DE69616692T2 - Testeinrichtung zur Bestimmung der Orientierung von Komponenten auf Leiterplatten - Google Patents

Testeinrichtung zur Bestimmung der Orientierung von Komponenten auf Leiterplatten

Info

Publication number
DE69616692T2
DE69616692T2 DE69616692T DE69616692T DE69616692T2 DE 69616692 T2 DE69616692 T2 DE 69616692T2 DE 69616692 T DE69616692 T DE 69616692T DE 69616692 T DE69616692 T DE 69616692T DE 69616692 T2 DE69616692 T2 DE 69616692T2
Authority
DE
Germany
Prior art keywords
orientation
determining
components
printed circuit
circuit boards
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69616692T
Other languages
English (en)
Other versions
DE69616692D1 (de
Inventor
John Doyle
Jeffrey Collette
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Genrad Inc
Original Assignee
Genrad Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Genrad Inc filed Critical Genrad Inc
Application granted granted Critical
Publication of DE69616692D1 publication Critical patent/DE69616692D1/de
Publication of DE69616692T2 publication Critical patent/DE69616692T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/312—Contactless testing by capacitive methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2813—Checking the presence, location, orientation or value, e.g. resistance, of components or conductors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Supply And Installment Of Electrical Components (AREA)
DE69616692T 1995-08-21 1996-08-21 Testeinrichtung zur Bestimmung der Orientierung von Komponenten auf Leiterplatten Expired - Lifetime DE69616692T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/517,573 US5811980A (en) 1995-08-21 1995-08-21 Test system for determining the orientation of components on a circuit board

Publications (2)

Publication Number Publication Date
DE69616692D1 DE69616692D1 (de) 2001-12-13
DE69616692T2 true DE69616692T2 (de) 2002-05-02

Family

ID=24060358

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69616692T Expired - Lifetime DE69616692T2 (de) 1995-08-21 1996-08-21 Testeinrichtung zur Bestimmung der Orientierung von Komponenten auf Leiterplatten

Country Status (4)

Country Link
US (1) US5811980A (de)
EP (1) EP0759559B1 (de)
JP (1) JP3759247B2 (de)
DE (1) DE69616692T2 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5844412A (en) * 1996-12-19 1998-12-01 Teradyne, Inc. Board test apparatus and method for fast capacitance measurement
US6104198A (en) * 1997-05-20 2000-08-15 Zen Licensing Group Llp Testing the integrity of an electrical connection to a device using an onboard controllable signal source
WO2001013698A1 (de) * 1999-08-12 2001-02-22 Siemens Aktiengesellschaft Verfahren zum erkennen der lage oder der oberflächenstruktur eines gegenstands und anwendung des verfahrens sowie eine maschine zur verarbeitung von gegenständen
US6525553B1 (en) 2000-09-11 2003-02-25 St Assembly Test Services Ltd. Ground pin concept for singulated ball grid array
KR100609918B1 (ko) * 2004-12-28 2006-08-08 삼성전자주식회사 전자부품이 장착된 기판의 검사유닛
SG126774A1 (en) * 2005-04-06 2006-11-29 Agilent Technologies Inc Method for determining a set of guard points and asystem for use thereof
US8179143B2 (en) * 2008-10-15 2012-05-15 Test Research, Inc. Apparatus for testing printed circuit and method therefor
FI124554B (en) * 2012-05-28 2014-10-15 Tellabs Oy Equipment and plug-in unit for the equipment
WO2015087440A1 (ja) * 2013-12-13 2015-06-18 富士機械製造株式会社 電子回路部品取出指示データ作成装置および電子回路部品装着機
JP6568733B2 (ja) * 2015-07-15 2019-08-28 株式会社Ｆｕｊｉ 検査装置
CN113573567B (zh) * 2021-09-26 2021-12-17 深圳市凯泰精密设备有限公司 一种smt贴片机用防错供料装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4350040A (en) * 1980-06-26 1982-09-21 The United States Of America As Represented By The United States Department Of Energy Capacitance-level/density monitor for fluidized-bed combustor
US4583042A (en) * 1983-04-18 1986-04-15 The Boeing Company Capacitive circuit board testing system and method using a conductive pliant elastomeric reference plane
US4779043A (en) * 1987-08-26 1988-10-18 Hewlett-Packard Company Reversed IC test device and method
GB2214640B (en) * 1988-01-20 1992-05-20 Univ Manchester Tomographic flow imaging system
US5150047A (en) * 1989-07-21 1992-09-22 Nippon Steel Corporation Member for use in assembly of integrated circuit elements and a method of testing assembled integrated circuit elements
US5081421A (en) * 1990-05-01 1992-01-14 At&T Bell Laboratories In situ monitoring technique and apparatus for chemical/mechanical planarization endpoint detection
US5124660A (en) * 1990-12-20 1992-06-23 Hewlett-Packard Company Identification of pin-open faults by capacitive coupling through the integrated circuit package
US5254953A (en) * 1990-12-20 1993-10-19 Hewlett-Packard Company Identification of pin-open faults by capacitive coupling through the integrated circuit package
US5159526A (en) * 1991-12-20 1992-10-27 Compaq Computer Corporation Method and apparatus for determining orientation of polarized capacitors
US5469064A (en) * 1992-01-14 1995-11-21 Hewlett-Packard Company Electrical assembly testing using robotic positioning of probes
US5363051A (en) * 1992-11-23 1994-11-08 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Steering capaciflector sensor
US5420500A (en) * 1992-11-25 1995-05-30 Hewlett-Packard Company Pacitive electrode system for detecting open solder joints in printed circuit assemblies
US5539676A (en) * 1993-04-15 1996-07-23 Tokyo Electron Limited Method of identifying probe position and probing method in prober
US5391993A (en) * 1994-01-27 1995-02-21 Genrad, Inc. Capacitive open-circuit test employing threshold determination

Also Published As

Publication number Publication date
JPH09121100A (ja) 1997-05-06
EP0759559A2 (de) 1997-02-26
US5811980A (en) 1998-09-22
JP3759247B2 (ja) 2006-03-22
DE69616692D1 (de) 2001-12-13
EP0759559A3 (de) 1997-10-01
EP0759559B1 (de) 2001-11-07

Similar Documents

Publication Publication Date Title
DE69611020D1 (de) Prepreg für Leiterplatten
DE68909853D1 (de) Verfahren und Film zur Herstellung von gedruckten Schaltungsplatten.
DE69033784T2 (de) Gedruckte Schaltungsplatte
DE69118301D1 (de) Vorrichtung zur Förderung von Leiterplatten
DE59812171D1 (de) Anordnung zur Kontaktierung von Leiterplatten
DE69226937T2 (de) Prüfverfahren für Leiterplatten
DE69400238D1 (de) Befestigungsvorrichtung für Leiterplatten
DE69631236D1 (de) Gedruckte Schaltungsplatten
DE69616692D1 (de) Testeinrichtung zur Bestimmung der Orientierung von Komponenten auf Leiterplatten
DE69406581D1 (de) Gedruckte Schaltungsplatten
DE69214581D1 (de) Leiterplatte für gedruckte Schaltungen
KR880700276A (ko) 인쇄회로기판의 수리 및 검사 시스템(System for Testing and Repairing Printed Circuit Boards)
DE69707624T2 (de) Apparat zur Inspektion von Leiterplatten
DE59202581D1 (de) Messwandler für elektronische Anordnungen zur schnellen Erkennung von Kurzschlüssen.
KR960009581U (ko) 검사용 인쇄회로 기판
DE69407503D1 (de) Flexible Schaltung zur Verbindung von Leiterplatten
KR950005228U (ko) 인쇄회로기판부품 검사장치
KR970003713U (ko) 테스트포인트 지정용 홀을 갖춘 인쇄회로기판
KR940027876U (ko) 인쇄회로 기판의 착탈 고정 장치
KR960012958U (ko) 인쇄회로기판 고정구조
KR920009935U (ko) 인쇄회로기판의 패시브 콤포넌트 측정회로
KR980006119U (ko) 인쇄회로기판 부품 삽입 유/무 검사장치
KR950005206U (ko) 전자제품의 인쇄회로기판 고정장치
KR950007230U (ko) 가변 저항기용 인쇄 회로판
KR950022289U (ko) 인쇄 회로 기판의 착탈 고정 장치

Legal Events

Date Code Title Description
8364 No opposition during term of opposition