DE69535864D1 - Vorrichtungen, Systeme und Methoden zur Aufnahme von Bildern - Google Patents

Vorrichtungen, Systeme und Methoden zur Aufnahme von Bildern

Info

Publication number
DE69535864D1
DE69535864D1 DE69535864T DE69535864T DE69535864D1 DE 69535864 D1 DE69535864 D1 DE 69535864D1 DE 69535864 T DE69535864 T DE 69535864T DE 69535864 T DE69535864 T DE 69535864T DE 69535864 D1 DE69535864 D1 DE 69535864D1
Authority
DE
Germany
Prior art keywords
pixel
values
charge
imaging
detected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69535864T
Other languages
English (en)
Inventor
Risto Olavi Orava
Jouni Ilari Pyyhtia
Tom Gunnar Schulman
Miltiadis Evangelos Sarakinos
Konstantinos Evangelos Spartiotis
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
IPL Intellectual Property Licensing Ltd
Original Assignee
IPL Intellectual Property Licensing Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB9410973A external-priority patent/GB2289979A/en
Priority claimed from GB9502419A external-priority patent/GB2289981A/en
Priority claimed from GB9508294A external-priority patent/GB2289983B/en
Application filed by IPL Intellectual Property Licensing Ltd filed Critical IPL Intellectual Property Licensing Ltd
Application granted granted Critical
Publication of DE69535864D1 publication Critical patent/DE69535864D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/243—Modular detectors, e.g. arrays formed from self contained units
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2964—Scanners
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/60—Control of cameras or camera modules
    • H04N23/698—Control of cameras or camera modules for achieving an enlarged field of view, e.g. panoramic image capture
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/30—Circuitry of solid-state image sensors [SSIS]; Control thereof for transforming X-rays into image signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/48—Increasing resolution by shifting the sensor relative to the scene
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/74—Circuitry for scanning or addressing the pixel array
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/779—Circuitry for scanning or addressing the pixel array
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/7795—Circuitry for generating timing or clock signals

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Measurement Of Radiation (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Peptides Or Proteins (AREA)
  • Two-Way Televisions, Distribution Of Moving Picture Or The Like (AREA)
  • Electrotherapy Devices (AREA)
DE69535864T 1994-06-01 1995-05-29 Vorrichtungen, Systeme und Methoden zur Aufnahme von Bildern Expired - Lifetime DE69535864D1 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
GB9410973A GB2289979A (en) 1994-06-01 1994-06-01 Imaging devices systems and methods
GB9421289A GB2289980A (en) 1994-06-01 1994-10-21 Imaging devices systems and methods
GB9502419A GB2289981A (en) 1994-06-01 1995-02-08 Imaging devices systems and methods
GB9508294A GB2289983B (en) 1994-06-01 1995-04-24 Imaging devices,systems and methods

Publications (1)

Publication Number Publication Date
DE69535864D1 true DE69535864D1 (de) 2008-11-27

Family

ID=39832232

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69535864T Expired - Lifetime DE69535864D1 (de) 1994-06-01 1995-05-29 Vorrichtungen, Systeme und Methoden zur Aufnahme von Bildern

Country Status (3)

Country Link
EP (4) EP0854639B1 (de)
AT (1) ATE411699T1 (de)
DE (1) DE69535864D1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3058545B2 (ja) * 1993-04-02 2000-07-04 富士写真フイルム株式会社 ハロゲン化銀カラー写真感光材料
DE19834597A1 (de) 1998-07-31 2000-02-10 Gerhard Bonnet Vorrichtung und Verfahren zur Farbaufnahme eines Bildes
FI106346B (fi) * 1998-12-14 2001-01-15 Planmed Oy Digitaalinen kuvantamismenetelmä ja laitteita digitaalisessa kuvantamisessa
US6538245B1 (en) * 2000-10-26 2003-03-25 Rockwell Science Center, Llc. Amplified CMOS transducer for single photon read-out of photodetectors
NO316478B1 (no) * 2001-01-12 2004-01-26 Biomolex As Fremgangsmåte og apparat for simultan kvantifisering av ulike radionuklideri et stort antall regioner på overflaten av en biologiskmikromatrise eller lignende objekt
US6607886B2 (en) 2001-02-01 2003-08-19 Biomolex As Method and apparatus for simultaneous quantification of different radionuclides in a large number of regions on the surface of a biological microarray or similar test objects
DE10142531A1 (de) * 2001-08-30 2003-03-20 Philips Corp Intellectual Pty Sensoranordnung aus licht- und/oder röntgenstrahlungsempfindlichen Sensoren
SE523589C2 (sv) * 2002-02-15 2004-05-04 Xcounter Ab Apparat och metod för detektering av strålning med användning av skanning
ITUD20020084A1 (it) * 2002-04-12 2003-10-13 Neuricam Spa Dispositivo elettronico selezionatore per sensori elettro-ottici
US7086859B2 (en) 2003-06-10 2006-08-08 Gendex Corporation Compact digital intraoral camera system
ES2209642B1 (es) * 2002-11-04 2005-10-01 Innovaciones Microelectronicas, S.L. Arquitectura de circuito integrado programable de señal mixta para la realizacion de sistemas autonomos de vision de un unico chip y/o preprocesamiento de imagenes en sistemas de nivel superior.
JP4414646B2 (ja) * 2002-11-18 2010-02-10 浜松ホトニクス株式会社 光検出装置
ES2298485T3 (es) * 2003-11-21 2008-05-16 Carestream Health, Inc. Aparato de radiologia dental.
US20060011853A1 (en) * 2004-07-06 2006-01-19 Konstantinos Spartiotis High energy, real time capable, direct radiation conversion X-ray imaging system for Cd-Te and Cd-Zn-Te based cameras
EP1795918B1 (de) 2004-07-06 2013-02-27 Oy Ajat Ltd. Echtzeitfähiges Hochleistungs-Röntgenbildgebungssystem mit direkter Strahlungsumwandlung für Kameras auf Cd-Te- und Cd-Zn-Te-Basis
FR2916117B1 (fr) * 2007-05-10 2011-03-18 Centre Nat Rech Scient Dispositif d'imagerie par rayons x a source poly-chromatique
CN103942840A (zh) * 2014-05-15 2014-07-23 四川材料与工艺研究所 一种利用γ相机拍摄二维图像重构放射性物质三维分布的方法
US10825848B2 (en) 2015-09-11 2020-11-03 Teledyne Digital Imaging, Inc Image sensor and a method to manufacture thereof
JP7025223B2 (ja) * 2018-01-18 2022-02-24 キヤノン株式会社 撮像装置及びその制御方法、プログラム、記憶媒体

