DE69416563D1 - Vorrichtung zur Bestimmung von physikalischen Eigenschaften eines Mikrogebiets - Google Patents

Vorrichtung zur Bestimmung von physikalischen Eigenschaften eines Mikrogebiets

Info

Publication number
DE69416563D1
DE69416563D1 DE69416563T DE69416563T DE69416563D1 DE 69416563 D1 DE69416563 D1 DE 69416563D1 DE 69416563 T DE69416563 T DE 69416563T DE 69416563 T DE69416563 T DE 69416563T DE 69416563 D1 DE69416563 D1 DE 69416563D1
Authority
DE
Germany
Prior art keywords
micro
area
physical properties
determining physical
determining
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69416563T
Other languages
English (en)
Other versions
DE69416563T2 (de
Inventor
Shigeyuki Hosoki
Tsuyoshi Hasegawa
Makiko Kohno
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Application granted granted Critical
Publication of DE69416563D1 publication Critical patent/DE69416563D1/de
Publication of DE69416563T2 publication Critical patent/DE69416563T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/30—Scanning potential microscopy
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/02—Multiple-type SPM, i.e. involving more than one SPM techniques
    • G01Q60/04—STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/02—Multiple-type SPM, i.e. involving more than one SPM techniques
    • G01Q60/08—MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
    • G01Q60/14—STP [Scanning Tunnelling Potentiometry]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/44—Arrangements or instruments for measuring magnetic variables involving magnetic resonance using nuclear magnetic resonance [NMR]
    • G01R33/48—NMR imaging systems
    • G01R33/54—Signal processing systems, e.g. using pulse sequences ; Generation or control of pulse sequences; Operator console
    • G01R33/56—Image enhancement or correction, e.g. subtraction or averaging techniques, e.g. improvement of signal-to-noise ratio and resolution
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/70—Nanostructure
    • Y10S977/832—Nanostructure having specified property, e.g. lattice-constant, thermal expansion coefficient
    • Y10S977/838—Magnetic property of nanomaterial
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/863—Atomic force probe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/84—Manufacture, treatment, or detection of nanostructure
    • Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
    • Y10S977/86—Scanning probe structure
    • Y10S977/865—Magnetic force probe
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00—Nanotechnology
    • Y10S977/902—Specified use of nanostructure
    • Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
    • Y10S977/953—Detector using nanostructure
    • Y10S977/96—Of magnetic property

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Signal Processing (AREA)
  • Nanotechnology (AREA)
  • Analytical Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
DE69416563T 1993-10-04 1994-10-03 Vorrichtung zur Bestimmung von physikalischen Eigenschaften eines Mikrogebiets Expired - Fee Related DE69416563T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24823193 1993-10-04

Publications (2)

Publication Number Publication Date
DE69416563D1 true DE69416563D1 (de) 1999-03-25
DE69416563T2 DE69416563T2 (de) 1999-09-23

Family

ID=17175121

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69416563T Expired - Fee Related DE69416563T2 (de) 1993-10-04 1994-10-03 Vorrichtung zur Bestimmung von physikalischen Eigenschaften eines Mikrogebiets

Country Status (4)

Country Link
US (1) US5585722A (de)
EP (1) EP0648999B1 (de)
KR (1) KR950012094A (de)
DE (1) DE69416563T2 (de)

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* Cited by examiner, † Cited by third party
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EP0754289B1 (de) * 1995-02-07 2001-09-26 International Business Machines Corporation Messung der AFM Hebelarmauslenkung mit Hochfrequenzstrahlung und Dotierungsprofilometer
EP0726444B1 (de) * 1995-02-10 2001-10-31 Bruker Analytik Gmbh Magnetisches Resonanzverfahren und Vorrichtung zum Wahrnehmen der Atomarstruktur einer Probe längs deren Oberfläche
DE19504855A1 (de) * 1995-02-15 1996-08-22 Basf Ag Verfahren zur chemisch differenzierenden Abbildung mittels Rasterkraftmikroskopie
JPH09229945A (ja) * 1996-02-23 1997-09-05 Canon Inc マイクロ構造体を支持するエアブリッジ型構造体の製造方法とその雌型基板、並びに、エアブリッジ型構造体とそれを用いたマイクロ構造体およびトンネル電流または微小力検出用のプローブ
US6100687A (en) * 1996-06-11 2000-08-08 California Institute Of Technology Force-detected magnetic resonance independent of field gradients
US7550963B1 (en) * 1996-09-20 2009-06-23 The Regents Of The University Of California Analytical scanning evanescent microwave microscope and control stage
US6166540A (en) * 1997-06-30 2000-12-26 Wollin Ventures, Inc. Method of resistivity well logging utilizing nuclear magnetic resonance
DE59913814D1 (de) * 1998-01-30 2006-10-12 Nawotec Gmbh Vielsondentestkopf und prüfverfahren
US6147507A (en) * 1998-08-10 2000-11-14 Advanced Micro Devices, Inc. System and method of mapping leakage current and a defect profile of a semiconductor dielectric layer
JP2000304790A (ja) * 1999-04-23 2000-11-02 Hitachi Ltd 電磁波発生源探査装置、その方法およびその解析方法
US6683451B1 (en) 1999-09-30 2004-01-27 Wayne State University Magnetic resonance force microscope for the study of biological systems
DE10207725B4 (de) * 2002-02-20 2006-02-16 Bruker Biospin Gmbh Resonatoranordnung für Elektronenspinresonanz (ESR)-Messungen und Verfahren zum Messen von Elektronenspinresonanz (ESR)-Signalen
US6897654B2 (en) * 2002-04-12 2005-05-24 California Institute Of Technology System and method of magnetic resonance imaging
KR20060127918A (ko) * 2004-01-26 2006-12-13 코닌클리즈케 필립스 일렉트로닉스 엔.브이. 온-칩 자기공명 측정 장치, 방법 및 이 장치의 사용 방법
US7109706B2 (en) * 2004-08-31 2006-09-19 Intematix Corporation Integrated EWP-STM spin resonance microscope
US7170288B2 (en) * 2004-12-22 2007-01-30 Fullerton Larry W Parametric nuclear quadrupole resonance spectroscopy system and method
JP2007232596A (ja) * 2006-03-01 2007-09-13 Jeol Ltd 磁気共鳴力顕微鏡
US20100033181A1 (en) * 2008-08-07 2010-02-11 Villanova University Levitating MEMS Resonator for Magnetic Resonance Force Microscopy
US8952699B2 (en) 2011-01-04 2015-02-10 Pnqr Llc Nuclear quadrupole resonance system and method for interfacing with a subject material
DE102011083066B4 (de) * 2011-09-20 2015-05-07 Siemens Aktiengesellschaft Vorrichtung zur Leistungsmessung und Magnetresonanzeinrichtung
US8549661B2 (en) * 2012-01-30 2013-10-01 The United States Of America As Represented By The Secretary Of The Army Apparatus for performing magnetic resonance force microscopy on large area samples
US9625366B2 (en) * 2013-11-11 2017-04-18 3R Valo, société en commandite Microwave resonator sensor and associated methods of sensing
US10585154B1 (en) * 2018-01-29 2020-03-10 Quantum Valley Investment Fund LP Nuclear magnetic resonance diffraction

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4733182A (en) * 1986-03-25 1988-03-22 The United States Of America As Represented By The United States Department Of Energy Josephson junction Q-spoiler
US4851762A (en) * 1988-08-31 1989-07-25 The John Hopkins University Novel technique using magnetic field dependent phase detection for detection of superconductivity
US4941753A (en) * 1989-04-07 1990-07-17 International Business Machines Corp. Absorption microscopy and/or spectroscopy with scanning tunneling microscopy control
EP0722093A1 (de) * 1989-12-01 1996-07-17 Siemens Aktiengesellschaft Verfahren zum Betrieb eines Kernspintomographiegeräts mit einem Resonanzkreis zur Erzeugung von Gradientenfeldern
US5166615A (en) * 1991-02-11 1992-11-24 The Board Of Regents Of The University Of Washington System for detecting nuclear magnetic resonance signals from small samples
US5319977A (en) * 1991-06-20 1994-06-14 The Board Of Trustees Of The Leland Stanford Junior University Near field acoustic ultrasonic microscope system and method
JPH0540100A (ja) * 1991-08-06 1993-02-19 Hitachi Ltd 表面検査装置及び表面検査方法
EP0551814B1 (de) * 1992-01-10 1997-04-02 Hitachi, Ltd. Verfahren und Vorrichtung zum Beobachten einer Fläche
US5266896A (en) * 1992-06-09 1993-11-30 International Business Machines Corporation Mechanical detection and imaging of magnetic resonance by magnetic moment modulation
US5412322A (en) * 1993-06-24 1995-05-02 Wollin Ventures, Inc. Apparatus and method for spatially ordered phase encoding and for determining complex permittivity in magnetic resonance by using superimposed time-varying electric fields
US5410910A (en) * 1993-12-22 1995-05-02 University Of Virginia Patent Foundation Cryogenic atomic force microscope

Also Published As

Publication number Publication date
DE69416563T2 (de) 1999-09-23
US5585722A (en) 1996-12-17
KR950012094A (ko) 1995-05-16
EP0648999A1 (de) 1995-04-19
EP0648999B1 (de) 1999-02-17

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Legal Events

Date Code Title Description
8339 Ceased/non-payment of the annual fee