DK1017996T3 - Ikke-destruktiv prövning af dielektriske materialer - Google Patents
Ikke-destruktiv prövning af dielektriske materialerInfo
- Publication number
- DK1017996T3 DK1017996T3 DK98947203T DK98947203T DK1017996T3 DK 1017996 T3 DK1017996 T3 DK 1017996T3 DK 98947203 T DK98947203 T DK 98947203T DK 98947203 T DK98947203 T DK 98947203T DK 1017996 T3 DK1017996 T3 DK 1017996T3
- Authority
- DK
- Denmark
- Prior art keywords
- specimen
- changes
- interference pattern
- microwaves
- irregularities
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US93507497A | 1997-09-25 | 1997-09-25 | |
PCT/US1998/019832 WO1999015883A1 (en) | 1997-09-25 | 1998-09-22 | Nondestructive testing of dielectric materials |
Publications (1)
Publication Number | Publication Date |
---|---|
DK1017996T3 true DK1017996T3 (da) | 2008-09-15 |
Family
ID=25466555
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DK98947203T DK1017996T3 (da) | 1997-09-25 | 1998-09-22 | Ikke-destruktiv prövning af dielektriske materialer |
Country Status (9)
Country | Link |
---|---|
EP (1) | EP1017996B1 (da) |
AT (1) | ATE397210T1 (da) |
AU (1) | AU746997B2 (da) |
CA (1) | CA2304782C (da) |
CY (1) | CY1108198T1 (da) |
DE (1) | DE69839567D1 (da) |
DK (1) | DK1017996T3 (da) |
NZ (1) | NZ503713A (da) |
WO (1) | WO1999015883A1 (da) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1214581A1 (en) * | 1999-09-17 | 2002-06-19 | Sik - Institut För Livsmedel Och Bioteknik AB | Apparatus and method for detection of foreign bodies in products |
EP1390726A4 (en) * | 2001-04-20 | 2004-06-16 | Commw Scient Ind Res Org | NON-DESTRUCTIVE TEST PROBE |
EP1779123A4 (en) * | 2004-08-05 | 2007-11-21 | Jack R Little Jr | IMAGING, NON DESTRUCTIVE HIGH RESOLUTION OF DIELECTRIC MATERIALS |
US7520667B2 (en) | 2006-05-11 | 2009-04-21 | John Bean Technologies Ab | Method and system for determining process parameters |
US9046605B2 (en) | 2012-11-05 | 2015-06-02 | The Curators Of The University Of Missouri | Three-dimensional holographical imaging |
WO2014079695A1 (de) * | 2012-11-23 | 2014-05-30 | Siemens Ag Österreich | Überwachung eines bauteils |
EP3779609B1 (fr) | 2019-08-13 | 2022-03-16 | Patek Philippe SA Genève | Mécanisme d'affichage pour pièce d'horlogerie |
SG10202004777YA (en) * | 2020-05-21 | 2021-12-30 | Wavescan Tech Pte Ltd | System and method for portable microwave instrument for high-resolution, contactless non-destructive imaging |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
BE564022A (da) * | 1957-01-16 | |||
US3025463A (en) * | 1957-11-22 | 1962-03-13 | Eino J Luoma | Apparatus for measurement of complex reflection coefficient |
SE8000410L (sv) * | 1979-01-20 | 1980-07-21 | Lambda Ind Science Ltd | Sprickdetektor |
JPS61274209A (ja) * | 1985-05-30 | 1986-12-04 | Furuno Electric Co Ltd | コンクリ−ト欠損等の検出装置 |
IT1201375B (it) * | 1985-11-08 | 1989-01-27 | Consiglio Nazionale Ricerche | Metodo ed apparato per la determinazione della costante dielettrica di materiali e sua applicazione per la determinazione del tasso di carbone incombusto presente nelle ceneri di un combustore |
US5103181A (en) * | 1988-10-05 | 1992-04-07 | Den Norske Oljeselskap A. S. | Composition monitor and monitoring process using impedance measurements |
US5216372A (en) * | 1991-07-29 | 1993-06-01 | Colorado State University Research Foundation | Microwave steel belt location sensor for tires |
US5384543A (en) * | 1992-11-09 | 1995-01-24 | Martin Marietta Energy Systems, Inc. | Portable microwave instrument for non-destructive evaluation of structural characteristics |
US5393557A (en) * | 1992-12-17 | 1995-02-28 | Northrop Grumman Corporation | Method for measuring electromagnetic properties |
DE4311103A1 (de) * | 1993-04-05 | 1994-10-06 | Komi Koppelberg & Migl Kg | Verfahren und Vorrichtung zum Erkennen von Fehlern bei Glaskörpern |
DE69609336T2 (de) * | 1995-09-11 | 2001-03-15 | Yissum Res Dev Co | Nahfeld-leitfähigkeits-mikroskop |
-
1998
- 1998-09-22 CA CA002304782A patent/CA2304782C/en not_active Expired - Lifetime
- 1998-09-22 NZ NZ503713A patent/NZ503713A/en not_active IP Right Cessation
- 1998-09-22 WO PCT/US1998/019832 patent/WO1999015883A1/en active IP Right Grant
- 1998-09-22 DK DK98947203T patent/DK1017996T3/da active
- 1998-09-22 DE DE69839567T patent/DE69839567D1/de not_active Expired - Lifetime
- 1998-09-22 AT AT98947203T patent/ATE397210T1/de not_active IP Right Cessation
- 1998-09-22 AU AU94034/98A patent/AU746997B2/en not_active Expired
- 1998-09-22 EP EP98947203A patent/EP1017996B1/en not_active Expired - Lifetime
-
2008
- 2008-07-14 CY CY20081100737T patent/CY1108198T1/el unknown
Also Published As
Publication number | Publication date |
---|---|
AU9403498A (en) | 1999-04-12 |
ATE397210T1 (de) | 2008-06-15 |
WO1999015883A1 (en) | 1999-04-01 |
NZ503713A (en) | 2001-09-28 |
CA2304782A1 (en) | 1999-04-01 |
DE69839567D1 (de) | 2008-07-10 |
AU746997B2 (en) | 2002-05-09 |
EP1017996A4 (en) | 2003-04-23 |
EP1017996B1 (en) | 2008-05-28 |
EP1017996A1 (en) | 2000-07-12 |
CY1108198T1 (el) | 2014-02-12 |
CA2304782C (en) | 2007-03-27 |
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