DE69839567D1 - Zerstörungsfreies prüfungsverfahren für dielektrische materialen - Google Patents

Zerstörungsfreies prüfungsverfahren für dielektrische materialen

Info

Publication number
DE69839567D1
DE69839567D1 DE69839567T DE69839567T DE69839567D1 DE 69839567 D1 DE69839567 D1 DE 69839567D1 DE 69839567 T DE69839567 T DE 69839567T DE 69839567 T DE69839567 T DE 69839567T DE 69839567 D1 DE69839567 D1 DE 69839567D1
Authority
DE
Germany
Prior art keywords
specimen
changes
interference pattern
microwaves
irregularities
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69839567T
Other languages
English (en)
Inventor
Jack R Little
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Application granted granted Critical
Publication of DE69839567D1 publication Critical patent/DE69839567D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Electromagnetism (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Inorganic Insulating Materials (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
DE69839567T 1997-09-25 1998-09-22 Zerstörungsfreies prüfungsverfahren für dielektrische materialen Expired - Lifetime DE69839567D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US93507497A 1997-09-25 1997-09-25
PCT/US1998/019832 WO1999015883A1 (en) 1997-09-25 1998-09-22 Nondestructive testing of dielectric materials

Publications (1)

Publication Number Publication Date
DE69839567D1 true DE69839567D1 (de) 2008-07-10

Family

ID=25466555

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69839567T Expired - Lifetime DE69839567D1 (de) 1997-09-25 1998-09-22 Zerstörungsfreies prüfungsverfahren für dielektrische materialen

Country Status (9)

Country Link
EP (1) EP1017996B1 (de)
AT (1) ATE397210T1 (de)
AU (1) AU746997B2 (de)
CA (1) CA2304782C (de)
CY (1) CY1108198T1 (de)
DE (1) DE69839567D1 (de)
DK (1) DK1017996T3 (de)
NZ (1) NZ503713A (de)
WO (1) WO1999015883A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1214581A1 (de) * 1999-09-17 2002-06-19 Sik - Institut För Livsmedel Och Bioteknik AB Vorrichtung und verfahren zum nachweis von fremdkörpern in produkten
WO2002086474A1 (en) * 2001-04-20 2002-10-31 Commonwealth Scientific And Industrial Research Organisation Probe for non-destructive testing
CA2615685C (en) * 2004-08-05 2015-06-23 Jack R. Little, Jr. High-resolution, nondestructive imaging of dielectric materials
US7520667B2 (en) 2006-05-11 2009-04-21 John Bean Technologies Ab Method and system for determining process parameters
US9046605B2 (en) 2012-11-05 2015-06-02 The Curators Of The University Of Missouri Three-dimensional holographical imaging
WO2014079695A1 (de) * 2012-11-23 2014-05-30 Siemens Ag Österreich Überwachung eines bauteils
EP3779609B1 (de) 2019-08-13 2022-03-16 Patek Philippe SA Genève Anzeigemechanismus für uhr
SG10202004777YA (en) * 2020-05-21 2021-12-30 Wavescan Tech Pte Ltd System and method for portable microwave instrument for high-resolution, contactless non-destructive imaging

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE564022A (de) * 1957-01-16
US3025463A (en) * 1957-11-22 1962-03-13 Eino J Luoma Apparatus for measurement of complex reflection coefficient
SE8000410L (sv) * 1979-01-20 1980-07-21 Lambda Ind Science Ltd Sprickdetektor
JPS61274209A (ja) * 1985-05-30 1986-12-04 Furuno Electric Co Ltd コンクリ−ト欠損等の検出装置
IT1201375B (it) * 1985-11-08 1989-01-27 Consiglio Nazionale Ricerche Metodo ed apparato per la determinazione della costante dielettrica di materiali e sua applicazione per la determinazione del tasso di carbone incombusto presente nelle ceneri di un combustore
US5103181A (en) * 1988-10-05 1992-04-07 Den Norske Oljeselskap A. S. Composition monitor and monitoring process using impedance measurements
US5216372A (en) * 1991-07-29 1993-06-01 Colorado State University Research Foundation Microwave steel belt location sensor for tires
US5384543A (en) * 1992-11-09 1995-01-24 Martin Marietta Energy Systems, Inc. Portable microwave instrument for non-destructive evaluation of structural characteristics
US5393557A (en) * 1992-12-17 1995-02-28 Northrop Grumman Corporation Method for measuring electromagnetic properties
DE4311103A1 (de) * 1993-04-05 1994-10-06 Komi Koppelberg & Migl Kg Verfahren und Vorrichtung zum Erkennen von Fehlern bei Glaskörpern
AU6888996A (en) * 1995-09-11 1997-04-01 Yissum Research Development Company Of The Hebrew University Of Jerusalem Near-field resistivity microscope

Also Published As

Publication number Publication date
NZ503713A (en) 2001-09-28
EP1017996B1 (de) 2008-05-28
CY1108198T1 (el) 2014-02-12
EP1017996A4 (de) 2003-04-23
CA2304782A1 (en) 1999-04-01
AU746997B2 (en) 2002-05-09
EP1017996A1 (de) 2000-07-12
AU9403498A (en) 1999-04-12
DK1017996T3 (da) 2008-09-15
CA2304782C (en) 2007-03-27
WO1999015883A1 (en) 1999-04-01
ATE397210T1 (de) 2008-06-15

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