DE69632023D1 - Hochspannungsdetektorschaltung und integriertem Schaltung damit - Google Patents

Hochspannungsdetektorschaltung und integriertem Schaltung damit

Info

Publication number
DE69632023D1
DE69632023D1 DE69632023T DE69632023T DE69632023D1 DE 69632023 D1 DE69632023 D1 DE 69632023D1 DE 69632023 T DE69632023 T DE 69632023T DE 69632023 T DE69632023 T DE 69632023T DE 69632023 D1 DE69632023 D1 DE 69632023D1
Authority
DE
Germany
Prior art keywords
high voltage
circuit
voltage detector
integrated circuit
detector circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69632023T
Other languages
English (en)
Inventor
Paolo Rolandi
Massimo Montanaro
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SRL
Original Assignee
STMicroelectronics SRL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SRL filed Critical STMicroelectronics SRL
Application granted granted Critical
Publication of DE69632023D1 publication Critical patent/DE69632023D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/30—Modifications for providing a predetermined threshold before switching
    • H03K17/302—Modifications for providing a predetermined threshold before switching in field-effect transistor switches
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16504—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed
    • G01R19/16519—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed using FET's

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Logic Circuits (AREA)
DE69632023T 1996-01-31 1996-01-31 Hochspannungsdetektorschaltung und integriertem Schaltung damit Expired - Lifetime DE69632023D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP96830043A EP0788231B1 (de) 1996-01-31 1996-01-31 Hochspannungsdetektorschaltung und integriertem Schaltung damit

Publications (1)

Publication Number Publication Date
DE69632023D1 true DE69632023D1 (de) 2004-05-06

Family

ID=8225801

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69632023T Expired - Lifetime DE69632023D1 (de) 1996-01-31 1996-01-31 Hochspannungsdetektorschaltung und integriertem Schaltung damit

Country Status (3)

Country Link
US (1) US5796275A (de)
EP (1) EP0788231B1 (de)
DE (1) DE69632023D1 (de)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2801678B1 (fr) * 1999-11-30 2002-02-01 St Microelectronics Sa Dispositif de detection d'une haute tension
JP2015152570A (ja) * 2014-02-19 2015-08-24 富士電機株式会社 電圧検出回路

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1513930A (en) * 1974-12-20 1978-06-14 Seiko Instr & Electronics Battery voltage detecting device
JPS60124124A (ja) * 1983-12-08 1985-07-03 Nec Corp 入力回路
US5083045A (en) * 1987-02-25 1992-01-21 Samsung Electronics Co., Ltd. High voltage follower and sensing circuit
JPH0777079B2 (ja) * 1987-07-31 1995-08-16 株式会社東芝 不揮発性半導体記憶装置
US5208488A (en) * 1989-03-03 1993-05-04 Kabushiki Kaisha Toshiba Potential detecting circuit
US5118968A (en) * 1990-09-12 1992-06-02 Micron Technology, Inc. Special mode activation circuit for selectively activating a special mode circuit of a semiconductor integrated circuit device
US5278458A (en) * 1991-12-13 1994-01-11 Texas Instruments Incorporated Threshold/voltage detection circuit
KR950004855B1 (ko) * 1992-10-30 1995-05-15 현대전자산업 주식회사 반도체 메모리 소자의 어드레스 전이 검출 회로
JPH0712902A (ja) * 1993-06-17 1995-01-17 Fujitsu Ltd 半導体集積回路

Also Published As

Publication number Publication date
EP0788231B1 (de) 2004-03-31
EP0788231A1 (de) 1997-08-06
US5796275A (en) 1998-08-18

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Legal Events

Date Code Title Description
8332 No legal effect for de