IT8323477A0 - Proiettore di segnali ottici per ispezionare superfici o simili. - Google Patents

Proiettore di segnali ottici per ispezionare superfici o simili.

Info

Publication number
IT8323477A0
IT8323477A0 IT8323477A IT2347783A IT8323477A0 IT 8323477 A0 IT8323477 A0 IT 8323477A0 IT 8323477 A IT8323477 A IT 8323477A IT 2347783 A IT2347783 A IT 2347783A IT 8323477 A0 IT8323477 A0 IT 8323477A0
Authority
IT
Italy
Prior art keywords
similar
optical signal
signal projector
inspect surfaces
inspect
Prior art date
Application number
IT8323477A
Other languages
English (en)
Inventor
Truman Frank Kellie
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Publication of IT8323477A0 publication Critical patent/IT8323477A0/it

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/14—Beam splitting or combining systems operating by reflection only
    • G02B27/143—Beam splitting or combining systems operating by reflection only using macroscopically faceted or segmented reflective surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/14—Beam splitting or combining systems operating by reflection only
    • G02B27/145—Beam splitting or combining systems operating by reflection only having sequential partially reflecting surfaces
IT8323477A 1982-11-01 1983-10-27 Proiettore di segnali ottici per ispezionare superfici o simili. IT8323477A0 (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/438,141 US4520388A (en) 1982-11-01 1982-11-01 Optical signal projector

Publications (1)

Publication Number Publication Date
IT8323477A0 true IT8323477A0 (it) 1983-10-27

Family

ID=23739409

Family Applications (1)

Application Number Title Priority Date Filing Date
IT8323477A IT8323477A0 (it) 1982-11-01 1983-10-27 Proiettore di segnali ottici per ispezionare superfici o simili.

Country Status (6)

Country Link
US (1) US4520388A (it)
JP (1) JPS59107321A (it)
DE (1) DE3338611A1 (it)
FR (1) FR2535472A1 (it)
GB (1) GB2129962A (it)
IT (1) IT8323477A0 (it)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4692690A (en) * 1983-12-26 1987-09-08 Hitachi, Ltd. Pattern detecting apparatus
JPS60181710A (ja) * 1984-02-29 1985-09-17 Fujikura Ltd 光信号の合・分波器
GB2163865B (en) * 1984-08-30 1988-06-02 Rank Cintel Ltd Apparatus for individually processing optical images of different wavelengths
JPS62239005A (ja) * 1986-04-11 1987-10-19 Fuji Photo Film Co Ltd 表面形状検査装置
DE3617421A1 (de) * 1986-04-30 1987-11-05 Leitz Ernst Gmbh Optisches bauelement und vorrichtung zu dessen verwendung
FR2601148B1 (fr) * 1986-07-02 1988-10-21 Sagem Dispositif d'alignement mutuel polychromatique et appareil de visee en comportant application
FR2647557B2 (fr) * 1986-07-02 1991-09-13 Sagem Dispositif d'alignement mutuel polychromatique et appareil de visee en comportant application
US4743770A (en) * 1986-09-22 1988-05-10 Mitutoyo Mfg. Co., Ltd. Profile-measuring light probe using a change in reflection factor in the proximity of a critical angle of light
DE3641862A1 (de) * 1986-12-08 1988-06-09 Bosch Gmbh Robert Vorrichtung zur pruefung rotationssymmetrischer werkstuecke
DE3641863A1 (de) * 1986-12-08 1988-06-09 Bosch Gmbh Robert Oberflaechenpruefvorrichtung
DE3732934A1 (de) * 1987-09-30 1989-04-20 Heidelberger Druckmasch Ag Sensoreinrichtung
NL8901380A (nl) * 1989-02-14 1990-09-03 Heuft Qualiplus Bv Simultane dubbele inspectie.
DE69009592T2 (de) * 1989-05-03 1994-12-22 Sagem Vorrichtung zur gegenseitigen Ausrichtung von verschieden farbigen Strahlbündeln und Visiereinrichtung, die diese Vorrichtung enthält.
US4933541A (en) * 1989-06-29 1990-06-12 Canadian Patents And Development Ltd. - Societe Canadienne Des Brevets Et D'exploitation Limitee Method and apparatus for active vision image enhancement with wavelength matching
DE4015893C2 (de) * 1990-05-17 1994-06-16 Phototherm Dr Petry Gmbh Verfahren und Vorrichtung zur Untersuchung der inneren Struktur eines absorptionsfähigen Prüflings
US5159172A (en) * 1990-08-07 1992-10-27 International Business Machines Corporation Optical projection system
DE4413758C2 (de) * 1993-04-21 1998-09-17 Fraunhofer Ges Forschung Vorrichtung und Verfahren zur Prüfung der Gestalt einer Oberfläche eines zu vermessenden Objektes
DE4343058A1 (de) * 1993-12-19 1995-06-22 Robert Prof Dr Ing Massen Multisensorielle Kamera für die Qualitätssicherung
US6301380B1 (en) * 1997-09-12 2001-10-09 Philip Morris Incorporated Fold inspection device for transparent overwrap film
EP1100254B1 (en) * 1999-11-12 2008-07-16 Noritsu Koki Co., Ltd. Apparatus for reading images from photographic film
US20060262295A1 (en) * 2005-05-20 2006-11-23 Vistec Semiconductor Systems Gmbh Apparatus and method for inspecting a wafer
US20070090310A1 (en) * 2005-10-24 2007-04-26 General Electric Company Methods and apparatus for inspecting an object
US8295693B2 (en) * 2010-07-02 2012-10-23 Intuitive Surgical Operations, Inc. Dual optical path prism and camera in a minimally invasive surgical system
US8960963B1 (en) * 2011-09-26 2015-02-24 The Boeing Company Dual wavelength focusable and steerable searchlight

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB264122A (en) * 1926-01-09 1927-09-30 Max Wenzel Holfert Processes for the production of coloured patterns or designs
GB365134A (en) * 1930-08-14 1932-01-14 Roy Jobbins Pomeroy Method of making composite photographs
GB555167A (en) * 1942-05-13 1943-08-06 John Logie Baird Colour television apparatus
DE1240298C2 (de) * 1960-09-01 1973-01-11 Eltro G M B H & Co Ges Fuer St Anordnung zur Erzeugung zweier Bilder in verschiedenen Wellenlaengenbereichen von einem Gegenstand
US3619065A (en) * 1967-07-29 1971-11-09 Kenneth Leslie Agnew Verification of three-dimensional shapes by means of contour lines
JPS5418145B1 (it) * 1971-06-08 1979-07-05
US3814521A (en) * 1972-09-12 1974-06-04 Hoffmann La Roche Object recognition
GB1401476A (en) * 1972-09-19 1975-07-16 Rank Organisation Ltd Optical beam splitting systems
JPS49114933A (it) * 1973-03-02 1974-11-01
US4175862A (en) * 1975-08-27 1979-11-27 Solid Photography Inc. Arrangement for sensing the geometric characteristics of an object
FR2454635A1 (fr) * 1979-04-18 1980-11-14 Commissariat Energie Atomique Procede et dispositif de reglage de l'impact sur une cible d'un faisceau de lumiere monochromatique emis par une source laser
DE3021448A1 (de) * 1980-06-06 1981-12-24 Siemens AG, 1000 Berlin und 8000 München Verfahren und anordnung zur erfassung raeumlicher abweichungen von einer glatten ebene an oberflaechen von gegenstaenden
US4349277A (en) * 1980-06-11 1982-09-14 General Electric Company Non-contact measurement of surface profile
US4427880A (en) * 1981-06-29 1984-01-24 Westinghouse Electric Corp. Non-contact visual proximity sensing apparatus

Also Published As

Publication number Publication date
FR2535472A1 (fr) 1984-05-04
US4520388A (en) 1985-05-28
GB8328399D0 (en) 1983-11-23
GB2129962A (en) 1984-05-23
DE3338611A1 (de) 1984-07-05
JPS59107321A (ja) 1984-06-21

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