DE69933600D1 - Kompakte, niederspannungs- und störungsunempfindliche Speicherzelle - Google Patents

Kompakte, niederspannungs- und störungsunempfindliche Speicherzelle

Info

Publication number
DE69933600D1
DE69933600D1 DE69933600T DE69933600T DE69933600D1 DE 69933600 D1 DE69933600 D1 DE 69933600D1 DE 69933600 T DE69933600 T DE 69933600T DE 69933600 T DE69933600 T DE 69933600T DE 69933600 D1 DE69933600 D1 DE 69933600D1
Authority
DE
Germany
Prior art keywords
compact
interference
voltage
low
memory cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69933600T
Other languages
English (en)
Other versions
DE69933600T2 (de
Inventor
John Turner
Manuel Mejia
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Altera Corp
Original Assignee
Altera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/106,796 external-priority patent/US6172900B1/en
Priority claimed from US09/245,428 external-priority patent/US6269020B1/en
Application filed by Altera Corp filed Critical Altera Corp
Application granted granted Critical
Publication of DE69933600D1 publication Critical patent/DE69933600D1/de
Publication of DE69933600T2 publication Critical patent/DE69933600T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/412Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using field-effect transistors only
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/412Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger using field-effect transistors only
    • G11C11/4125Cells incorporating circuit means for protecting against loss of information
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C19/00Digital stores in which the information is moved stepwise, e.g. shift registers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/005Circuit means for protection against loss of information of semiconductor storage devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Static Random-Access Memory (AREA)
  • Read Only Memory (AREA)
DE69933600T 1998-02-26 1999-02-25 Kompakte, niederspannungs- und störungsunempfindliche Speicherzelle Expired - Fee Related DE69933600T2 (de)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US245428 1981-03-19
US7600998P 1998-02-26 1998-02-26
US76009P 1998-02-26
US09/106,796 US6172900B1 (en) 1998-01-16 1998-06-29 Compact, low voltage, noise-immune RAM cell
US106796 1998-06-29
US09/245,428 US6269020B1 (en) 1998-02-26 1999-02-05 FIFO configuration cell

Publications (2)

Publication Number Publication Date
DE69933600D1 true DE69933600D1 (de) 2006-11-30
DE69933600T2 DE69933600T2 (de) 2007-08-23

Family

ID=27372783

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69933600T Expired - Fee Related DE69933600T2 (de) 1998-02-26 1999-02-25 Kompakte, niederspannungs- und störungsunempfindliche Speicherzelle

Country Status (3)

Country Link
EP (1) EP0939407B1 (de)
JP (1) JPH11317081A (de)
DE (1) DE69933600T2 (de)

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0810553B2 (ja) * 1986-06-13 1996-01-31 松下電器産業株式会社 記憶回路
US5325325A (en) * 1990-03-30 1994-06-28 Sharp Kabushiki Kaisha Semiconductor memory device capable of initializing storage data
JP2796644B2 (ja) * 1990-09-20 1998-09-10 三菱電機株式会社 半導体論理回路装置
JPH05144273A (ja) * 1991-11-18 1993-06-11 Mitsubishi Electric Corp 半導体集積回路装置
US5764564A (en) * 1997-03-11 1998-06-09 Xilinx, Inc. Write-assisted memory cell and method of operating same
US5870331A (en) * 1997-09-26 1999-02-09 Advanced Micro Devices, Inc. Application-specific SRAM memory cell for low voltage, high speed operation

Also Published As

Publication number Publication date
EP0939407B1 (de) 2006-10-18
DE69933600T2 (de) 2007-08-23
EP0939407A3 (de) 2000-03-29
JPH11317081A (ja) 1999-11-16
EP0939407A2 (de) 1999-09-01

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee