DE69523537D1 - Analog-Digital-Wandler mit schreibbarem Ergebnisregister - Google Patents

Analog-Digital-Wandler mit schreibbarem Ergebnisregister

Info

Publication number
DE69523537D1
DE69523537D1 DE69523537T DE69523537T DE69523537D1 DE 69523537 D1 DE69523537 D1 DE 69523537D1 DE 69523537 T DE69523537 T DE 69523537T DE 69523537 T DE69523537 T DE 69523537T DE 69523537 D1 DE69523537 D1 DE 69523537D1
Authority
DE
Germany
Prior art keywords
writable
analog
digital converter
result register
register
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69523537T
Other languages
English (en)
Other versions
DE69523537T2 (de
Inventor
Mitsuya Ohie
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Lapis Semiconductor Co Ltd
Original Assignee
Oki Electric Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd filed Critical Oki Electric Industry Co Ltd
Publication of DE69523537D1 publication Critical patent/DE69523537D1/de
Application granted granted Critical
Publication of DE69523537T2 publication Critical patent/DE69523537T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/108—Converters having special provisions for facilitating access for testing purposes
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/3167—Testing of combined analog and digital circuits
DE69523537T 1994-11-25 1995-11-20 Analog-Digital-Wandler mit schreibbarem Ergebnisregister Expired - Lifetime DE69523537T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6291468A JPH08154055A (ja) 1994-11-25 1994-11-25 アナログ／デジタル変換器

Publications (2)

Publication Number Publication Date
DE69523537D1 true DE69523537D1 (de) 2001-12-06
DE69523537T2 DE69523537T2 (de) 2002-06-27

Family

ID=17769266

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69523537T Expired - Lifetime DE69523537T2 (de) 1994-11-25 1995-11-20 Analog-Digital-Wandler mit schreibbarem Ergebnisregister

Country Status (5)

Country Link
US (1) US5815105A (de)
EP (1) EP0714170B1 (de)
JP (1) JPH08154055A (de)
KR (1) KR100457033B1 (de)
DE (1) DE69523537T2 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19643872A1 (de) 1996-10-31 1998-05-07 Alsthom Cge Alcatel Optische Netzabschlußeinheit eines hybriden Glasfaser-Koaxialkabel-Zugangsnetzes
JP4354906B2 (ja) * 2002-05-08 2009-10-28 コンティネンタル・テーベス・アクチエンゲゼルシヤフト・ウント・コンパニー・オッフェネ・ハンデルスゲゼルシヤフト エラーのない信号アナログ・デジタル変換のための電子回路
KR100531382B1 (ko) * 2003-10-25 2005-11-29 엘지전자 주식회사 Ａｄｃ 샘플링 위상 결정 장치 및 방법
DE102005016800A1 (de) * 2005-04-12 2006-10-19 Robert Bosch Gmbh Wandleranordnung und Testverfahren für einen Wandler
DE102006003566B4 (de) * 2006-01-25 2020-10-01 Infineon Technologies Ag Signal-Wandel-Vorrichtung, insbesondere Analog-Digital-Wandel-Vorrichtung, und Verfahren zum Betreiben einer Signal-Wandel-Vorrichtung
US20180198458A1 (en) * 2017-01-06 2018-07-12 Microchip Technology Incorporated Verification, Validation, And Applications Support For Analog-To-Digital Converter Systems

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5422557A (en) * 1977-07-22 1979-02-20 Hitachi Ltd Constant current circuit
US4922492A (en) * 1988-05-13 1990-05-01 National Semiconductor Corp. Architecture and device for testable mixed analog and digital VLSI circuits
DE68926191T2 (de) * 1988-07-13 1996-11-28 Nec Corp Ein-Chip-Datenprozessor mit eingebautem A/D-Wandler
US5047770A (en) * 1990-05-03 1991-09-10 General Electric Company Apparatus for testing data conversion/transfer functions in a vibratory energy imaging system
DE69125674T2 (de) * 1990-09-04 1997-10-23 Motorola Inc Automatische analog digital Convertierung mit auswählbaren Formatresultaten
JP2553753B2 (ja) * 1990-10-17 1996-11-13 三菱電機株式会社 Ａｄ変換装置
JPH04212524A (ja) * 1990-12-06 1992-08-04 Matsushita Electric Ind Co Ltd 半導体集積回路
KR930004772Y1 (ko) * 1991-05-13 1993-07-23 금성일렉트론 주식회사 아날로그/디지탈 변환기의 테스트장치
US5175547A (en) * 1992-01-31 1992-12-29 Motorola, Inc. Method and apparatus for testing an analog to digital converter
US5185607A (en) * 1992-01-31 1993-02-09 Motorola, Inc. Method and apparatus for testing an analog to digital converter
JPH06164391A (ja) * 1992-11-25 1994-06-10 Mitsubishi Electric Corp アナログ／デジタル変換装置

Also Published As

Publication number Publication date
EP0714170A2 (de) 1996-05-29
US5815105A (en) 1998-09-29
KR100457033B1 (ko) 2005-01-27
DE69523537T2 (de) 2002-06-27
JPH08154055A (ja) 1996-06-11
EP0714170A3 (de) 1998-12-02
KR960020008A (ko) 1996-06-17
EP0714170B1 (de) 2001-10-31

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: OKI SEMICONDUCTOR CO.,LTD., TOKYO, JP