow)
NL (1) NL7503567A (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4058724A (en) * 1975-06-27 1977-11-15 Minnesota Mining And Manufacturing Company Ion Scattering spectrometer with two analyzers preferably in tandem
DE2556291C3 (de) * 1975-12-13 1980-11-27 Gesellschaft Fuer Strahlen- Und Umweltforschung Mbh, 8000 Muenchen Raster-Ionenmikroskop
GB2098797B (en) * 1980-05-12 1985-01-16 Univ Trobe Angular resolved spectrometer
JPH083988B2 (ja) * 1986-10-08 1996-01-17 株式会社日立製作所 二次イオン質量分析方法
JPH0589817A (ja) * 1991-03-16 1993-04-09 Eiko Eng:Kk 複合分析装置

Also Published As

Publication number Publication date
IT1034386B (it) 1979-09-10
DE2414221B2 (de) 1978-04-20
FR2266166B3 (enrdf_load_stackoverflow) 1977-12-02
DK144898C (da) 1982-11-22
FR2266166A1 (enrdf_load_stackoverflow) 1975-10-24
BE826966A (fr) 1975-07-16
NL7503567A (nl) 1975-09-29
GB1445963A (en) 1976-08-11
DK144898B (da) 1982-06-28
DE2414221A1 (de) 1975-10-09
DE2414221C3 (de) 1979-01-18
JPS5199094A (enrdf_load_stackoverflow) 1976-09-01

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