DE69525035T2 - Verfahren zum testen einer speicheradressen-dekodierschaltung - Google Patents

Verfahren zum testen einer speicheradressen-dekodierschaltung

Info

Publication number
DE69525035T2
DE69525035T2 DE69525035T DE69525035T DE69525035T2 DE 69525035 T2 DE69525035 T2 DE 69525035T2 DE 69525035 T DE69525035 T DE 69525035T DE 69525035 T DE69525035 T DE 69525035T DE 69525035 T2 DE69525035 T2 DE 69525035T2
Authority
DE
Germany
Prior art keywords
testing
address decoder
storage address
decoder circuit
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69525035T
Other languages
English (en)
Other versions
DE69525035D1 (de
Inventor
Manoj Sachdev
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Application granted granted Critical
Publication of DE69525035D1 publication Critical patent/DE69525035D1/de
Publication of DE69525035T2 publication Critical patent/DE69525035T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/88—Masking faults in memories by using spares or by reconfiguring with partially good memories
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns 
DE69525035T 1994-11-09 1995-10-06 Verfahren zum testen einer speicheradressen-dekodierschaltung Expired - Fee Related DE69525035T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP94203265 1994-11-09
PCT/IB1995/000845 WO1996015536A1 (en) 1994-11-09 1995-10-06 A method of testing a memory address decoder and a fault-tolerant memory address decoder

Publications (2)

Publication Number Publication Date
DE69525035D1 DE69525035D1 (de) 2002-02-21
DE69525035T2 true DE69525035T2 (de) 2002-09-05

Family

ID=8217364

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69525035T Expired - Fee Related DE69525035T2 (de) 1994-11-09 1995-10-06 Verfahren zum testen einer speicheradressen-dekodierschaltung

Country Status (5)

Country Link
US (1) US5831986A (de)
EP (1) EP0738418B1 (de)
JP (1) JPH09507945A (de)
DE (1) DE69525035T2 (de)
WO (1) WO1996015536A1 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW421842B (en) * 1998-01-15 2001-02-11 Winbond Electronics Corp Operating method capable of decreasing the burn-in time
US6549479B2 (en) 2001-06-29 2003-04-15 Micron Technology, Inc. Memory device and method having reduced-power self-refresh mode
US6738036B2 (en) * 2001-08-03 2004-05-18 Koninklijke Philips Electronics N.V. Decoder based row addressing circuitry with pre-writes
DE602004020887D1 (de) * 2003-05-22 2009-06-10 Nxp Bv Test von ram addressdekodierern auf widerstandsbehaftete leiterunterbrechungen
EP1629505B1 (de) * 2003-05-22 2009-07-15 Nxp B.V. Test von ram adressdekodierern auf widerstandsbehaftete leiterunterbrechungen
US7536610B2 (en) * 2004-03-26 2009-05-19 Koninklijke Philips Electronics N.V. Method for detecting resistive-open defects in semiconductor memories
KR100648281B1 (ko) 2005-01-14 2006-11-23 삼성전자주식회사 보안 리던던시 블록을 구비한 낸드 플래시 메모리 장치
US7557617B1 (en) 2007-01-03 2009-07-07 Altera Corporation Digital decoder with complementary outputs

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL7309642A (nl) * 1973-07-11 1975-01-14 Philips Nv Geintegreerd geheugen.
JPS5693189A (en) * 1979-12-18 1981-07-28 Fujitsu Ltd Field programable element
US5357471A (en) * 1992-03-20 1994-10-18 National Semiconductor Corporation Fault locator architecture and method for memories
JP2567180B2 (ja) * 1992-03-23 1996-12-25 株式会社東芝 半導体メモリ
JPH06203597A (ja) * 1992-09-25 1994-07-22 Nec Corp ダイナミックｒａｍ
JP2965830B2 (ja) * 1993-09-09 1999-10-18 シャープ株式会社 半導体記憶装置

Also Published As

Publication number Publication date
JPH09507945A (ja) 1997-08-12
EP0738418B1 (de) 2002-01-16
US5831986A (en) 1998-11-03
EP0738418A1 (de) 1996-10-23
DE69525035D1 (de) 2002-02-21
WO1996015536A1 (en) 1996-05-23

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee