DE69719153T2 - Temperaturfühlerelement und Temperaturfühler damit - Google Patents
Temperaturfühlerelement und Temperaturfühler damitInfo
- Publication number
- DE69719153T2 DE69719153T2 DE69719153T DE69719153T DE69719153T2 DE 69719153 T2 DE69719153 T2 DE 69719153T2 DE 69719153 T DE69719153 T DE 69719153T DE 69719153 T DE69719153 T DE 69719153T DE 69719153 T2 DE69719153 T2 DE 69719153T2
- Authority
- DE
- Germany
- Prior art keywords
- temperature sensor
- sensor element
- temperature
- sensor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
- G01K7/223—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor characterised by the shape of the resistive element
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/30—Apparatus or processes specially adapted for manufacturing resistors adapted for baking
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/04—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material having negative temperature coefficient
- H01C7/041—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material having negative temperature coefficient formed as one or more layers or coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C7/00—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material
- H01C7/04—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material having negative temperature coefficient
- H01C7/042—Non-adjustable resistors formed as one or more layers or coatings; Non-adjustable resistors made from powdered conducting material or powdered semi-conducting material with or without insulating material having negative temperature coefficient mainly consisting of inorganic non-metallic substances
- H01C7/043—Oxides or oxidic compounds
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Nonlinear Science (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Thermistors And Varistors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP31235396 | 1996-11-22 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69719153D1 DE69719153D1 (de) | 2003-03-27 |
DE69719153T2 true DE69719153T2 (de) | 2003-11-06 |
Family
ID=18028232
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69719153T Expired - Lifetime DE69719153T2 (de) | 1996-11-22 | 1997-11-18 | Temperaturfühlerelement und Temperaturfühler damit |
Country Status (4)
Country | Link |
---|---|
US (1) | US6081182A (de) |
EP (1) | EP0844466B1 (de) |
KR (1) | KR100248069B1 (de) |
DE (1) | DE69719153T2 (de) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3666289B2 (ja) * | 1998-05-20 | 2005-06-29 | 株式会社デンソー | サーミスタ式温度センサ |
EP0973020B1 (de) * | 1998-07-16 | 2009-06-03 | EPIQ Sensor-Nite N.V. | Elektrischer Temperatur-Sensor mit Mehrfachschicht |
JP3485027B2 (ja) * | 1998-07-24 | 2004-01-13 | 株式会社デンソー | 温度センサおよびその製造方法 |
DE19936924C1 (de) * | 1999-08-05 | 2001-06-13 | Georg Bernitz | Vorrichtung zur Hochtemperaturerfassung und Verfahren zur Herstellung derselben |
US7323142B2 (en) * | 2001-09-07 | 2008-01-29 | Medtronic Minimed, Inc. | Sensor substrate and method of fabricating same |
US20030062984A1 (en) * | 2001-09-28 | 2003-04-03 | Ishizuka Electronics Corporation | Thin film thermistor and method of adjusting reisistance of the same |
KR100481929B1 (ko) * | 2002-06-18 | 2005-04-11 | 쌍신전자통신주식회사 | 써미스터 박막을 이용한 온도센서 및 그 제조방법 |
US20040061232A1 (en) * | 2002-09-27 | 2004-04-01 | Medtronic Minimed, Inc. | Multilayer substrate |
US8003513B2 (en) * | 2002-09-27 | 2011-08-23 | Medtronic Minimed, Inc. | Multilayer circuit devices and manufacturing methods using electroplated sacrificial structures |
US7782171B2 (en) * | 2003-11-13 | 2010-08-24 | Harco Laboratories, Inc. | Extended temperature range heater |
US7026908B2 (en) * | 2003-11-13 | 2006-04-11 | Harco Laboratories, Inc. | Extended temperature range thermal variable-resistance device |
US7915994B2 (en) * | 2003-11-13 | 2011-03-29 | Harco Laboratories, Inc. | Thermal variable resistance device with protective sheath |
DE102004010713B4 (de) * | 2004-03-04 | 2006-02-02 | Epcos Ag | Flexibler Sensor mit Thermistor |
KR101380179B1 (ko) * | 2011-09-30 | 2014-03-31 | 가부시키가이샤 뉴플레어 테크놀로지 | 성막 장치 및 성막 방법 |
US8649820B2 (en) | 2011-11-07 | 2014-02-11 | Blackberry Limited | Universal integrated circuit card apparatus and related methods |
