DE69712849T2 - Höhenverstellung für Positionierungsvorrichtung - Google Patents
Höhenverstellung für PositionierungsvorrichtungInfo
- Publication number
- DE69712849T2 DE69712849T2 DE69712849T DE69712849T DE69712849T2 DE 69712849 T2 DE69712849 T2 DE 69712849T2 DE 69712849 T DE69712849 T DE 69712849T DE 69712849 T DE69712849 T DE 69712849T DE 69712849 T2 DE69712849 T2 DE 69712849T2
- Authority
- DE
- Germany
- Prior art keywords
- positioning device
- height adjustment
- adjustment
- height
- positioning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06705—Apparatus for holding or moving single probes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
- B23Q1/00—Members which are comprised in the general build-up of a form of machine, particularly relatively large fixed members
- B23Q1/25—Movable or adjustable work or tool supports
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T82/00—Turning
- Y10T82/14—Axial pattern
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Transmission Devices (AREA)
- Details Of Measuring And Other Instruments (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Machine Tool Units (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/728,657 US5757159A (en) | 1996-10-10 | 1996-10-10 | Height stage for positioning apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69712849D1 DE69712849D1 (de) | 2002-07-04 |
DE69712849T2 true DE69712849T2 (de) | 2003-01-02 |
Family
ID=24927762
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69712849T Expired - Fee Related DE69712849T2 (de) | 1996-10-10 | 1997-08-22 | Höhenverstellung für Positionierungsvorrichtung |
Country Status (6)
Country | Link |
---|---|
US (1) | US5757159A (de) |
EP (1) | EP0836098B1 (de) |
JP (1) | JP3299482B2 (de) |
KR (1) | KR100240926B1 (de) |
DE (1) | DE69712849T2 (de) |
TW (1) | TW358882B (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2022254005A1 (de) * | 2021-06-04 | 2022-12-08 | Atg Luther & Maelzer Gmbh | Prüfkopf für einen fingertester und verfahren zum testen von leiterplatten |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6370571B1 (en) | 1997-03-05 | 2002-04-09 | At Home Corporation | System and method for delivering high-performance online multimedia services |
US7529856B2 (en) * | 1997-03-05 | 2009-05-05 | At Home Corporation | Delivering multimedia services |
US5930472A (en) * | 1998-04-29 | 1999-07-27 | Motorola, Inc. | Method and apparatus in a wireless communication system for splitting a browser functionality between a wireless client and an infrastructure portion |
IT249658Y1 (it) * | 2000-01-31 | 2003-05-28 | Balance Systems Spa | Dispositivo di supporto e guida per piccole macchine utensili in particolare per equilibratrici di masse rotanti |
AU2001272733A1 (en) * | 2000-07-19 | 2002-02-05 | Orbotech Ltd. | Apparatus and method for electrical testing of electrical circuits |
CN103419028B (zh) * | 2013-08-26 | 2015-08-19 | 苏州江源精密机械有限公司 | 具有c轴功能的大型立车工作台 |
CN114167157B (zh) * | 2021-10-12 | 2024-01-02 | 国网山东省电力公司栖霞市供电公司 | 一种柔性直流输电换流阀子模块的现场检测装置与方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4210038A (en) * | 1977-07-05 | 1980-07-01 | Continuance Curve Contact Lenses, Inc. | Lathe having a guided movable cutter |
US4723086A (en) * | 1986-10-07 | 1988-02-02 | Micronix Corporation | Coarse and fine motion positioning mechanism |
JP3087305B2 (ja) * | 1990-03-05 | 2000-09-11 | 株式会社ニコン | ステージ装置 |
US5543726A (en) * | 1994-01-03 | 1996-08-06 | International Business Machines Corporation | Open frame gantry probing system |
US5467020A (en) * | 1994-03-29 | 1995-11-14 | International Business Machines Corporation | Testing fixture and method for circuit traces on a flexible substrate |
-
1996
- 1996-10-10 US US08/728,657 patent/US5757159A/en not_active Expired - Fee Related
-
1997
- 1997-06-30 KR KR1019970029758A patent/KR100240926B1/ko not_active IP Right Cessation
- 1997-08-22 DE DE69712849T patent/DE69712849T2/de not_active Expired - Fee Related
- 1997-08-22 EP EP97306434A patent/EP0836098B1/de not_active Expired - Lifetime
- 1997-09-24 JP JP25814997A patent/JP3299482B2/ja not_active Expired - Fee Related
- 1997-09-30 TW TW086114244A patent/TW358882B/zh active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2022254005A1 (de) * | 2021-06-04 | 2022-12-08 | Atg Luther & Maelzer Gmbh | Prüfkopf für einen fingertester und verfahren zum testen von leiterplatten |
Also Published As
Publication number | Publication date |
---|---|
DE69712849D1 (de) | 2002-07-04 |
KR100240926B1 (ko) | 2000-01-15 |
JPH10122326A (ja) | 1998-05-15 |
EP0836098A3 (de) | 1999-04-14 |
US5757159A (en) | 1998-05-26 |
TW358882B (en) | 1999-05-21 |
EP0836098A2 (de) | 1998-04-15 |
JP3299482B2 (ja) | 2002-07-08 |
KR19980032202A (ko) | 1998-07-25 |
EP0836098B1 (de) | 2002-05-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |