TW358882B - Height stage for positioning apparatus - Google Patents

Height stage for positioning apparatus

Info

Publication number
TW358882B
TW358882B TW086114244A TW86114244A TW358882B TW 358882 B TW358882 B TW 358882B TW 086114244 A TW086114244 A TW 086114244A TW 86114244 A TW86114244 A TW 86114244A TW 358882 B TW358882 B TW 358882B
Authority
TW
Taiwan
Prior art keywords
screw
positioning apparatus
height table
height stage
height
Prior art date
Application number
TW086114244A
Other languages
English (en)
Inventor
James Edward Boyette Jr
Robert Edward Brown
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=24927762&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=TW358882(B) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Ibm filed Critical Ibm
Application granted granted Critical
Publication of TW358882B publication Critical patent/TW358882B/zh

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q1/00Members which are comprised in the general build-up of a form of machine, particularly relatively large fixed members
    • B23Q1/25Movable or adjustable work or tool supports
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06705Apparatus for holding or moving single probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2886Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T82/00Turning
    • Y10T82/14Axial pattern

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Transmission Devices (AREA)
  • Details Of Measuring And Other Instruments (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Machine Tool Units (AREA)
TW086114244A 1996-10-10 1997-09-30 Height stage for positioning apparatus TW358882B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/728,657 US5757159A (en) 1996-10-10 1996-10-10 Height stage for positioning apparatus

Publications (1)

Publication Number Publication Date
TW358882B true TW358882B (en) 1999-05-21

Family

ID=24927762

Family Applications (1)

Application Number Title Priority Date Filing Date
TW086114244A TW358882B (en) 1996-10-10 1997-09-30 Height stage for positioning apparatus

Country Status (6)

Country Link
US (1) US5757159A (zh)
EP (1) EP0836098B1 (zh)
JP (1) JP3299482B2 (zh)
KR (1) KR100240926B1 (zh)
DE (1) DE69712849T2 (zh)
TW (1) TW358882B (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7529856B2 (en) * 1997-03-05 2009-05-05 At Home Corporation Delivering multimedia services
US6370571B1 (en) 1997-03-05 2002-04-09 At Home Corporation System and method for delivering high-performance online multimedia services
US5930472A (en) * 1998-04-29 1999-07-27 Motorola, Inc. Method and apparatus in a wireless communication system for splitting a browser functionality between a wireless client and an infrastructure portion
IT249658Y1 (it) * 2000-01-31 2003-05-28 Balance Systems Spa Dispositivo di supporto e guida per piccole macchine utensili in particolare per equilibratrici di masse rotanti
JP2004505251A (ja) 2000-07-19 2004-02-19 オルボテック リミテッド 電気回路の電気的試験のための装置および方法
CN103419028B (zh) * 2013-08-26 2015-08-19 苏州江源精密机械有限公司 具有c轴功能的大型立车工作台
DE102021114443B4 (de) * 2021-06-04 2023-06-15 Xcerra Corp. Prüfkopf für einen Fingertester sowie Fingertester mit mehreren solcher Prüfköpfe und Verfahren zum Testen von Leiterplatten
CN114167157B (zh) * 2021-10-12 2024-01-02 国网山东省电力公司栖霞市供电公司 一种柔性直流输电换流阀子模块的现场检测装置与方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4210038A (en) * 1977-07-05 1980-07-01 Continuance Curve Contact Lenses, Inc. Lathe having a guided movable cutter
US4723086A (en) * 1986-10-07 1988-02-02 Micronix Corporation Coarse and fine motion positioning mechanism
JP3087305B2 (ja) * 1990-03-05 2000-09-11 株式会社ニコン ステージ装置
US5543726A (en) * 1994-01-03 1996-08-06 International Business Machines Corporation Open frame gantry probing system
US5467020A (en) * 1994-03-29 1995-11-14 International Business Machines Corporation Testing fixture and method for circuit traces on a flexible substrate

Also Published As

Publication number Publication date
KR19980032202A (ko) 1998-07-25
US5757159A (en) 1998-05-26
EP0836098A3 (en) 1999-04-14
DE69712849D1 (de) 2002-07-04
KR100240926B1 (ko) 2000-01-15
EP0836098B1 (en) 2002-05-29
EP0836098A2 (en) 1998-04-15
DE69712849T2 (de) 2003-01-02
JP3299482B2 (ja) 2002-07-08
JPH10122326A (ja) 1998-05-15

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