USD703208S1 (en) | 2012-04-13 | 2014-04-22 | Blackberry Limited | UICC apparatus |
US8936199B2 (en) | 2012-04-13 | 2015-01-20 | Blackberry Limited | UICC apparatus and related methods |
USD701864S1 (en) | 2012-04-23 | 2014-04-01 | Blackberry Limited | UICC apparatus |
US9103731B2 (en) * | 2012-08-20 | 2015-08-11 | Unison Industries, Llc | High temperature resistive temperature detector for exhaust gas temperature measurement |
DE102014110560A1 (de) * | 2014-07-25 | 2016-01-28 | Epcos Ag | Sensorelement, Sensoranordnung und Verfahren zur Herstellung eines Sensorelements und einer Sensoranordnung |
FR3034256B1 (fr) | 2015-03-24 | 2017-04-14 | Commissariat Energie Atomique | Dispositif piezoelectrique |
FR3034248B1 (fr) * | 2015-03-27 | 2017-04-14 | Commissariat Energie Atomique | Dispositif a resistance thermosensible |
US11226240B2 (en) * | 2017-04-26 | 2022-01-18 | Kyocera Corporation | Temperature sensor and temperature measuring device |
WO2019168655A1 (en) | 2018-02-28 | 2019-09-06 | Applied Materials, Inc. | Method for measuring a temperature |
CN114365240A (zh) * | 2019-09-04 | 2022-04-15 | 世美特株式会社 | 电阻器、其制造方法以及包括电阻器的装置 |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2720573A (en) * | 1951-06-27 | 1955-10-11 | Dick O R Lundqvist | Thermistor disks |
US2959755A (en) * | 1958-03-25 | 1960-11-08 | Victory Engineeing Corp | Thermistor high speed high pressure assembly |
US3412359A (en) * | 1966-12-08 | 1968-11-19 | Gen Motors Corp | Thermoprobe assembly |
US3547835A (en) * | 1969-06-09 | 1970-12-15 | Du Pont | Processes of producing and applying silver compositions,and products therefrom |
US3645785A (en) * | 1969-11-12 | 1972-02-29 | Texas Instruments Inc | Ohmic contact system |
US4200970A (en) * | 1977-04-14 | 1980-05-06 | Milton Schonberger | Method of adjusting resistance of a thermistor |
JPS54149856A (en) * | 1978-05-17 | 1979-11-24 | Matsushita Electric Ind Co Ltd | Method of producing heat impacttproof selffexothermic positive temperature coefficient thermistor |
US4349958A (en) * | 1979-06-01 | 1982-09-21 | Gambro Ab | Device for temperature measurement and a method for the manufacture of such a device |
JPS5814045A (ja) * | 1981-07-17 | 1983-01-26 | Matsushita Electric Ind Co Ltd | 複数ガス濃度計測装置 |
JPS6015123A (ja) * | 1983-07-07 | 1985-01-25 | Fujikura Ltd | 熱収縮性シ−トの製造方法 |
US4535316A (en) * | 1984-03-26 | 1985-08-13 | Allied Corporation | Heated titania oxygen sensor |
NL8800857A (nl) * | 1988-04-05 | 1989-11-01 | Philips Nv | Inrichting en werkwijze voor het vervaardigen van een inrichting. |
US5372427A (en) * | 1991-12-19 | 1994-12-13 | Texas Instruments Incorporated | Temperature sensor |
US5411600A (en) * | 1992-06-03 | 1995-05-02 | Eastman Kodak Company | Ultrathin film thermocouples and method of manufacture |
JP3312752B2 (ja) * | 1992-08-11 | 2002-08-12 | 石塚電子株式会社 | 薄膜サーミスタ |
JP2985561B2 (ja) * | 1993-03-26 | 1999-12-06 | 松下電器産業株式会社 | 温度センサ |
US5497139A (en) * | 1994-09-23 | 1996-03-05 | Matsushita Electric Industrial Co., Ltd. | Temperature sensor and its manufacturing method |
JP3494747B2 (ja) * | 1995-03-31 | 2004-02-09 | 石塚電子株式会社 | 薄膜温度センサ及びその製造方法 |
KR100227490B1 (ko) * | 1995-05-11 | 1999-11-01 | 모리시타 요이찌 | 온도센서 소자와 그것을 가지는 온도센서 및 온도센서 소자의 제조방법 |
US5743646A (en) * | 1996-07-01 | 1998-04-28 | General Motors Corporation | Temperature sensor with improved thermal barrier and gas seal between the probe and housing |
-
1997
- 1997-11-14 US US08/970,496 patent/US6081182A/en not_active Expired - Lifetime
- 1997-11-18 EP EP97309279A patent/EP0844466B1/de not_active Expired - Lifetime
- 1997-11-18 DE DE69719153T patent/DE69719153T2/de not_active Expired - Lifetime
- 1997-11-22 KR KR1019970062125A patent/KR100248069B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR19980042672A (ko) | 1998-08-17 |
EP0844466B1 (de) | 2003-02-19 |
EP0844466A1 (de) | 1998-05-27 |
DE69719153D1 (de) | 2003-03-27 |
US6081182A (en) | 2000-06-27 |
KR100248069B1 (ko) | 2000-04-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Representative=s name: JUNG, SCHIRDEWAHN, GRUENBERG, SCHNEIDER PATENTANWAELTE |
|
8328 | Change in the person/name/address of the agent |
Representative=s name: ADVOTEC. PATENT- UND RECHTSANWAELTE, 80538 MUENCHE |
|
8327 | Change in the person/name/address of the patent owner |
Owner name: PANASONIC CORP., KADOMA, OSAKA, JP |