DE69933081D1 - Schmelzbare Verbindungsschaltung mit Vorbesichtigungsfunktion - Google Patents

Schmelzbare Verbindungsschaltung mit Vorbesichtigungsfunktion

Info

Publication number
DE69933081D1
DE69933081D1 DE69933081T DE69933081T DE69933081D1 DE 69933081 D1 DE69933081 D1 DE 69933081D1 DE 69933081 T DE69933081 T DE 69933081T DE 69933081 T DE69933081 T DE 69933081T DE 69933081 D1 DE69933081 D1 DE 69933081D1
Authority
DE
Germany
Prior art keywords
fusible link
link circuit
preview function
preview
function
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69933081T
Other languages
English (en)
Other versions
DE69933081T2 (de
Inventor
Thomas E Watrobski
Juan J Becerra
Christopher R Morton
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Xerox Corp
Original Assignee
Xerox Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Xerox Corp filed Critical Xerox Corp
Application granted granted Critical
Publication of DE69933081D1 publication Critical patent/DE69933081D1/de
Publication of DE69933081T2 publication Critical patent/DE69933081T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/18—Auxiliary circuits, e.g. for writing into memory
DE69933081T 1998-03-30 1999-02-11 Schmelzbare Verbindungsschaltung mit Vorbesichtigungsfunktion Expired - Fee Related DE69933081T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US50520 1998-03-30
US09/050,520 US6037831A (en) 1998-03-30 1998-03-30 Fusible link circuit including a preview feature

Publications (2)

Publication Number Publication Date
DE69933081D1 true DE69933081D1 (de) 2006-10-19
DE69933081T2 DE69933081T2 (de) 2006-12-21

Family

ID=21965718

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69933081T Expired - Fee Related DE69933081T2 (de) 1998-03-30 1999-02-11 Schmelzbare Verbindungsschaltung mit Vorbesichtigungsfunktion

Country Status (4)

Country Link
US (1) US6037831A (de)
EP (1) EP0947993B1 (de)
JP (1) JP2000036241A (de)
DE (1) DE69933081T2 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6278468B1 (en) * 1998-03-30 2001-08-21 Xerox Corporation Liquid ink printhead including a programmable temperature sensing device
JP3401522B2 (ja) * 1998-07-06 2003-04-28 日本電気株式会社 ヒューズ回路及び冗長デコーダ回路
US6255893B1 (en) * 1999-07-07 2001-07-03 Intel Corporation Method and apparatus for detection of electrical overstress
US6246243B1 (en) * 2000-01-21 2001-06-12 Analog Devices, Inc. Semi-fusible link system
US6307423B1 (en) * 2000-05-01 2001-10-23 Xerox Corporation Programmable circuit with preview function
FR2810783B1 (fr) * 2000-06-27 2002-10-04 St Microelectronics Sa Monostable programmable a haute fiabilite
US6711696B1 (en) * 2000-08-11 2004-03-23 Advanced Micro Devices, Inc. Method for transfering data between two different clock domains by calculating which pulses of the faster clock domain should be skipped substantially simultaneously with the transfer
DE10056590A1 (de) * 2000-11-15 2002-05-23 Philips Corp Intellectual Pty Schaltungsanordnung
US6603344B2 (en) 2001-07-11 2003-08-05 Infineon Technologies Ag Zero static power programmable fuse cell for integrated circuits
US6781437B2 (en) 2001-07-11 2004-08-24 Infineon Technologies Aktiengesellschaft Zero static power programmable fuse cell for integrated circuits
US6839298B2 (en) 2001-07-11 2005-01-04 Infineon Technologies Aktiengesellschaft Zero static power fuse cell for integrated circuits
US20050097385A1 (en) * 2003-10-15 2005-05-05 Ahne Adam J. Method of fault correction for an array of fusible links
US7748815B2 (en) * 2007-08-06 2010-07-06 Hewlett-Packard Development Company, L.P. Disabling a nozzle
US10272671B2 (en) 2015-10-08 2019-04-30 Hewlett-Packard Development Company, L.P. Isolating failed resistors
CN106209061B (zh) * 2016-07-01 2019-03-19 中国电子科技集团公司第二十四研究所 熔丝修调装置
US9862187B1 (en) 2016-08-22 2018-01-09 RF Printing Technologies LLC Inkjet printhead temperature sensing at multiple locations

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4551685A (en) * 1982-10-25 1985-11-05 Kerns Jr David V Programmable gain feedback amplifier
US4879587A (en) * 1986-11-13 1989-11-07 Transensory Devices, Inc. Apparatus and method for forming fusible links
US5025300A (en) * 1989-06-30 1991-06-18 At&T Bell Laboratories Integrated circuits having improved fusible links
US5075690A (en) * 1989-12-18 1991-12-24 Xerox Corporation Temperature sensor for an ink jet printhead
ATE311983T1 (de) * 1990-02-26 2005-12-15 Canon Kk Verfahren zum orten eines temperatursensors auf einem tintenstrahlaufzeichnungskopfsubstrat
US5388134A (en) * 1993-02-05 1995-02-07 Dallas Semiconductor Corporation Integrated circuit thermometer
US5418487A (en) * 1992-09-04 1995-05-23 Benchmarg Microelectronics, Inc. Fuse state sense circuit
JP2991575B2 (ja) * 1992-10-08 1999-12-20 沖電気工業株式会社 半導体集積回路
US5345110A (en) * 1993-04-13 1994-09-06 Micron Semiconductor, Inc. Low-power fuse detect and latch circuit
US5517455A (en) * 1994-03-31 1996-05-14 Sgs-Thomson Microelectronics, Inc. Integrated circuit with fuse circuitry simulating fuse blowing
US5566107A (en) * 1995-05-05 1996-10-15 Micron Technology, Inc. Programmable circuit for enabling an associated circuit

Also Published As

Publication number Publication date
DE69933081T2 (de) 2006-12-21
EP0947993B1 (de) 2006-09-06
EP0947993A2 (de) 1999-10-06
EP0947993A3 (de) 2000-06-21
JP2000036241A (ja) 2000-02-02
US6037831A (en) 2000-03-14

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee