DE69731713D1 - Prüfadaptermodul, das den Zugang zu einer Vorrichtung mit gitterförmig angeordneten Kügelchen (BGA) ermöglicht, ein derartiges Prüfadaptermodul enthaltendes System und Verwendung des Prüfadaptermoduls - Google Patents
Prüfadaptermodul, das den Zugang zu einer Vorrichtung mit gitterförmig angeordneten Kügelchen (BGA) ermöglicht, ein derartiges Prüfadaptermodul enthaltendes System und Verwendung des PrüfadaptermodulsInfo
- Publication number
- DE69731713D1 DE69731713D1 DE69731713T DE69731713T DE69731713D1 DE 69731713 D1 DE69731713 D1 DE 69731713D1 DE 69731713 T DE69731713 T DE 69731713T DE 69731713 T DE69731713 T DE 69731713T DE 69731713 D1 DE69731713 D1 DE 69731713D1
- Authority
- DE
- Germany
- Prior art keywords
- adapter module
- test adapter
- bga
- grid
- system containing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/745,531 US6020749A (en) | 1996-11-12 | 1996-11-12 | Method and apparatus for performing testing of double-sided ball grid array devices |
US745531 | 1996-11-12 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69731713D1 true DE69731713D1 (de) | 2004-12-30 |
DE69731713T2 DE69731713T2 (de) | 2005-10-06 |
Family
ID=24997079
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69731713T Expired - Fee Related DE69731713T2 (de) | 1996-11-12 | 1997-09-10 | Prüfadaptermodul, das den Zugang zu einer Vorrichtung mit gitterförmig angeordneten Kügelchen (BGA) ermöglicht, ein derartiges Prüfadaptermodul enthaltendes System und Verwendung des Prüfadaptermoduls |
Country Status (4)
Country | Link |
---|---|
US (1) | US6020749A (de) |
EP (1) | EP0841573B1 (de) |
JP (1) | JPH10153644A (de) |
DE (1) | DE69731713T2 (de) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6535005B1 (en) * | 2000-04-26 | 2003-03-18 | Emc Corporation | Systems and methods for obtaining an electrical characteristics of a circuit board assembly process |
NO315017B1 (no) * | 2000-06-09 | 2003-06-23 | Idex Asa | Sensorbrikke, s¶rlig for måling av strukturer i en fingeroverflate |
NO315016B1 (no) * | 2000-06-09 | 2003-06-23 | Idex Asa | Miniatyrisert sensor |
US6884653B2 (en) * | 2001-03-21 | 2005-04-26 | Micron Technology, Inc. | Folded interposer |
US6812485B2 (en) * | 2001-12-28 | 2004-11-02 | Hewlett-Packard Development Company, L.P. | Dual interposer packaging for high density interconnect |
US6888360B1 (en) * | 2004-02-20 | 2005-05-03 | Research In Motion Limited | Surface mount technology evaluation board having varied board pad characteristics |
NO20093601A1 (no) | 2009-12-29 | 2011-06-30 | Idex Asa | Overflatesensor |
US20140055159A1 (en) * | 2012-02-21 | 2014-02-27 | Nexus Technology | Interposer with Edge Probe Points |
US9460993B2 (en) * | 2012-02-21 | 2016-10-04 | Robert C. Shelsky | Interposer with signal-conditioned edge probe points |
NO20131423A1 (no) | 2013-02-22 | 2014-08-25 | Idex Asa | Integrert fingeravtrykksensor |
KR102255740B1 (ko) | 2014-02-21 | 2021-05-26 | 이덱스 바이오메트릭스 아사 | 중첩된 그리드 라인을 이용하는 센서 및 그리드 라인으로부터 감지면을 확장하기 위한 전도성 프로브 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR930001365A (ko) * | 1991-03-27 | 1993-01-16 | 빈센트 죠셉 로너 | 복합 플립 칩 반도체 소자와 그 제조 및 번-인(burning-in) 방법 |
US5315241A (en) * | 1991-09-18 | 1994-05-24 | Sgs-Thomson Microelectronics, Inc. | Method for testing integrated circuits |
US5500605A (en) * | 1993-09-17 | 1996-03-19 | At&T Corp. | Electrical test apparatus and method |
JPH07333300A (ja) * | 1994-06-14 | 1995-12-22 | Mitsubishi Electric Corp | 電気特性評価用基板 |
JP3260253B2 (ja) * | 1995-01-06 | 2002-02-25 | 松下電器産業株式会社 | 半導体装置の検査方法と検査用導電性接着剤 |
US5716222A (en) * | 1995-11-03 | 1998-02-10 | Advanced Interconnections Corporation | Ball grid array including modified hard ball contacts and apparatus for attaching hard ball contacts to a ball grid array |
US5731709A (en) * | 1996-01-26 | 1998-03-24 | Motorola, Inc. | Method for testing a ball grid array semiconductor device and a device for such testing |
-
1996
- 1996-11-12 US US08/745,531 patent/US6020749A/en not_active Expired - Lifetime
-
1997
- 1997-09-10 EP EP97115728A patent/EP0841573B1/de not_active Expired - Lifetime
- 1997-09-10 DE DE69731713T patent/DE69731713T2/de not_active Expired - Fee Related
- 1997-11-12 JP JP9310318A patent/JPH10153644A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
JPH10153644A (ja) | 1998-06-09 |
EP0841573B1 (de) | 2004-11-24 |
EP0841573A2 (de) | 1998-05-13 |
US6020749A (en) | 2000-02-01 |
DE69731713T2 (de) | 2005-10-06 |
EP0841573A3 (de) | 1998-07-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8327 | Change in the person/name/address of the patent owner |
Owner name: HEWLETT-PACKARD DEVELOPMENT CO., L.P., HOUSTON, TE |
|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |