DE69739790D1 - System und verfahren für hochgenautemperatur-kalibration eines sensor - Google Patents

System und verfahren für hochgenautemperatur-kalibration eines sensor

Info

Publication number
DE69739790D1
DE69739790D1 DE69739790T DE69739790T DE69739790D1 DE 69739790 D1 DE69739790 D1 DE 69739790D1 DE 69739790 T DE69739790 T DE 69739790T DE 69739790 T DE69739790 T DE 69739790T DE 69739790 D1 DE69739790 D1 DE 69739790D1
Authority
DE
Germany
Prior art keywords
sensor
temperature calibration
genuine
high genuine
calibration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69739790T
Other languages
English (en)
Inventor
Finbarr J Crispie
Mohammad Yunus
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sensata Technologies Inc
Original Assignee
Sensata Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sensata Technologies Inc filed Critical Sensata Technologies Inc
Application granted granted Critical
Publication of DE69739790D1 publication Critical patent/DE69739790D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
    • G01D3/036—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
    • G01D3/0365—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves the undesired influence being measured using a separate sensor, which produces an influence related signal

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
DE69739790T 1996-07-01 1997-07-01 System und verfahren für hochgenautemperatur-kalibration eines sensor Expired - Lifetime DE69739790D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/674,028 US5902925A (en) 1996-07-01 1996-07-01 System and method for high accuracy calibration of a sensor for offset and sensitivity variation with temperature
PCT/US1997/011315 WO1998002721A2 (en) 1996-07-01 1997-07-01 Calibration of a sensor with temperature variations

Publications (1)

Publication Number Publication Date
DE69739790D1 true DE69739790D1 (de) 2010-04-15

Family

ID=24705039

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69739790T Expired - Lifetime DE69739790D1 (de) 1996-07-01 1997-07-01 System und verfahren für hochgenautemperatur-kalibration eines sensor

Country Status (7)

Country Link
US (1) US5902925A (de)
EP (1) EP0909378B1 (de)
JP (1) JP3415631B2 (de)
AU (1) AU3645297A (de)
CA (1) CA2259378A1 (de)
DE (1) DE69739790D1 (de)
WO (1) WO1998002721A2 (de)

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1279641B1 (it) * 1995-10-03 1997-12-16 Marposs Spa Apparecchio per il controllo del diametro di perni di biella in moto orbitale
WO1998020615A2 (en) * 1996-10-21 1998-05-14 Electronics Development Corporation Smart sensor module
US6433333B1 (en) * 2000-03-03 2002-08-13 Drs Sensors & Targeting Systems, Inc. Infrared sensor temperature compensated response and offset correction
IT1321212B1 (it) * 2000-03-06 2003-12-31 Marposs Spa Apparecchiatura per il controllo del diametro di perni .
US6644092B1 (en) * 2001-05-14 2003-11-11 Robert J. Oppel Automatic calibration of pressure sensors for paint booth airflow control
US6813925B2 (en) * 2002-06-05 2004-11-09 General Electric Company Calibration method and system for a dynamic combustor sensor
US7859269B1 (en) * 2008-04-30 2010-12-28 Semiconductor Components Industries, Llc Pade' approximant based compensation for integrated sensor modules and the like
US7190178B2 (en) * 2004-05-13 2007-03-13 Ami Semiconductor, Inc. Pade′ Approximant based compensation for integrated sensor modules and the like
US7006938B2 (en) * 2004-06-16 2006-02-28 Ami Semiconductor, Inc. Reactive sensor modules using Pade' Approximant based compensation and providing module-sourced excitation
US7235773B1 (en) 2005-04-12 2007-06-26 Itt Manufacturing Enterprises, Inc. Method and apparatus for image signal compensation of dark current, focal plane temperature, and electronics temperature
US7398173B2 (en) * 2005-05-04 2008-07-08 Ami Semiconductor, Inc. Providing nonlinear temperature compensation for sensing means by use of Padé approximant function emulators
US7461535B2 (en) * 2006-03-01 2008-12-09 Memsic, Inc. Multi-temperature programming for accelerometer
US7373266B2 (en) * 2006-07-28 2008-05-13 On Semiconductor Sensor calibration using selectively disconnected temperature
US8081006B2 (en) * 2006-07-28 2011-12-20 Semiconductor Components Industries, Llc Non-linear sensor temperature compensation using summed temperature compensation signals
DE102007044471A1 (de) * 2007-09-18 2009-04-02 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur abschnittsweisen Bestimmung eines parameterabhängigen Korrekturwertnäherungsverlaufs und Sensoranordnung
US8965726B2 (en) 2008-02-20 2015-02-24 Robert Bosch Gmbh System and method for measuring DC offset in a sensor output by modulating a signal-independent operating parameter of the sensor
KR101922539B1 (ko) 2009-03-02 2018-11-27 더 리젠츠 오브 더 유니버시티 오브 캘리포니아 종양 선택적 ｅ１ａ 및 ｅ１ｂ 돌연변이
DE102009032353A1 (de) 2009-07-08 2011-09-08 Hommel-Etamic Gmbh Verfahren zur Ermittlung der Form eines Werkstücks
DE102009042252B4 (de) 2009-09-22 2014-03-06 Jenoptik Industrial Metrology Germany Gmbh Meßvorrichtung
KR101091667B1 (ko) * 2009-12-03 2011-12-08 현대자동차주식회사 하이브리드 차량용 모터 온도 측정 방법
DE102010013069B4 (de) * 2010-03-26 2012-12-06 Hommel-Etamic Gmbh Meßvorrichtung
CN101936746B (zh) * 2010-08-02 2012-09-05 北京华控技术有限责任公司 一种非电学量测定系统及方法
DE102010035147B4 (de) 2010-08-23 2016-07-28 Jenoptik Industrial Metrology Germany Gmbh Meßvorrichtung
TWI384764B (zh) 2010-12-03 2013-02-01 Ind Tech Res Inst 處理系統
DE102012018580B4 (de) 2012-09-20 2015-06-11 Jenoptik Industrial Metrology Germany Gmbh Messvorrichtung und Messverfahren zur Inprozess-Messung an Prüflingen während eines Bearbeitungsvorganges an einer Bearbeitungsmaschine, insbesondere einer Schleifmaschine
US20140190237A1 (en) * 2013-01-09 2014-07-10 Auto Industrial Co., Ltd. Output specification calibrating apparatus for capacitive pressure sensor
US9389060B2 (en) 2013-02-13 2016-07-12 Allegro Microsystems, Llc Magnetic field sensor and related techniques that provide an angle error correction module
US9400164B2 (en) 2013-07-22 2016-07-26 Allegro Microsystems, Llc Magnetic field sensor and related techniques that provide an angle correction module
US10120042B2 (en) 2013-12-23 2018-11-06 Allegro Microsystems, Llc Magnetic field sensor and related techniques that inject a synthesized error correction signal into a signal channel to result in reduced error
US9574867B2 (en) 2013-12-23 2017-02-21 Allegro Microsystems, Llc Magnetic field sensor and related techniques that inject an error correction signal into a signal channel to result in reduced error
US11163022B2 (en) 2015-06-12 2021-11-02 Allegro Microsystems, Llc Magnetic field sensor for angle detection with a phase-locked loop
CN107702849B (zh) * 2017-10-31 2024-02-09 北京航天计量测试技术研究所 一种高低温条件下力传感器校准装置
US10914795B2 (en) * 2019-02-20 2021-02-09 Crocus Technology Inc. Apparatus and method for magnetic sensor output compensation based upon ambient temperature
US11473935B1 (en) 2021-04-16 2022-10-18 Allegro Microsystems, Llc System and related techniques that provide an angle sensor for sensing an angle of rotation of a ferromagnetic screw
CN113267264B (zh) * 2021-05-23 2023-04-14 山东英信计算机技术有限公司 一种温度传感器的温度检测方法、系统、设备以及介质
TWI790857B (zh) 2021-12-15 2023-01-21 財團法人工業技術研究院 差動式電容裝置與差動式電容校準方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4355537A (en) * 1980-11-06 1982-10-26 Combustion Engineering, Inc. Temperature compensation for transducer components
US4437164A (en) * 1981-03-05 1984-03-13 Bristol Babcock Inc. Ridge circuit compensation for environmental effects
US4933535A (en) * 1989-02-15 1990-06-12 Harper-Wyman Company Piecewise linear temperature controller utilizing pulse width modulation
US5027015A (en) * 1989-09-14 1991-06-25 Motorola, Inc. Non-linear conversion of input from a sensor to an output with two different slopes

Also Published As

Publication number Publication date
WO1998002721A2 (en) 1998-01-22
EP0909378A2 (de) 1999-04-21
WO1998002721A3 (en) 1998-02-19
EP0909378B1 (de) 2010-03-03
JP3415631B2 (ja) 2003-06-09
CA2259378A1 (en) 1998-01-22
AU3645297A (en) 1998-02-09
US5902925A (en) 1999-05-11
EP0909378A4 (de) 1999-09-29
JP2000512020A (ja) 2000-09-12

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