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4245158A (en) * 1979-03-26 1981-01-13 American Science And Engineering, Inc. Soft x-ray spectrometric imaging system
US4445117A (en) * 1981-12-28 1984-04-24 Hughes Aircraft Company Transistorized focal plane having floating gate output nodes
US5043582A (en) * 1985-12-11 1991-08-27 General Imagining Corporation X-ray imaging system and solid state detector therefor
JPS6333075A (ja) * 1986-07-26 1988-02-12 Olympus Optical Co Ltd 固体撮像装置
IL83213A (en) * 1987-07-16 1991-08-16 Technion Res & Dev Foundation Intelligent scan image sensor
GB2222249B (en) * 1988-08-24 1992-07-08 Rosemount Ltd Optical sensor
FR2638286B1 (fr) * 1988-10-25 1990-12-07 Thomson Csf Dispositif photosensible du type a amplification du signal au niveau des points photosensibles
JPH0748826B2 (ja) * 1988-12-01 1995-05-24 三菱電機株式会社 固体撮像装置
US5099128A (en) * 1989-03-17 1992-03-24 Roger Stettner High resolution position sensitive detector
US5262649A (en) * 1989-09-06 1993-11-16 The Regents Of The University Of Michigan Thin-film, flat panel, pixelated detector array for real-time digital imaging and dosimetry of ionizing radiation
FR2652655A1 (fr) * 1989-10-04 1991-04-05 Commissariat Energie Atomique Dispositif matriciel de grandes dimensions pour la prise ou la restitution d'images.
US5262871A (en) * 1989-11-13 1993-11-16 Rutgers, The State University Multiple resolution image sensor
US5117114A (en) * 1989-12-11 1992-05-26 The Regents Of The University Of California High resolution amorphous silicon radiation detectors
JP2753541B2 (ja) * 1990-02-19 1998-05-20 株式会社ニコン 静止画撮像装置
US5083016A (en) * 1990-03-27 1992-01-21 Hughes Aircraft Company 3-transistor source follower-per-detector unit cell for 2-dimensional focal plane arrays
US5153420A (en) * 1990-11-28 1992-10-06 Xerox Corporation Timing independent pixel-scale light sensing apparatus
US5105087A (en) * 1990-11-28 1992-04-14 Eastman Kodak Company Large solid state sensor assembly formed from smaller sensors
US5134488A (en) * 1990-12-28 1992-07-28 David Sarnoff Research Center, Inc. X-Y addressable imager with variable integration
US5264945A (en) * 1991-10-16 1993-11-23 Eastman Kodak Company Contact array scanners with circulating memory
US5198673A (en) * 1992-01-23 1993-03-30 General Electric Company Radiation image detector with optical gain selenium photosensors
US5245191A (en) * 1992-04-14 1993-09-14 The Board Of Regents Of The University Of Arizona Semiconductor sensor for gamma-ray tomographic imaging system
CA2095366C (en) * 1992-05-21 1999-09-14 Timothy C. Collins Hybridized semiconductor pixel detector arrays for use in digital radiography

Also Published As

Publication number Publication date
EP0853427A3 (de) 1999-02-10
EP0854644A2 (de) 1998-07-22
EP0854644A3 (de) 1999-02-10
EP0854643A2 (de) 1998-07-22
EP0854643A3 (de) 1999-02-10
EP0853427A2 (de) 1998-07-15
EP0854639B1 (de) 2005-01-26
EP0854639A3 (de) 1999-02-10
EP0854639A2 (de) 1998-07-22
EP0853427B1 (de) 2008-10-15
ATE411699T1 (de) 2008-10-15

Similar Documents

Publication Publication Date Title
DE69505375D1 (de) Vorrichtung, system und methoden zur aufnahme von bildern
DE69535864D1 (de) Vorrichtungen, Systeme und Methoden zur Aufnahme von Bildern
US10972689B2 (en) Solid-state image sensor, electronic apparatus, and control method of solid-state image sensor
US10887539B2 (en) Imaging device
US4617593A (en) Visible and near infrared imaging system
CN1293863A (zh) 有源线性传感器
KR20150131999A (ko) 촬상 장치, 감시 장치, 및 전자 기기
US6563539B1 (en) Charge transfer circuit for use in imaging systems
US4590505A (en) Three dimensional optical receiver having programmable gain sensor stages
US9184192B2 (en) Radiation detector and method having a source follower arrangement formed by a source follower input transistor and a bias current portion via a bias line select transistor
US11758257B2 (en) Random access sensor with individually addressable transistors
US6297492B1 (en) Fast BICMOS active-pixel sensor cell with fast NPN emitter-follower readout
US9883124B2 (en) Solid-state imaging device
US10659704B2 (en) Imaging device
JPS56162886A (en) Solid state image pickup device
EP0170907A2 (de) Monolithische Raster-Differenzschaltung

Legal Events

Date Code Title Description
8364 No opposition during term of opposition