DE69510817D1 - Beleuchtungsvorrichtung zur oberflächeninspektion - Google Patents

Beleuchtungsvorrichtung zur oberflächeninspektion

Info

Publication number
DE69510817D1
DE69510817D1 DE69510817T DE69510817T DE69510817D1 DE 69510817 D1 DE69510817 D1 DE 69510817D1 DE 69510817 T DE69510817 T DE 69510817T DE 69510817 T DE69510817 T DE 69510817T DE 69510817 D1 DE69510817 D1 DE 69510817D1
Authority
DE
Germany
Prior art keywords
pct
region
date
light
sec
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69510817T
Other languages
English (en)
Other versions
DE69510817T2 (de
Inventor
Martin Coulthard
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Surface Inspection Ltd
Original Assignee
Surface Inspection Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Surface Inspection Ltd filed Critical Surface Inspection Ltd
Application granted granted Critical
Publication of DE69510817D1 publication Critical patent/DE69510817D1/de
Publication of DE69510817T2 publication Critical patent/DE69510817T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9515—Objects of complex shape, e.g. examined with use of a surface follower device

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Spinning Or Twisting Of Yarns (AREA)
  • Switches Operated By Changes In Physical Conditions (AREA)
DE69510817T 1994-11-17 1995-11-10 Beleuchtungsvorrichtung zur oberflächeninspektion Expired - Fee Related DE69510817T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB9423214A GB2295224A (en) 1994-11-17 1994-11-17 A surface inspection lighting apparatus
PCT/GB1995/002640 WO1996016328A1 (en) 1994-11-17 1995-11-10 Surface inspection lighting apparatus

Publications (2)

Publication Number Publication Date
DE69510817D1 true DE69510817D1 (de) 1999-08-19
DE69510817T2 DE69510817T2 (de) 1999-11-18

Family

ID=10764556

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69510817T Expired - Fee Related DE69510817T2 (de) 1994-11-17 1995-11-10 Beleuchtungsvorrichtung zur oberflächeninspektion

Country Status (9)

Country Link
US (1) US5822054A (de)
EP (1) EP0792452B1 (de)
JP (1) JPH10509238A (de)
AT (1) ATE182213T1 (de)
AU (1) AU3851295A (de)
CA (1) CA2205501A1 (de)
DE (1) DE69510817T2 (de)
GB (1) GB2295224A (de)
WO (1) WO1996016328A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6272018B1 (en) 1999-02-11 2001-08-07 Original Solutions Inc. Method for the verification of the polarity and presence of components on a printed circuit board
US7126123B1 (en) 2003-12-18 2006-10-24 Cessna Aircraft Company Surface contamination detection method and apparatus
JP2006008986A (ja) * 2004-03-31 2006-01-12 Mitsubishi Plastics Ind Ltd 熱可塑性樹脂フィルム及びその製造方法
MX2007012533A (es) * 2005-04-14 2007-12-06 Koninkl Philips Electronics Nv Luminaria y aparato de iluminacion para inspeccion.
US7326929B2 (en) * 2006-02-06 2008-02-05 Northrop Grumman Corporation Method and apparatus for inspection of semiconductor devices
US7705978B2 (en) * 2006-02-06 2010-04-27 Northrop Grumman Corporation Method and apparatus for inspection of multi-junction solar cells
US7471383B2 (en) * 2006-12-19 2008-12-30 Pilkington North America, Inc. Method of automated quantitative analysis of distortion in shaped vehicle glass by reflected optical imaging
JP4612088B2 (ja) * 2008-10-10 2011-01-12 トヨタ自動車株式会社 画像処理方法、塗装検査方法及び装置
DE102009020919A1 (de) 2009-05-12 2010-11-18 Krones Ag Vorrichtung zum Erkennen von Erhebungen und/oder Vertiefungen auf Flaschen, insbesondere in einer Etikettiermaschine
JP5857675B2 (ja) * 2011-11-24 2016-02-10 富士通株式会社 表面欠陥検査装置および表面欠陥検査方法
JP6089600B2 (ja) * 2012-11-02 2017-03-08 岩崎電気株式会社 照射ユニット
DE102013221334A1 (de) * 2013-10-21 2015-04-23 Volkswagen Aktiengesellschaft Verfahren und Messvorrichtung zum Bewerten von Strukturunterschieden einer reflektierenden Oberfläche
US20160178535A1 (en) * 2014-12-17 2016-06-23 Xerox Corporation Inspection Device And Method
DE102015008409A1 (de) * 2015-07-02 2017-01-05 Eisenmann Se Anlage zur optischen Überprüfung von Oberflächenbereichen von Gegenständen
DE102020110722A1 (de) * 2020-04-20 2021-10-21 Dürr Systems Ag Leuchtenelement für einen Prüftunnel, Leuchtenband und Prüftunnel

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4629319A (en) * 1984-02-14 1986-12-16 Diffracto Ltd. Panel surface flaw inspection
GB8718073D0 (en) * 1987-07-30 1987-09-03 King J T Surface inspection lighting scheme
DE4121464A1 (de) * 1990-06-28 1992-01-09 Mazda Motor Vorrichtung zur feststellung von oberflaechendefekten
US5367378A (en) * 1993-06-01 1994-11-22 Industrial Technology Institute Highlighted panel inspection

Also Published As

Publication number Publication date
AU3851295A (en) 1996-06-17
DE69510817T2 (de) 1999-11-18
CA2205501A1 (en) 1996-05-30
WO1996016328A1 (en) 1996-05-30
US5822054A (en) 1998-10-13
ATE182213T1 (de) 1999-07-15
EP0792452A1 (de) 1997-09-03
GB2295224A (en) 1996-05-22
GB9423214D0 (en) 1995-01-04
EP0792452B1 (de) 1999-07-14
JPH10509238A (ja) 1998-09-08

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee