DE69607661T2 - Laserunterstützte Partikelanalyse - Google Patents

Laserunterstützte Partikelanalyse

Info

Publication number
DE69607661T2
DE69607661T2 DE69607661T DE69607661T DE69607661T2 DE 69607661 T2 DE69607661 T2 DE 69607661T2 DE 69607661 T DE69607661 T DE 69607661T DE 69607661 T DE69607661 T DE 69607661T DE 69607661 T2 DE69607661 T2 DE 69607661T2
Authority
DE
Germany
Prior art keywords
laser
particle analysis
assisted particle
assisted
analysis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69607661T
Other languages
English (en)
Other versions
DE69607661D1 (de
Inventor
Jr William D Reents
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
AT&T Corp
Original Assignee
AT&T Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by AT&T Corp filed Critical AT&T Corp
Application granted granted Critical
Publication of DE69607661D1 publication Critical patent/DE69607661D1/de
Publication of DE69607661T2 publication Critical patent/DE69607661T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Optics & Photonics (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Dispersion Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
DE69607661T 1995-01-17 1996-01-16 Laserunterstützte Partikelanalyse Expired - Fee Related DE69607661T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/373,732 US5631462A (en) 1995-01-17 1995-01-17 Laser-assisted particle analysis

Publications (2)

Publication Number Publication Date
DE69607661D1 DE69607661D1 (de) 2000-05-18
DE69607661T2 true DE69607661T2 (de) 2001-08-02

Family

ID=23473645

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69607661T Expired - Fee Related DE69607661T2 (de) 1995-01-17 1996-01-16 Laserunterstützte Partikelanalyse

Country Status (5)

Country Link
US (1) US5631462A (de)
EP (1) EP0723282B1 (de)
JP (1) JPH08240566A (de)
CA (1) CA2167100C (de)
DE (1) DE69607661T2 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5869831A (en) * 1996-06-27 1999-02-09 Yale University Method and apparatus for separation of ions in a gas for mass spectrometry
US5977541A (en) * 1996-08-29 1999-11-02 Nkk Corporation Laser ionization mass spectroscope and mass spectrometric analysis method
US6259101B1 (en) * 1997-09-23 2001-07-10 University Of Delaware Method and instruments for the on-line detection, sizing or analysis of aerosol particles
US5977540A (en) * 1998-04-16 1999-11-02 Lucent Technologies Inc. Laser-assisted particle analysis
US7119342B2 (en) * 1999-02-09 2006-10-10 Syagen Technology Interfaces for a photoionization mass spectrometer
US7109476B2 (en) 1999-02-09 2006-09-19 Syagen Technology Multiple ion sources involving atmospheric pressure photoionization
US6630664B1 (en) 1999-02-09 2003-10-07 Syagen Technology Atmospheric pressure photoionizer for mass spectrometry
US6211516B1 (en) 1999-02-09 2001-04-03 Syagen Technology Photoionization mass spectrometer
US6326615B1 (en) 1999-08-30 2001-12-04 Syagen Technology Rapid response mass spectrometer system
DE10132735A1 (de) * 2001-07-05 2003-01-23 Gsf Forschungszentrum Umwelt Verfahren und Vorrichtung zum Nachweis der chemischen Zusammensetzung von Aerosolpartikeln
US6737642B2 (en) 2002-03-18 2004-05-18 Syagen Technology High dynamic range analog-to-digital converter
US6784423B2 (en) * 2002-09-20 2004-08-31 Lucent Technologies Inc. Characterization of individual particle atomic composition by aerosol mass spectrometry
WO2008146333A1 (ja) * 2007-05-30 2008-12-04 Shimadzu Corporation 質量分析装置
WO2024097222A1 (en) * 2022-10-31 2024-05-10 University Of Utah Research Foundation Ionization fluorescence sensors for detecting particles

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2942386C2 (de) * 1979-10-19 1984-01-12 Ulrich Dr. 8000 München Boesl Ionenquelle
US4383171A (en) * 1980-11-17 1983-05-10 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Particle analyzing method and apparatus
US4894511A (en) * 1986-08-26 1990-01-16 Physical Sciences, Inc. Source of high flux energetic atoms
JP2769205B2 (ja) * 1989-09-16 1998-06-25 株式会社日立製作所 粒子状物質の分析方法、その装置及びこれを利用した超純水製造管理システム
JP2564404B2 (ja) * 1989-09-20 1996-12-18 株式会社日立製作所 質量分析方法
DE4036115C2 (de) * 1990-11-13 1997-12-11 Max Planck Gesellschaft Verfahren und Einrichtung zur quantitativen nichtresonanten Photoionisation von Neutralteilchen und Verwendung einer solchen Einrichtung
CA2101237C (en) * 1992-09-11 1999-04-13 Stephen Ward Downey Apparatus comprising means for mass spectrometry

Also Published As

Publication number Publication date
EP0723282A1 (de) 1996-07-24
DE69607661D1 (de) 2000-05-18
CA2167100A1 (en) 1996-07-18
CA2167100C (en) 1999-06-22
JPH08240566A (ja) 1996-09-17
EP0723282B1 (de) 2000-04-12
US5631462A (en) 1997-05-20

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Legal Events

Date Code Title Description
8332 No legal effect for de
8370 Indication of lapse of patent is to be deleted
8339 Ceased/non-payment of the annual fee