DE69633183D1 - Fotodetektor mit einem mosfet bestehend aus einem schwebenden gate - Google Patents

Fotodetektor mit einem mosfet bestehend aus einem schwebenden gate

Info

Publication number
DE69633183D1
DE69633183D1 DE69633183T DE69633183T DE69633183D1 DE 69633183 D1 DE69633183 D1 DE 69633183D1 DE 69633183 T DE69633183 T DE 69633183T DE 69633183 T DE69633183 T DE 69633183T DE 69633183 D1 DE69633183 D1 DE 69633183D1
Authority
DE
Germany
Prior art keywords
floating gate
pct
photodetector
photoelectrons
date
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69633183T
Other languages
English (en)
Other versions
DE69633183T2 (de
Inventor
Timo Oikari
Jukka Kahilainen
Jukka Haaslahti
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mirion Technologies Rados Oy
Original Assignee
Rados Technology Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rados Technology Oy filed Critical Rados Technology Oy
Publication of DE69633183D1 publication Critical patent/DE69633183D1/de
Application granted granted Critical
Publication of DE69633183T2 publication Critical patent/DE69633183T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
    • H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
    • H01L31/101—Devices sensitive to infrared, visible or ultraviolet radiation
    • H01L31/112—Devices sensitive to infrared, visible or ultraviolet radiation characterised by field-effect operation, e.g. junction field-effect phototransistor
    • H01L31/113—Devices sensitive to infrared, visible or ultraviolet radiation characterised by field-effect operation, e.g. junction field-effect phototransistor being of the conductor-insulator-semiconductor type, e.g. metal-insulator-semiconductor field-effect transistor
    • H01L31/1136—Devices sensitive to infrared, visible or ultraviolet radiation characterised by field-effect operation, e.g. junction field-effect phototransistor being of the conductor-insulator-semiconductor type, e.g. metal-insulator-semiconductor field-effect transistor the device being a metal-insulator-semiconductor field-effect transistor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Light Receiving Elements (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Glass Compositions (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE69633183T 1995-06-30 1996-06-28 Fotodetektor mit einem mosfet bestehend aus einem schwebenden gate Expired - Lifetime DE69633183T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FI953240 1995-06-30
FI953240A FI953240A0 (fi) 1995-06-30 1995-06-30 Ljusdetektor
PCT/FI1996/000380 WO1997002609A1 (en) 1995-06-30 1996-06-28 Photodetector involving a mosfet having a floating gate

Publications (2)

Publication Number Publication Date
DE69633183D1 true DE69633183D1 (de) 2004-09-23
DE69633183T2 DE69633183T2 (de) 2005-08-18

Family

ID=8543704

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69633183T Expired - Lifetime DE69633183T2 (de) 1995-06-30 1996-06-28 Fotodetektor mit einem mosfet bestehend aus einem schwebenden gate

Country Status (11)

Country Link
US (1) US6043508A (de)
EP (1) EP0842545B1 (de)
JP (1) JP3790548B2 (de)
CN (1) CN1112735C (de)
AT (1) ATE274241T1 (de)
AU (1) AU6227196A (de)
CA (1) CA2225226C (de)
DE (1) DE69633183T2 (de)
FI (1) FI953240A0 (de)
RU (1) RU2161348C2 (de)
WO (1) WO1997002609A1 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000088645A (ja) 1998-09-16 2000-03-31 Hamamatsu Photonics Kk 積分型光検出装置
AU2003236112A1 (en) * 2002-04-17 2003-10-27 Hamamatsu Photonics K.K. Photosensor
KR100499956B1 (ko) * 2002-10-24 2005-07-05 전자부품연구원 양자채널이 형성된 모스펫을 이용한 포토디텍터 및 그제조방법
FR2911191B1 (fr) * 2007-01-09 2009-07-10 Microcomposants De Haute Secur Capteur de mesure d'une dose d'uv et procede de mesure d'une dose d'uv mettant en oeuvre ce capteur
CN101303239B (zh) * 2007-05-10 2010-05-26 北方工业大学 一种传感器及其调节方法
JP5116851B2 (ja) * 2008-09-02 2013-01-09 シャープ株式会社 表示装置
CN101807547B (zh) * 2009-02-18 2013-07-10 南京大学 光敏复合介质栅mosfet探测器
US9219177B2 (en) 2010-04-07 2015-12-22 International Business Machines Corporation Photo detector and integrated circuit
KR101774480B1 (ko) * 2011-08-16 2017-09-04 에레즈 할라미 전계 효과 트랜지스터의 비접촉 제어를 위한 방법 및 장치 그리고 두 개의 전자 장치들을 상호연결하는 방법
US8653618B2 (en) * 2011-09-02 2014-02-18 Hoon Kim Unit pixel of color image sensor and photo detector thereof
US9213112B2 (en) 2013-03-15 2015-12-15 Starfire Industries, Llc Neutron radiation sensor
CN104900745B (zh) * 2015-05-26 2017-10-27 北京工业大学 一种基于高电子迁移率晶体管的光谱探测器及其制备方法
CN110767519B (zh) * 2019-10-21 2022-03-04 中国电子科技集团公司第十二研究所 一种场发射电子源结构及其形成方法、电子源、微波管

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0002420A1 (de) * 1977-12-01 1979-06-13 International Business Machines Corporation Lichtgesteuerte Feldeffekttransistor-Halbleitereinrichtung und daraus entstehende Speicheranordnung
DE3413829A1 (de) * 1984-04-10 1985-10-17 Hahn-Meitner-Institut für Kernforschung Berlin GmbH, 1000 Berlin Mos-dosimeter
US5471051A (en) * 1993-06-02 1995-11-28 Hamamatsu Photonics K.K. Photocathode capable of detecting position of incident light in one or two dimensions, phototube, and photodetecting apparatus containing same
FI934784A0 (fi) * 1993-10-28 1993-10-28 Rados Technology Oy Straolningsdetektor
US5804833A (en) * 1996-10-10 1998-09-08 Advanced Scientific Concepts, Inc. Advanced semiconductor emitter technology photocathodes

Also Published As

Publication number Publication date
EP0842545B1 (de) 2004-08-18
CA2225226A1 (en) 1997-01-23
ATE274241T1 (de) 2004-09-15
WO1997002609A1 (en) 1997-01-23
CN1189922A (zh) 1998-08-05
JP3790548B2 (ja) 2006-06-28
EP0842545A1 (de) 1998-05-20
CN1112735C (zh) 2003-06-25
US6043508A (en) 2000-03-28
AU6227196A (en) 1997-02-05
JPH11509366A (ja) 1999-08-17
FI953240A0 (fi) 1995-06-30
RU2161348C2 (ru) 2000-12-27
DE69633183T2 (de) 2005-08-18
CA2225226C (en) 2003-01-21

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Legal Events

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