DE69417423T2 - Sondenmikroskopie - Google Patents

Sondenmikroskopie

Info

Publication number
DE69417423T2
DE69417423T2 DE69417423T DE69417423T DE69417423T2 DE 69417423 T2 DE69417423 T2 DE 69417423T2 DE 69417423 T DE69417423 T DE 69417423T DE 69417423 T DE69417423 T DE 69417423T DE 69417423 T2 DE69417423 T2 DE 69417423T2
Authority
DE
Germany
Prior art keywords
probe microscopy
microscopy
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69417423T
Other languages
English (en)
Other versions
DE69417423D1 (de
Inventor
Aaron Lewis
Klony Lieberman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of DE69417423D1 publication Critical patent/DE69417423D1/de
Application granted granted Critical
Publication of DE69417423T2 publication Critical patent/DE69417423T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/02—Multiple-type SPM, i.e. involving more than one SPM techniques
    • G01Q60/06—SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/10—Shape or taper
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/14—Particular materials
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B9/00—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor
    • G11B9/12—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor
    • G11B9/14—Recording or reproducing using a method not covered by one of the main groups G11B3/00 - G11B7/00; Record carriers therefor using near-field interactions; Record carriers therefor using microscopic probe means, i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information
    • G11B9/1409—Heads

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
DE69417423T 1993-08-08 1994-08-05 Sondenmikroskopie Expired - Fee Related DE69417423T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IL106613A IL106613A0 (en) 1993-08-08 1993-08-08 Device and method for probe microscopy
PCT/US1994/008691 WO1995005000A1 (en) 1993-08-08 1994-08-05 Probe microscopy

Publications (2)

Publication Number Publication Date
DE69417423D1 DE69417423D1 (de) 1999-04-29
DE69417423T2 true DE69417423T2 (de) 1999-11-11

Family

ID=11065128

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69417423T Expired - Fee Related DE69417423T2 (de) 1993-08-08 1994-08-05 Sondenmikroskopie

Country Status (5)

Country Link
EP (1) EP0712533B1 (de)
JP (1) JPH09502018A (de)
DE (1) DE69417423T2 (de)
IL (1) IL106613A0 (de)
WO (1) WO1995005000A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2903211B2 (ja) * 1996-04-09 1999-06-07 セイコーインスツルメンツ株式会社 プローブとプローブ製造方法及び走査型プローブ顕微鏡
IL120181A0 (en) 1997-02-09 1997-07-13 Fish Galina Method of producing high throughput tapered straight and cantilevered glass structures for nanodelivery and nanosensing
DE19713746C2 (de) * 1997-04-03 2001-06-28 Inst Mikrotechnik Mainz Gmbh Sensor für gleichzeitige Rasterkraftmikroskopie und optische Nahfeldmikroskopie
EP1705475B1 (de) * 1997-12-15 2012-08-15 Seiko Instruments Inc. Optische Wellenleitersonde und deren Herstellungsverfahren.
IL127404A0 (en) * 1998-12-06 1999-10-28 Aaron Lewis Lensed optical fibers and unique micropipettes with subwavelength apertures
JP2000329677A (ja) 1999-03-17 2000-11-30 Seiko Instruments Inc 光マイクロカンチレバーとその製造方法および光マイクロカンチレバーホルダ
JP4717235B2 (ja) * 2000-04-19 2011-07-06 セイコーインスツル株式会社 光導波路プローブおよびその製造方法、ならびに走査型近視野顕微鏡
US8602644B2 (en) 2009-05-08 2013-12-10 University Of North Texas Multifunctional micropipette biological sensor
CN106841688B (zh) * 2017-01-19 2019-03-29 南开大学 e指数型非线性纳米金属锥探针

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4917462A (en) * 1988-06-15 1990-04-17 Cornell Research Foundation, Inc. Near field scanning optical microscopy
US5264698A (en) * 1988-07-17 1993-11-23 Raoul Kopelman Nanometer dimension optical device with microimaging and nanoillumination capabilities
US5289004A (en) * 1990-03-27 1994-02-22 Olympus Optical Co., Ltd. Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light
EP0459392B1 (de) * 1990-05-30 1999-08-18 Hitachi, Ltd. Verfahren und Vorrichtung zur Behandlung eines sehr kleinen Bereichs einer Probe
US5105305A (en) * 1991-01-10 1992-04-14 At&T Bell Laboratories Near-field scanning optical microscope using a fluorescent probe
JP3074357B2 (ja) * 1991-10-03 2000-08-07 セイコーインスツルメンツ株式会社 微細表面観察装置
US5254854A (en) * 1991-11-04 1993-10-19 At&T Bell Laboratories Scanning microscope comprising force-sensing means and position-sensitive photodetector
JP2704601B2 (ja) * 1993-04-12 1998-01-26 セイコーインスツルメンツ株式会社 走査型近視野原子間力顕微鏡、及びその顕微鏡に使用されるプローブ、及びそのプローブの製造方法

Also Published As

Publication number Publication date
WO1995005000A1 (en) 1995-02-16
EP0712533B1 (de) 1999-03-24
EP0712533A4 (de) 1996-09-11
JPH09502018A (ja) 1997-02-25
EP0712533A1 (de) 1996-05-22
DE69417423D1 (de) 1999-04-29
IL106613A0 (en) 1993-12-08

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee