DE69837071D1 - ESD-Schutzbauteil - Google Patents

ESD-Schutzbauteil

Info

Publication number
DE69837071D1
DE69837071D1 DE69837071T DE69837071T DE69837071D1 DE 69837071 D1 DE69837071 D1 DE 69837071D1 DE 69837071 T DE69837071 T DE 69837071T DE 69837071 T DE69837071 T DE 69837071T DE 69837071 D1 DE69837071 D1 DE 69837071D1
Authority
DE
Germany
Prior art keywords
esd protection
protection component
component
esd
protection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69837071T
Other languages
English (en)
Inventor
Franck Duclos
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
STMicroelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SA filed Critical STMicroelectronics SA
Application granted granted Critical
Publication of DE69837071D1 publication Critical patent/DE69837071D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
    • H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including only semiconductor components of a single kind
    • H01L27/0814—Diodes only
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Elimination Of Static Electricity (AREA)
DE69837071T 1997-10-24 1998-10-23 ESD-Schutzbauteil Expired - Lifetime DE69837071D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9713591A FR2770341B1 (fr) 1997-10-24 1997-10-24 Dispositif de protection contre des decharges electrostatiques a faible niveau de seuil

Publications (1)

Publication Number Publication Date
DE69837071D1 true DE69837071D1 (de) 2007-03-29

Family

ID=9512803

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69837071T Expired - Lifetime DE69837071D1 (de) 1997-10-24 1998-10-23 ESD-Schutzbauteil

Country Status (5)

Country Link
US (1) US5994760A (de)
EP (1) EP0921571B1 (de)
JP (1) JPH11317532A (de)
DE (1) DE69837071D1 (de)
FR (1) FR2770341B1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3275850B2 (ja) * 1998-10-09 2002-04-22 日本電気株式会社 高耐圧ダイオードとその製造方法
US6501630B1 (en) 1999-12-17 2002-12-31 Koninklijke Philips Electronics N.V. Bi-directional ESD diode structure
US6674129B1 (en) * 1999-12-17 2004-01-06 Koninklijke Phillips Electronics N.V. ESD diode structure
JP4025023B2 (ja) * 2001-01-18 2007-12-19 株式会社東芝 半導体装置
US7384854B2 (en) 2002-03-08 2008-06-10 International Business Machines Corporation Method of forming low capacitance ESD robust diodes
US8000067B1 (en) * 2003-05-15 2011-08-16 Marvell International Ltd. Method and apparatus for improving supply noise rejection
KR100763223B1 (ko) * 2006-01-18 2007-10-04 삼성전자주식회사 수평 방향의 전류 경로를 가진 정전기 방전 소자 및다이오드와 이들의 제조방법
KR101050456B1 (ko) * 2008-11-10 2011-07-19 주식회사 하이닉스반도체 정전기 보호소자
JP5532137B2 (ja) * 2010-08-18 2014-06-25 株式会社村田製作所 Ｅｓｄ保護デバイス
US10476263B2 (en) * 2015-12-31 2019-11-12 Novatek Microelectronics Corp. Device and operation method for electrostatic discharge protection

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60169110A (ja) * 1984-02-14 1985-09-02 Toshiba Corp 超電導装置
FR2683947B1 (fr) * 1991-11-18 1994-02-18 Sgs Thomson Microelectronics Sa Diode de protection monolithique basse tension a faible capacite.
FR2693032B1 (fr) * 1992-06-25 1994-09-30 Sgs Thomson Microelectronics Structure de diodes de protection de plot.
JP3101481B2 (ja) * 1994-01-28 2000-10-23 三洋電機株式会社 半導体装置
JPH09162298A (ja) * 1995-12-12 1997-06-20 Fujitsu Ltd 半導体装置
TW359024B (en) * 1996-05-28 1999-05-21 Winbond Electronics Corp Stage silicon control rectifier protection circuit and the structure

Also Published As

Publication number Publication date
FR2770341A1 (fr) 1999-04-30
EP0921571B1 (de) 2007-02-14
FR2770341B1 (fr) 2000-01-14
EP0921571A1 (de) 1999-06-09
US5994760A (en) 1999-11-30
JPH11317532A (ja) 1999-11-16

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Legal Events

Date Code Title Description
8332 No legal effect for de