DE69404870D1 - Bildsensor - Google Patents

Bildsensor

Info

Publication number
DE69404870D1
DE69404870D1 DE69404870T DE69404870T DE69404870D1 DE 69404870 D1 DE69404870 D1 DE 69404870D1 DE 69404870 T DE69404870 T DE 69404870T DE 69404870 T DE69404870 T DE 69404870T DE 69404870 D1 DE69404870 D1 DE 69404870D1
Authority
DE
Germany
Prior art keywords
image sensor
sensor
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69404870T
Other languages
English (en)
Other versions
DE69404870T2 (de
Inventor
Cornelis Van Berkel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Electronics NV filed Critical Philips Electronics NV
Publication of DE69404870D1 publication Critical patent/DE69404870D1/de
Application granted granted Critical
Publication of DE69404870T2 publication Critical patent/DE69404870T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14603—Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/1462—Coatings
    • H01L27/14623—Optical shielding
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14625—Optical elements or arrangements associated with the device
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14601—Structural or functional details thereof
    • H01L27/14625—Optical elements or arrangements associated with the device
    • H01L27/14627—Microlenses
DE69404870T 1993-01-25 1994-01-18 Bildsensor Expired - Fee Related DE69404870T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB939301405A GB9301405D0 (en) 1993-01-25 1993-01-25 An image sensor

Publications (2)

Publication Number Publication Date
DE69404870D1 true DE69404870D1 (de) 1997-09-18
DE69404870T2 DE69404870T2 (de) 1998-03-05

Family

ID=10729266

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69404870T Expired - Fee Related DE69404870T2 (de) 1993-01-25 1994-01-18 Bildsensor

Country Status (5)

Country Link
US (1) US5463216A (de)
EP (1) EP0608932B1 (de)
JP (1) JPH06244391A (de)
DE (1) DE69404870T2 (de)
GB (1) GB9301405D0 (de)

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GB9524483D0 (en) * 1995-11-30 1996-01-31 Philips Electronics Nv Light sensing array device and apparatus incorporating such
DE19545484C2 (de) * 1995-12-06 2002-06-20 Deutsche Telekom Ag Bildaufnahmeeinrichtung
US6795120B2 (en) 1996-05-17 2004-09-21 Sony Corporation Solid-state imaging apparatus and camera using the same
US5751492A (en) * 1996-06-14 1998-05-12 Eastman Kodak Company Diffractive/Refractive lenslet array incorporating a second aspheric surface
US5767523A (en) * 1997-04-09 1998-06-16 Svg Lithography Systems, Inc. Multiple detector alignment system for photolithography
TW465104B (en) * 1997-12-25 2001-11-21 Canon Kk Contact type image sensor and information processing apparatus
JP3649907B2 (ja) * 1998-01-20 2005-05-18 シャープ株式会社 二次元画像検出器およびその製造方法
JP3343071B2 (ja) * 1998-03-03 2002-11-11 富士写真フイルム株式会社 撮像素子の実装方法
EP0953837A1 (de) * 1998-05-01 1999-11-03 F. Hoffmann-La Roche Ag Fluoreszenzlichtmessgerät und dieses verwendende Vorrichtung
JP3469143B2 (ja) 1999-11-02 2003-11-25 シャープ株式会社 アクティブマトリクス基板及びそれを備えた二次元画像検出器
US6821810B1 (en) * 2000-08-07 2004-11-23 Taiwan Semiconductor Manufacturing Company High transmittance overcoat for optimization of long focal length microlens arrays in semiconductor color imagers
US6750437B2 (en) * 2000-08-28 2004-06-15 Canon Kabushiki Kaisha Image pickup apparatus that suitably adjusts a focus
US6714017B2 (en) * 2000-11-30 2004-03-30 Candescent Technologies Corporation Method and system for infrared detection of electrical short defects
US7196728B2 (en) * 2002-03-27 2007-03-27 Ericsson, Inc. Method and apparatus for displaying images in combination with taking images
JP4886162B2 (ja) * 2003-06-18 2012-02-29 キヤノン株式会社 撮像装置付き表示装置
EP1494477A1 (de) * 2003-07-01 2005-01-05 Thomson Licensing S.A. Videotelefon mit einer kombinierten Bildwiedergabe- und -aufnahmeeinrichtung
FR2860644B1 (fr) * 2003-10-06 2006-03-03 St Microelectronics Sa Composant, plaque et boitier semi-conducteur a capteur optique
US7372497B2 (en) * 2004-04-28 2008-05-13 Taiwan Semiconductor Manufacturing Company Effective method to improve sub-micron color filter sensitivity
TWI260093B (en) * 2005-01-25 2006-08-11 Au Optronics Corp Thin film transistor with microlens structure, forming method thereof and TFT display panel comprising thereof
US7576361B2 (en) 2005-08-03 2009-08-18 Aptina Imaging Corporation Backside silicon wafer design reducing image artifacts from infrared radiation
US20070152139A1 (en) * 2005-12-30 2007-07-05 Moores Mark D Techniques to control illumination for image sensors
US20070205354A1 (en) * 2006-03-06 2007-09-06 Micron Technology, Inc. Image sensor light shield
KR100809277B1 (ko) * 2006-07-05 2008-03-03 삼성전기주식회사 어레이 렌즈를 갖는 카메라 모듈
JP5404732B2 (ja) 2011-02-09 2014-02-05 キヤノン株式会社 光電変換素子およびこれを用いた光電変換装置、撮像システム
US8948338B2 (en) * 2011-11-03 2015-02-03 Medtronic Navigation, Inc. Dynamically scanned X-ray detector panel
CN102891155B (zh) * 2012-09-27 2015-08-19 豪威科技(上海)有限公司 用于制作镜头的晶圆级贴合方法
JP6247495B2 (ja) * 2012-11-26 2017-12-13 キヤノン株式会社 半導体装置、及びその製造方法
US9780133B2 (en) * 2015-08-04 2017-10-03 Creative Sensor Inc. Wafer-level lens structure for contact image sensor module
JP6703387B2 (ja) * 2015-10-02 2020-06-03 エルジー ディスプレイ カンパニー リミテッド 薄膜光センサ、２次元アレイセンサ、および指紋センサ付きモバイル用ディスプレイ

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US4078243A (en) * 1975-12-12 1978-03-07 International Business Machines Corporation Phototransistor array having uniform current response and method of manufacture
FR2469805A1 (fr) * 1979-11-09 1981-05-22 Thomson Csf Matrice de detection d'un rayonnement electromagnetique et intensificateur d'images radiologiques comportant une telle matrice
FR2487566A1 (fr) * 1980-07-25 1982-01-29 Thomson Csf Matrice de detection d'un rayonnement electromagnetique et intensificateur d'images radiologiques comportant une telle matrice
US4425501A (en) * 1981-03-30 1984-01-10 Honeywell Inc. Light aperture for a lenslet-photodetector array
JPS6038989A (ja) * 1983-08-12 1985-02-28 Nec Corp 固体撮像装置の製造方法
FR2554999B1 (fr) * 1983-11-15 1986-01-17 Thomson Csf Dispositif photosensible pour l'infrarouge
JPS60191548A (ja) * 1984-03-12 1985-09-30 Hitachi Ltd イメ−ジセンサ
US4727407A (en) * 1984-07-13 1988-02-23 Fuji Xerox Co., Ltd. Image sensor
JPS61292961A (ja) * 1985-06-21 1986-12-23 Fuji Xerox Co Ltd イメ−ジセンサ
FR2593343B1 (fr) * 1986-01-20 1988-03-25 Thomson Csf Matrice d'elements photosensibles et son procede de fabrication, procede de lecture associe, et application de cette matrice a la prise de vue d'images
FR2593987B1 (fr) * 1986-01-24 1989-08-04 Thomson Csf Dispositif photosensible a l'etat solide
EP0293094B1 (de) * 1987-05-26 1993-11-18 Matsushita Electric Industrial Co., Ltd. Strahlungsdetektor
JPH07110055B2 (ja) * 1987-09-02 1995-11-22 シャープ株式会社 二次元密着型イメージセンサ
FR2627924B1 (fr) * 1988-02-26 1990-06-22 Thomson Csf Dispositif photosensible et detecteur d'images comportant un tel dispositif, notamment detecteur d'images a double energie
FR2628562A1 (fr) * 1988-03-11 1989-09-15 Thomson Csf Dispositif d'imagerie a structure matricielle
FR2638042A1 (fr) * 1988-10-14 1990-04-20 Thomson Csf Procede pour reduire la remanence d'un phototransistor, notamment de type nipin
JPH02251902A (ja) * 1989-03-27 1990-10-09 Seiko Epson Corp レンズアレイ及びレンズアレイを用いた液晶表示素子
KR960000223B1 (ko) * 1990-11-16 1996-01-03 가부시키가이샤 도시바 고체촬상장치 및 그 제조방법
US5324930A (en) * 1993-04-08 1994-06-28 Eastman Kodak Company Lens array for photodiode device with an aperture having a lens region and a non-lens region

Also Published As

Publication number Publication date
US5463216A (en) 1995-10-31
EP0608932B1 (de) 1997-08-13
GB9301405D0 (en) 1993-03-17
DE69404870T2 (de) 1998-03-05
EP0608932A3 (en) 1994-09-21
JPH06244391A (ja) 1994-09-02
EP0608932A2 (de) 1994-08-03

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: KONINKLIJKE PHILIPS ELECTRONICS N.V., EINDHOVEN, N

8320 Willingness to grant licences declared (paragraph 23)
8339 Ceased/non-payment of the annual fee