DE3475740D1 - Ic device and a system for testing the same - Google Patents

Ic device and a system for testing the same

Info

Publication number
DE3475740D1
DE3475740D1 DE8484112834T DE3475740T DE3475740D1 DE 3475740 D1 DE3475740 D1 DE 3475740D1 DE 8484112834 T DE8484112834 T DE 8484112834T DE 3475740 T DE3475740 T DE 3475740T DE 3475740 D1 DE3475740 D1 DE 3475740D1
Authority
DE
Germany
Prior art keywords
testing
same
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8484112834T
Other languages
German (de)
Inventor
Soichi C O Patent Divis Suzuki
Mitsuo C O Patent Divis Aihara
Mitsuo C O Patent Divisi Fujii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Application granted granted Critical
Publication of DE3475740D1 publication Critical patent/DE3475740D1/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/006—Identification
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544—Marks applied to semiconductor devices or parts
    • H01L2223/54433—Marks applied to semiconductor devices or parts containing identification or tracking information
    • H01L2223/5444—Marks applied to semiconductor devices or parts containing identification or tracking information for electrical read out
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00—Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/544—Marks applied to semiconductor devices or parts
    • H01L2223/54473—Marks applied to semiconductor devices or parts for use after dicing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Quality & Reliability (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE8484112834T 1983-10-31 1984-10-24 Ic device and a system for testing the same Expired DE3475740D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58202658A JPH0658925B2 (en) 1983-10-31 1983-10-31 Integrated circuit test equipment

Publications (1)

Publication Number Publication Date
DE3475740D1 true DE3475740D1 (en) 1989-01-26

Family

ID=16460992

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484112834T Expired DE3475740D1 (en) 1983-10-31 1984-10-24 Ic device and a system for testing the same

Country Status (4)

Country Link
US (1) US4691287A (en)
EP (1) EP0144680B1 (en)
JP (1) JPH0658925B2 (en)
DE (1) DE3475740D1 (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5043910A (en) * 1985-04-19 1991-08-27 Graphtec Kabushikikaisha Printed circuit board function testing system
JPH0715928B2 (en) * 1985-05-09 1995-02-22 日本電気株式会社 Semiconductor device inspection method
US4841456A (en) * 1986-09-09 1989-06-20 The Boeing Company Test system and method using artificial intelligence control
US4853628A (en) * 1987-09-10 1989-08-01 Gazelle Microcircuits, Inc. Apparatus for measuring circuit parameters of a packaged semiconductor device
JPH01100943A (en) * 1987-10-13 1989-04-19 Nec Corp Semiconductor integrated circuit device of masterslice layout
EP0404986B1 (en) * 1989-06-29 1992-12-30 Siemens Aktiengesellschaft Identification circuit for integrated semiconductor circuits
ATE84637T1 (en) * 1989-06-29 1993-01-15 Siemens Ag CIRCUIT ARRANGEMENT FOR IDENTIFICATION OF INTEGRATED SEMICONDUCTOR CIRCUITS.
JPH04343242A (en) * 1991-05-21 1992-11-30 Nec Yamagata Ltd Lsi test system
JP2888081B2 (en) * 1993-03-04 1999-05-10 日本電気株式会社 Semiconductor storage device
US5360747A (en) * 1993-06-10 1994-11-01 Xilinx, Inc. Method of reducing dice testing with on-chip identification
JP2786152B2 (en) * 1996-04-25 1998-08-13 日本電気アイシーマイコンシステム株式会社 Semiconductor integrated circuit device
KR101003116B1 (en) 2008-08-08 2010-12-21 주식회사 하이닉스반도체 Semiconductor Memory Device for Controlling Pads and Multi-Chip Package Mounting The Same
KR101143443B1 (en) * 2010-03-29 2012-05-23 에스케이하이닉스 주식회사 Semiconductor apparatus and its repairing method
JP2014085180A (en) * 2012-10-22 2014-05-12 Murata Mfg Co Ltd Inspection device, inspection method, and inspection program of electronic component

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2631483A1 (en) * 1976-07-13 1978-01-19 Siemens Ag Automatic test equipment for plug:in modules - has encoded test module determining its own test routine and permitting program to be varied accordingly
US4070565A (en) * 1976-08-18 1978-01-24 Zehntel, Inc. Programmable tester method and apparatus
US4517661A (en) * 1981-07-16 1985-05-14 International Business Machines Corporation Programmable chip tester having plural pin unit buffers which each store sufficient test data for independent operations by each pin unit
US4493045A (en) * 1981-10-19 1985-01-08 Fairchild Camera & Instrument Corp. Test vector indexing method and apparatus
US4488354A (en) * 1981-11-16 1984-12-18 Ncr Corporation Method for simulating and testing an integrated circuit chip
JPS5925258A (en) * 1982-07-30 1984-02-09 Fujitsu Ltd Semiconductor integrated circuit device and its manufacture

Also Published As

Publication number Publication date
US4691287A (en) 1987-09-01
JPS6095930A (en) 1985-05-29
JPH0658925B2 (en) 1994-08-03
EP0144680A1 (en) 1985-06-19
EP0144680B1 (en) 1988-12-21

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee