DE69617715D1 - Materialanalyse - Google Patents
MaterialanalyseInfo
- Publication number
- DE69617715D1 DE69617715D1 DE69617715T DE69617715T DE69617715D1 DE 69617715 D1 DE69617715 D1 DE 69617715D1 DE 69617715 T DE69617715 T DE 69617715T DE 69617715 T DE69617715 T DE 69617715T DE 69617715 D1 DE69617715 D1 DE 69617715D1
- Authority
- DE
- Germany
- Prior art keywords
- material analysis
- analysis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB9519687.9A GB9519687D0 (en) | 1995-09-27 | 1995-09-27 | Method of determining earth formation characteristics |
PCT/GB1996/002408 WO1997012234A1 (en) | 1995-09-27 | 1996-09-26 | Material analysis |
Publications (1)
Publication Number | Publication Date |
---|---|
DE69617715D1 true DE69617715D1 (de) | 2002-01-17 |
Family
ID=10781347
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69617715T Expired - Lifetime DE69617715D1 (de) | 1995-09-27 | 1996-09-26 | Materialanalyse |
Country Status (6)
Country | Link |
---|---|
US (1) | US6072853A (de) |
EP (1) | EP0852719B1 (de) |
AU (1) | AU7138196A (de) |
DE (1) | DE69617715D1 (de) |
GB (1) | GB9519687D0 (de) |
WO (1) | WO1997012234A1 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1163507A2 (de) | 1999-03-16 | 2001-12-19 | The Secretary Of State For Defence | Verfahren und vorrichtung zur bestimmung von materialzusammensetzungen |
AUPQ109499A0 (en) * | 1999-06-21 | 1999-07-15 | Adelaide Brighton Management Limited | Sample presentation for x-ray diffraction |
US7193628B1 (en) * | 2000-07-13 | 2007-03-20 | C4Cast.Com, Inc. | Significance-based display |
UA59495C2 (uk) * | 2000-08-07 | 2003-09-15 | Мурадін Абубєкіровіч Кумахов | Рентгенівський вимірювально-випробувальний комплекс |
GB0201773D0 (en) * | 2002-01-25 | 2002-03-13 | Isis Innovation | X-ray diffraction method |
CN100485373C (zh) * | 2004-07-14 | 2009-05-06 | 西南技术工程研究所 | 短波长x射线衍射测量装置和方法 |
US8106360B2 (en) * | 2009-06-22 | 2012-01-31 | Uchicago Argonne, Llc | Microscopic infrared analysis by X-ray or electron radiation |
WO2012178082A1 (en) * | 2011-06-24 | 2012-12-27 | The Trustees Of Columbia University In The City Of New York | Improved methods, devices and systems to process x-ray diffraction data |
US9091628B2 (en) | 2012-12-21 | 2015-07-28 | L-3 Communications Security And Detection Systems, Inc. | 3D mapping with two orthogonal imaging views |
JP6500752B2 (ja) * | 2015-11-09 | 2019-04-17 | 住友金属鉱山株式会社 | 全自動鉱物分析装置と微小部x線回折装置とを用いた、鉱石中に存在する鉱物粒子の同定方法 |
CN108282951B (zh) * | 2017-12-28 | 2020-07-10 | 华中科技大学 | 一种束流引出装置、参数获取方法及回旋加速器 |
WO2020077398A1 (en) * | 2018-10-19 | 2020-04-23 | Commonwealth Scientific And Industrial Research Organisation | An energy dispersive x-ray diffraction analyser having an improved reflection geometry |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2312507A1 (de) * | 1973-03-13 | 1974-09-26 | Max Planck Gesellschaft | Geraet fuer roentgenbeugungsmessungen mittels weisser roentgenstrahlen |
US5007072A (en) * | 1988-08-03 | 1991-04-09 | Ion Track Instruments | X-ray diffraction inspection system |
JPH05113416A (ja) * | 1990-07-23 | 1993-05-07 | Stiftung Deutsche Elektronen Synchrotron Desy | 単結晶材料の異質相の析出を検査する方法 |
-
1995
- 1995-09-27 GB GBGB9519687.9A patent/GB9519687D0/en active Pending
-
1996
- 1996-09-26 WO PCT/GB1996/002408 patent/WO1997012234A1/en active IP Right Grant
- 1996-09-26 AU AU71381/96A patent/AU7138196A/en not_active Abandoned
- 1996-09-26 DE DE69617715T patent/DE69617715D1/de not_active Expired - Lifetime
- 1996-09-26 EP EP96932695A patent/EP0852719B1/de not_active Expired - Lifetime
-
1998
- 1998-09-26 US US09/043,493 patent/US6072853A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0852719B1 (de) | 2001-12-05 |
EP0852719A1 (de) | 1998-07-15 |
WO1997012234A1 (en) | 1997-04-03 |
US6072853A (en) | 2000-06-06 |
AU7138196A (en) | 1997-04-17 |
GB9519687D0 (en) | 1995-11-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8332 | No legal effect for de |