DE69833103D1 - Verfahren zum messen und quantifizieren von oberflächenfehlern auf einer prüfoberfläche - Google Patents
Verfahren zum messen und quantifizieren von oberflächenfehlern auf einer prüfoberflächeInfo
- Publication number
- DE69833103D1 DE69833103D1 DE69833103T DE69833103T DE69833103D1 DE 69833103 D1 DE69833103 D1 DE 69833103D1 DE 69833103 T DE69833103 T DE 69833103T DE 69833103 T DE69833103 T DE 69833103T DE 69833103 D1 DE69833103 D1 DE 69833103D1
- Authority
- DE
- Germany
- Prior art keywords
- measuring
- quantifying
- failures
- test
- test surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
SE9700539 | 1997-02-17 | ||
SE9700539A SE508822C2 (sv) | 1997-02-17 | 1997-02-17 | Förfarande och anordning för mätning och kvantifiering av ytdefekter på en provyta |
PCT/SE1998/000226 WO1998036240A1 (en) | 1997-02-17 | 1998-02-10 | Method and device for measuring and quantifying surface defects on a test surface |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69833103D1 true DE69833103D1 (de) | 2006-03-30 |
DE69833103T2 DE69833103T2 (de) | 2006-08-31 |
Family
ID=20405811
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69833103T Expired - Fee Related DE69833103T2 (de) | 1997-02-17 | 1998-02-10 | Verfahren zum messen und quantifizieren von oberflächenfehlern auf einer prüfoberfläche |
Country Status (6)
Country | Link |
---|---|
US (1) | US6667800B1 (de) |
EP (1) | EP0960318B1 (de) |
AU (1) | AU6233498A (de) |
DE (1) | DE69833103T2 (de) |
SE (1) | SE508822C2 (de) |
WO (1) | WO1998036240A1 (de) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB9824986D0 (en) | 1998-11-13 | 1999-01-06 | Isis Innovation | Non-contact topographical analysis apparatus and method thereof |
SE511985C2 (sv) | 1999-01-28 | 2000-01-10 | Skogsind Tekn Foskningsinst | Topografisk bestämning av en av infallande ljus belyst yta |
SE515711C2 (sv) | 2000-02-09 | 2001-10-01 | Volvo Personvagnar Ab | Anordning och förfarande för uppmätning hos ytojämnheter hos ett mätobjekt |
SE0003904L (sv) * | 2000-05-05 | 2001-11-06 | Roger Tuomas | Sätt att mäta ytråhet |
US7430485B2 (en) | 2003-08-22 | 2008-09-30 | Rohm And Haas Company | Method and system for analyzing coatings undergoing exposure testing |
US20080027580A1 (en) * | 2006-07-28 | 2008-01-31 | Hui Zhang | Robot programming method and apparatus with both vision and force |
US8594417B2 (en) * | 2007-11-27 | 2013-11-26 | Alcoa Inc. | Systems and methods for inspecting anodes and smelting management relating to the same |
US9881284B2 (en) | 2008-10-02 | 2018-01-30 | ecoATM, Inc. | Mini-kiosk for recycling electronic devices |
US7881965B2 (en) | 2008-10-02 | 2011-02-01 | ecoATM, Inc. | Secondary market and vending system for devices |
US20130144797A1 (en) * | 2008-10-02 | 2013-06-06 | ecoATM, Inc. | Method And Apparatus For Recycling Electronic Devices |
US10853873B2 (en) | 2008-10-02 | 2020-12-01 | Ecoatm, Llc | Kiosks for evaluating and purchasing used electronic devices and related technology |
DE202009019027U1 (de) | 2008-10-02 | 2015-09-21 | ecoATM, Inc. | Sekundärmarkt und Verkaufssystem für Geräte |
US11010841B2 (en) | 2008-10-02 | 2021-05-18 | Ecoatm, Llc | Kiosk for recycling electronic devices |
EP2695126A4 (de) | 2011-04-06 | 2014-09-17 | Ecoatm Inc | Verfahren und kiosk zur wiederverwertung elektronischer vorrichtungen |
JP2015129715A (ja) * | 2014-01-08 | 2015-07-16 | リコーエレメックス株式会社 | 検査装置及び検査装置の制御方法 |
US10401411B2 (en) | 2014-09-29 | 2019-09-03 | Ecoatm, Llc | Maintaining sets of cable components used for wired analysis, charging, or other interaction with portable electronic devices |
CA3074916A1 (en) | 2014-10-02 | 2016-04-07 | Ecoatm, Llc | Application for device evaluation and other processes associated with device recycling |
CA2964214C (en) | 2014-10-02 | 2020-08-04 | ecoATM, Inc. | Wireless-enabled kiosk for recycling consumer devices |
US10445708B2 (en) | 2014-10-03 | 2019-10-15 | Ecoatm, Llc | System for electrically testing mobile devices at a consumer-operated kiosk, and associated devices and methods |
US10417615B2 (en) | 2014-10-31 | 2019-09-17 | Ecoatm, Llc | Systems and methods for recycling consumer electronic devices |
WO2016069742A1 (en) | 2014-10-31 | 2016-05-06 | ecoATM, Inc. | Methods and systems for facilitating processes associated with insurance services and/or other services for electronic devices |
EP3215988A1 (de) | 2014-11-06 | 2017-09-13 | Ecoatm Inc. | Verfahren und systeme zur beurteilung und wiederverwendung elektronischer vorrichtungen |
US11080672B2 (en) | 2014-12-12 | 2021-08-03 | Ecoatm, Llc | Systems and methods for recycling consumer electronic devices |
JP6292145B2 (ja) * | 2015-02-24 | 2018-03-14 | Jfeスチール株式会社 | 金属帯エッジ部の欠陥検出方法および金属帯エッジ部の欠陥検出装置 |
US10127647B2 (en) | 2016-04-15 | 2018-11-13 | Ecoatm, Llc | Methods and systems for detecting cracks in electronic devices |
US9885672B2 (en) | 2016-06-08 | 2018-02-06 | ecoATM, Inc. | Methods and systems for detecting screen covers on electronic devices |
US10269110B2 (en) | 2016-06-28 | 2019-04-23 | Ecoatm, Llc | Methods and systems for detecting cracks in illuminated electronic device screens |
US11989710B2 (en) | 2018-12-19 | 2024-05-21 | Ecoatm, Llc | Systems and methods for vending and/or purchasing mobile phones and other electronic devices |
KR20210126068A (ko) | 2019-02-12 | 2021-10-19 | 에코에이티엠, 엘엘씨 | 중고 전자 디바이스를 평가하고 구매하기 위한 키오스크 |
KR20210125526A (ko) | 2019-02-12 | 2021-10-18 | 에코에이티엠, 엘엘씨 | 전자 디바이스 키오스크를 위한 커넥터 캐리어 |
WO2020172190A1 (en) | 2019-02-18 | 2020-08-27 | Ecoatm, Llc | Neural network based physical condition evaluation of electronic devices, and associated systems and methods |
US11922467B2 (en) | 2020-08-17 | 2024-03-05 | ecoATM, Inc. | Evaluating an electronic device using optical character recognition |
WO2022040667A1 (en) | 2020-08-17 | 2022-02-24 | Ecoatm, Llc | Evaluating an electronic device using a wireless charger |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4162126A (en) * | 1976-12-10 | 1979-07-24 | Hitachi, Ltd. | Surface detect test apparatus |
US4920385A (en) * | 1984-02-14 | 1990-04-24 | Diffracto Ltd. | Panel surface flaw inspection |
JP2797333B2 (ja) * | 1988-09-16 | 1998-09-17 | セイコーエプソン株式会社 | コンタクトレンズの製造方法及び装置 |
US5401977A (en) * | 1988-10-14 | 1995-03-28 | Byk-Gardner Gmbh | Method and apparatus for gloss measurement with reference value pairs |
US5129009A (en) * | 1990-06-04 | 1992-07-07 | Motorola, Inc. | Method for automatic semiconductor wafer inspection |
US5426506A (en) * | 1993-03-22 | 1995-06-20 | The University Of Chicago | Optical method and apparatus for detection of surface and near-subsurface defects in dense ceramics |
US5828500A (en) * | 1995-10-11 | 1998-10-27 | Asahi Kogaku Kogyo Kabushiki Kaisha | Optical element inspecting apparatus |
US5987159A (en) * | 1996-09-24 | 1999-11-16 | Cognex Corporation | System or method for detecting defect within a semi-opaque enclosure |
US5859698A (en) * | 1997-05-07 | 1999-01-12 | Nikon Corporation | Method and apparatus for macro defect detection using scattered light |
-
1997
- 1997-02-17 SE SE9700539A patent/SE508822C2/sv not_active IP Right Cessation
-
1998
- 1998-02-10 AU AU62334/98A patent/AU6233498A/en not_active Abandoned
- 1998-02-10 DE DE69833103T patent/DE69833103T2/de not_active Expired - Fee Related
- 1998-02-10 WO PCT/SE1998/000226 patent/WO1998036240A1/en active IP Right Grant
- 1998-02-10 EP EP98904474A patent/EP0960318B1/de not_active Expired - Lifetime
-
1999
- 1999-08-17 US US09/375,848 patent/US6667800B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
AU6233498A (en) | 1998-09-08 |
WO1998036240A1 (en) | 1998-08-20 |
SE9700539D0 (sv) | 1997-02-17 |
SE9700539L (sv) | 1998-08-18 |
DE69833103T2 (de) | 2006-08-31 |
SE508822C2 (sv) | 1998-11-09 |
US6667800B1 (en) | 2003-12-23 |
EP0960318A1 (de) | 1999-12-01 |
EP0960318B1 (de) | 2006-01-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |