DE69803335T2 - Herstellung von sub-lithographischen Strukturen - Google Patents
Herstellung von sub-lithographischen StrukturenInfo
- Publication number
- DE69803335T2 DE69803335T2 DE69803335T DE69803335T DE69803335T2 DE 69803335 T2 DE69803335 T2 DE 69803335T2 DE 69803335 T DE69803335 T DE 69803335T DE 69803335 T DE69803335 T DE 69803335T DE 69803335 T2 DE69803335 T2 DE 69803335T2
- Authority
- DE
- Germany
- Prior art keywords
- sub
- manufacture
- lithographic structures
- lithographic
- structures
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
- H01L21/76802—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing by forming openings in dielectrics
- H01L21/76816—Aspects relating to the layout of the pattern or to the size of vias or trenches
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/884,732 US6051497A (en) | 1997-06-30 | 1997-06-30 | Formation of sub-groundrule features |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69803335D1 DE69803335D1 (de) | 2002-02-28 |
DE69803335T2 true DE69803335T2 (de) | 2002-09-19 |
Family
ID=25385267
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69803335T Expired - Lifetime DE69803335T2 (de) | 1997-06-30 | 1998-05-29 | Herstellung von sub-lithographischen Strukturen |
Country Status (8)
Country | Link |
---|---|
US (1) | US6051497A (de) |
EP (1) | EP0889516B1 (de) |
JP (1) | JPH1174273A (de) |
KR (1) | KR100536051B1 (de) |
CN (1) | CN1121718C (de) |
DE (1) | DE69803335T2 (de) |
HK (1) | HK1015544A1 (de) |
TW (1) | TW405200B (de) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6740573B2 (en) * | 1995-02-17 | 2004-05-25 | Micron Technology, Inc. | Method for forming an integrated circuit interconnect using a dual poly process |
US6162731A (en) * | 1999-06-08 | 2000-12-19 | United Silicon Incorporated | Method of defining a conductive layer |
KR100393945B1 (ko) * | 2001-02-24 | 2003-08-06 | 이노스텍 (주) | 금속 박막 저항체 소자의 제조 방법 및 이를 이용한 금속 박막 온도 센서의 제조 방법 |
TW559950B (en) * | 2002-03-13 | 2003-11-01 | Macronix Int Co Ltd | Memory device and method of forming passivation film thereof |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5651855A (en) * | 1992-07-28 | 1997-07-29 | Micron Technology, Inc. | Method of making self aligned contacts to silicon substrates during the manufacture of integrated circuits |
US5328553A (en) * | 1993-02-02 | 1994-07-12 | Motorola Inc. | Method for fabricating a semiconductor device having a planar surface |
US5490634A (en) * | 1993-02-10 | 1996-02-13 | Michigan Biotechnology Institute | Biological method for coal comminution |
US5494857A (en) * | 1993-07-28 | 1996-02-27 | Digital Equipment Corporation | Chemical mechanical planarization of shallow trenches in semiconductor substrates |
US5661053A (en) * | 1994-05-25 | 1997-08-26 | Sandisk Corporation | Method of making dense flash EEPROM cell array and peripheral supporting circuits formed in deposited field oxide with the use of spacers |
US5506172A (en) * | 1994-08-29 | 1996-04-09 | Micron Technology, Inc. | Semiconductor processing method of forming an electrical interconnection between an outer layer and an inner layer |
JP3413697B2 (ja) * | 1995-11-17 | 2003-06-03 | ソニー株式会社 | 配線形成方法 |
US5639692A (en) * | 1996-04-08 | 1997-06-17 | Chartered Semiconductor Manufacturing Pte, Ltd. | Non-etch back SOG process using a metal via stud |
JPH1010716A (ja) * | 1996-06-19 | 1998-01-16 | Brother Ind Ltd | 感光記録媒体及びそれを使用する画像形成装置 |
JPH10107161A (ja) * | 1996-09-27 | 1998-04-24 | Sony Corp | 半導体装置及びその製造方法 |
-
1997
- 1997-06-30 US US08/884,732 patent/US6051497A/en not_active Expired - Lifetime
-
1998
- 1998-05-29 EP EP98109829A patent/EP0889516B1/de not_active Expired - Lifetime
- 1998-05-29 DE DE69803335T patent/DE69803335T2/de not_active Expired - Lifetime
- 1998-06-24 TW TW087110162A patent/TW405200B/zh not_active IP Right Cessation
- 1998-06-26 JP JP10180590A patent/JPH1174273A/ja active Pending
- 1998-06-29 KR KR1019980024785A patent/KR100536051B1/ko not_active IP Right Cessation
- 1998-06-30 CN CN98115620A patent/CN1121718C/zh not_active Expired - Fee Related
-
1999
- 1999-02-11 HK HK99100572A patent/HK1015544A1/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
HK1015544A1 (en) | 1999-10-15 |
CN1204151A (zh) | 1999-01-06 |
KR19990007420A (ko) | 1999-01-25 |
US6051497A (en) | 2000-04-18 |
CN1121718C (zh) | 2003-09-17 |
EP0889516A2 (de) | 1999-01-07 |
TW405200B (en) | 2000-09-11 |
DE69803335D1 (de) | 2002-02-28 |
EP0889516A3 (de) | 1999-10-13 |
JPH1174273A (ja) | 1999-03-16 |
KR100536051B1 (ko) | 2006-02-28 |
EP0889516B1 (de) | 2002-01-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: QIMONDA AG, 81739 MUENCHEN, DE |