DE69831715D1 - Anwendung von frequenzwobblung in einer zu testenden anordnung - Google Patents

Anwendung von frequenzwobblung in einer zu testenden anordnung

Info

Publication number
DE69831715D1
DE69831715D1 DE69831715T DE69831715T DE69831715D1 DE 69831715 D1 DE69831715 D1 DE 69831715D1 DE 69831715 T DE69831715 T DE 69831715T DE 69831715 T DE69831715 T DE 69831715T DE 69831715 D1 DE69831715 D1 DE 69831715D1
Authority
DE
Germany
Prior art keywords
testable
arrangement
application
frequency wobbling
wobbling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69831715T
Other languages
English (en)
Other versions
DE69831715T2 (de
Inventor
Taco Zwemstra
Petrus Seuren
Theodor Looijer
Josephus Janssen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP BV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Application granted granted Critical
Publication of DE69831715D1 publication Critical patent/DE69831715D1/de
Publication of DE69831715T2 publication Critical patent/DE69831715T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/1095—Measuring or testing for AC performance, i.e. dynamic testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M7/00—Conversion of a code where information is represented by a given sequence or number of digits to a code where the same, similar or subset of information is represented by a different sequence or number of digits
    • H03M7/30—Compression; Expansion; Suppression of unnecessary data, e.g. redundancy reduction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/20—Measurement of non-linear distortion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Analogue/Digital Conversion (AREA)
DE69831715T 1997-05-15 1998-04-14 Anwendung von frequenzwobblung in einer zu testenden anordnung Expired - Lifetime DE69831715T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP97201468 1997-05-15
EP97201468 1997-05-15
PCT/IB1998/000550 WO1998052286A2 (en) 1997-05-15 1998-04-14 Swept frequency device test

Publications (2)

Publication Number Publication Date
DE69831715D1 true DE69831715D1 (de) 2005-11-03
DE69831715T2 DE69831715T2 (de) 2006-06-29

Family

ID=8228321

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69831715T Expired - Lifetime DE69831715T2 (de) 1997-05-15 1998-04-14 Anwendung von frequenzwobblung in einer zu testenden anordnung

Country Status (7)

Country Link
US (1) US6097194A (de)
EP (1) EP0917765B1 (de)
JP (1) JP4279356B2 (de)
KR (1) KR20000023775A (de)
DE (1) DE69831715T2 (de)
TW (1) TW382656B (de)
WO (1) WO1998052286A2 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7778315B2 (en) * 2004-04-14 2010-08-17 Tektronix, Inc. Measuring instantaneous signal dependent nonlinear distortion in response to varying frequency sinusoidal test signal
CA2817631C (en) * 2004-12-14 2015-06-02 Luna Innovations Inc. Compensating for time varying phase changes in interferometric measurements
JP4881904B2 (ja) * 2008-03-24 2012-02-22 アンリツ株式会社 信号発生装置
DE102008060385B4 (de) * 2008-10-01 2018-05-03 Rohde & Schwarz Gmbh & Co. Kg Verfahren und Vorrichtung für eine zeitoptimierte Ermittlung des Frequenzganges von in einem Messobjekt erzeugten Harmonischen

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2849174A1 (de) * 1978-11-13 1980-05-14 Siemens Ag Verfahren und schaltungsanordnung zur daempfungsmessung, insbesondere zur ermittlung der daempfungs- und/oder gruppenlaufzeitverzerrung eines messobjektes
DE3218066A1 (de) * 1981-07-08 1983-01-27 Siemens AG, 1000 Berlin und 8000 München Verfahren zur pruefung von analog-digital-wandlern und/oder von digital-analog-wandlern oder von nachrichtentechnischen uebertragungsabschnitten, die solche wandler enthalten oder mit ihnen in reihe geschaltet sind, insbsondere zur pruefung von codecs fuer pcm-geraete, sowie vorrichtung zur durchfuehrung des verfahrens
US4613814A (en) * 1985-04-01 1986-09-23 Tektronix, Inc. Method of measuring a frequency domain characteristic
US4896271A (en) * 1987-08-05 1990-01-23 Tektronix, Inc. Method and apparatus for measuring jitter in a periodic signal
US4858142A (en) * 1987-08-05 1989-08-15 Tektronix, Inc. Digitizer effective resolution measurement system using sinewave parameter estimation
US5081592A (en) * 1987-08-05 1992-01-14 Tektronix, Inc. Test system for acquiring, calculating and displaying representations of data sequences
EP0447117B1 (de) * 1990-03-15 1997-02-19 AT&T Corp. Eingebaute Selbstprüfung für Analog-Digitalumsetzer
JP3211625B2 (ja) * 1995-06-09 2001-09-25 ソニー株式会社 ディジタル−アナログ変換部内蔵回路装置

Also Published As

Publication number Publication date
WO1998052286A2 (en) 1998-11-19
TW382656B (en) 2000-02-21
EP0917765A2 (de) 1999-05-26
WO1998052286A3 (en) 1999-02-18
US6097194A (en) 2000-08-01
JP2001502432A (ja) 2001-02-20
KR20000023775A (ko) 2000-04-25
DE69831715T2 (de) 2006-06-29
EP0917765B1 (de) 2005-09-28
JP4279356B2 (ja) 2009-06-17

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: EISENFUEHR, SPEISER & PARTNER, 10178 BERLIN

8327 Change in the person/name/address of the patent owner

Owner name: NXP B.V., EINDHOVEN, NL