DE69417673T2 - Verschiebungsmesseinrichtung - Google Patents
VerschiebungsmesseinrichtungInfo
- Publication number
- DE69417673T2 DE69417673T2 DE69417673T DE69417673T DE69417673T2 DE 69417673 T2 DE69417673 T2 DE 69417673T2 DE 69417673 T DE69417673 T DE 69417673T DE 69417673 T DE69417673 T DE 69417673T DE 69417673 T2 DE69417673 T2 DE 69417673T2
- Authority
- DE
- Germany
- Prior art keywords
- measuring device
- displacement measuring
- displacement
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000006073 displacement reaction Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25317593A JP3413503B2 (ja) | 1993-10-08 | 1993-10-08 | 変位検出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69417673D1 DE69417673D1 (de) | 1999-05-12 |
DE69417673T2 true DE69417673T2 (de) | 1999-07-29 |
Family
ID=17247586
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69417673T Expired - Lifetime DE69417673T2 (de) | 1993-10-08 | 1994-10-07 | Verschiebungsmesseinrichtung |
Country Status (4)
Country | Link |
---|---|
US (1) | US5521394A (de) |
EP (1) | EP0647835B1 (de) |
JP (1) | JP3413503B2 (de) |
DE (1) | DE69417673T2 (de) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB0411837D0 (en) * | 2004-05-27 | 2004-06-30 | Leuven K U Res & Dev | A measurement configuration based on linear scales able to measure to a target also moving perpendicular to the measurement axis |
JP2009258022A (ja) * | 2008-04-18 | 2009-11-05 | Sony Corp | 変位検出装置 |
CN103411543B (zh) * | 2013-08-07 | 2016-01-20 | 厦门大学 | 丝杆导程精度检测设备及其测头装置 |
CN103940342B (zh) * | 2014-03-28 | 2017-02-22 | 北京工业大学 | 一种对滚式弧面凸轮加工精度检测装置 |
US11577859B1 (en) * | 2019-10-08 | 2023-02-14 | Rockwell Collins, Inc. | Fault resilient airborne network |
US11921344B2 (en) * | 2020-01-20 | 2024-03-05 | Lecc Technology Co., Ltd. | Laser module |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR950005031B1 (ko) * | 1986-02-24 | 1995-05-17 | 소니 가부시끼가이샤 | 초점 검출 장치 |
GB8625054D0 (en) * | 1986-10-20 | 1986-11-26 | Renishaw Plc | Optical measuring probe |
JPS6435730A (en) * | 1987-07-31 | 1989-02-06 | Sony Corp | Focussing error detector |
US5144603A (en) * | 1990-03-07 | 1992-09-01 | Hitachi, Ltd. | Optical head incorporating refractive index distribution changeable lens |
JPH0460933A (ja) * | 1990-06-26 | 1992-02-26 | Matsushita Electric Ind Co Ltd | 光ピックアップヘッド装置 |
DE4219311C2 (de) * | 1991-06-13 | 1996-03-07 | Sony Magnescale Inc | Verschiebungsdetektor |
JP3256984B2 (ja) * | 1991-06-13 | 2002-02-18 | ソニー・プレシジョン・テクノロジー株式会社 | 変位検出装置 |
JP3473057B2 (ja) * | 1993-10-05 | 2003-12-02 | ソニー・プレシジョン・テクノロジー株式会社 | 変位検出装置 |
-
1993
- 1993-10-08 JP JP25317593A patent/JP3413503B2/ja not_active Expired - Fee Related
-
1994
- 1994-10-06 US US08/319,104 patent/US5521394A/en not_active Expired - Lifetime
- 1994-10-07 EP EP94115864A patent/EP0647835B1/de not_active Expired - Lifetime
- 1994-10-07 DE DE69417673T patent/DE69417673T2/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH07110212A (ja) | 1995-04-25 |
US5521394A (en) | 1996-05-28 |
EP0647835A3 (de) | 1996-11-06 |
DE69417673D1 (de) | 1999-05-12 |
JP3413503B2 (ja) | 2003-06-03 |
EP0647835A2 (de) | 1995-04-12 |
EP0647835B1 (de) | 1999-04-07 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: MAGNESCALE CO., LTD., TOKYO, JP |