DE69925392D1 - Abtastprüfung von Vorrichtungen - Google Patents

Abtastprüfung von Vorrichtungen

Info

Publication number
DE69925392D1
DE69925392D1 DE69925392T DE69925392T DE69925392D1 DE 69925392 D1 DE69925392 D1 DE 69925392D1 DE 69925392 T DE69925392 T DE 69925392T DE 69925392 T DE69925392 T DE 69925392T DE 69925392 D1 DE69925392 D1 DE 69925392D1
Authority
DE
Germany
Prior art keywords
devices
scanning inspection
inspection
scanning
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69925392T
Other languages
English (en)
Other versions
DE69925392T2 (de
Inventor
Andrew Maccormack
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics Ltd Great Britain
Original Assignee
STMicroelectronics Ltd Great Britain
SGS Thomson Microelectronics Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics Ltd Great Britain, SGS Thomson Microelectronics Ltd filed Critical STMicroelectronics Ltd Great Britain
Publication of DE69925392D1 publication Critical patent/DE69925392D1/de
Application granted granted Critical
Publication of DE69925392T2 publication Critical patent/DE69925392T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/30—Accessing single arrays
    • G11C29/32—Serial access; Scan testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318536—Scan chain arrangements, e.g. connections, test bus, analog signals

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE69925392T 1998-01-30 1999-01-29 Abtastprüfung von Vorrichtungen Expired - Lifetime DE69925392T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB9802091.0A GB9802091D0 (en) 1998-01-30 1998-01-30 Device scan testing
GB9802091 1998-01-30

Publications (2)

Publication Number Publication Date
DE69925392D1 true DE69925392D1 (de) 2005-06-30
DE69925392T2 DE69925392T2 (de) 2006-01-26

Family

ID=10826223

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69925392T Expired - Lifetime DE69925392T2 (de) 1998-01-30 1999-01-29 Abtastprüfung von Vorrichtungen

Country Status (4)

Country Link
US (1) US6327683B1 (de)
EP (1) EP0933644B1 (de)
DE (1) DE69925392T2 (de)
GB (1) GB9802091D0 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6573703B1 (en) * 1999-04-05 2003-06-03 Matsushita Electric Industrial Co., Ltd. Semiconductor device
US6484275B1 (en) * 1999-11-26 2002-11-19 Hewlett-Packard Company System and method for interfacing data with a test access port of a processor
US6553524B1 (en) * 2000-07-12 2003-04-22 Hewlett Packard Development Company, L.P. Method for automating validation of integrated circuit test logic
US7219280B2 (en) * 2003-02-24 2007-05-15 Avago Technologies General Ip (Singapore) Pte. Ltd. Integrated circuit with test signal routing module
JP4549701B2 (ja) * 2004-03-10 2010-09-22 ルネサスエレクトロニクス株式会社 半導体回路装置及び半導体回路に関するスキャンテスト方法
JP5167975B2 (ja) * 2008-06-17 2013-03-21 富士通株式会社 半導体装置
US8225154B2 (en) * 2009-10-01 2012-07-17 Toshiba America Electronic Components, Inc. Low power design using a scan bypass multiplexer as an isolation cell

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03185696A (ja) * 1989-12-13 1991-08-13 Mitsubishi Electric Corp 半導体装置
JPH04212524A (ja) * 1990-12-06 1992-08-04 Matsushita Electric Ind Co Ltd 半導体集積回路
US5299136A (en) * 1991-06-05 1994-03-29 International Business Machines Corp. Fully testable DCVS circuits with single-track global wiring
US5258985A (en) * 1991-11-12 1993-11-02 Motorola, Inc. Combinational data generator and analyzer for built-in self test
GR920100088A (el) * 1992-03-05 1993-11-30 Consulting R & D Corp Koloni S Διαφανής έλεγχος ολοκληρωμένων κυκλωμάτων.
US5428622A (en) * 1993-03-05 1995-06-27 Cyrix Corporation Testing architecture with independent scan paths
US5642362A (en) * 1994-07-20 1997-06-24 International Business Machines Corporation Scan-based delay tests having enhanced test vector pattern generation

Also Published As

Publication number Publication date
US6327683B1 (en) 2001-12-04
DE69925392T2 (de) 2006-01-26
GB9802091D0 (en) 1998-03-25
EP0933644B1 (de) 2005-05-25
EP0933644A1 (de) 1999-08-04

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition