DE69322947D1 - DRAM mit variabler Wortleitungsauswahl - Google Patents

DRAM mit variabler Wortleitungsauswahl

Info

Publication number
DE69322947D1
DE69322947D1 DE69322947T DE69322947T DE69322947D1 DE 69322947 D1 DE69322947 D1 DE 69322947D1 DE 69322947 T DE69322947 T DE 69322947T DE 69322947 T DE69322947 T DE 69322947T DE 69322947 D1 DE69322947 D1 DE 69322947D1
Authority
DE
Germany
Prior art keywords
dram
word line
line selection
variable word
variable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69322947T
Other languages
English (en)
Other versions
DE69322947T2 (de
Inventor
Michael C Parris
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
UMC Japan Co Ltd
United Memories Inc
Original Assignee
Nippon Steel Semiconductor Corp
United Memories Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Semiconductor Corp, United Memories Inc filed Critical Nippon Steel Semiconductor Corp
Publication of DE69322947D1 publication Critical patent/DE69322947D1/de
Application granted granted Critical
Publication of DE69322947T2 publication Critical patent/DE69322947T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/408Address circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406Management or control of the refreshing or charge-regeneration cycles
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2211/00Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C2211/401Indexing scheme relating to cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C2211/406Refreshing of dynamic cells
    • G11C2211/4065Low level details of refresh operations

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
DE69322947T 1993-02-04 1993-11-09 DRAM mit variabler Wortleitungsauswahl Expired - Fee Related DE69322947T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/013,333 US5331601A (en) 1993-02-04 1993-02-04 DRAM variable row select

Publications (2)

Publication Number Publication Date
DE69322947D1 true DE69322947D1 (de) 1999-02-18
DE69322947T2 DE69322947T2 (de) 1999-09-09

Family

ID=21759428

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69322947T Expired - Fee Related DE69322947T2 (de) 1993-02-04 1993-11-09 DRAM mit variabler Wortleitungsauswahl

Country Status (5)

Country Link
US (1) US5331601A (de)
EP (1) EP0609577B1 (de)
JP (1) JPH06318393A (de)
KR (1) KR100263273B1 (de)
DE (1) DE69322947T2 (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5257233A (en) * 1990-10-31 1993-10-26 Micron Technology, Inc. Low power memory module using restricted RAM activation
US5497355A (en) * 1994-06-03 1996-03-05 Intel Corporation Synchronous address latching for memory arrays
US5696917A (en) 1994-06-03 1997-12-09 Intel Corporation Method and apparatus for performing burst read operations in an asynchronous nonvolatile memory
JP2576425B2 (ja) * 1994-10-27 1997-01-29 日本電気株式会社 強誘電体メモリ装置
EP0745998B1 (de) * 1995-05-31 2004-01-02 United Memories, Inc. Schaltung und Verfahren zum Zugriff auf Speicherzellen einer Speicheranordnung
US5623450A (en) * 1995-09-08 1997-04-22 International Business Machines Corporation Conditional recharge for dynamic logic
KR100190373B1 (ko) * 1996-02-08 1999-06-01 김영환 리드 패스를 위한 고속 동기식 메모리 장치
JPH09306168A (ja) * 1996-05-14 1997-11-28 Mitsubishi Electric Corp 半導体記憶装置
IL121044A (en) * 1996-07-15 2000-09-28 Motorola Inc Dynamic memory device
JP4056173B2 (ja) 1999-04-14 2008-03-05 富士通株式会社 半導体記憶装置および該半導体記憶装置のリフレッシュ方法
US6570801B2 (en) * 2000-10-27 2003-05-27 Kabushiki Kaisha Toshiba Semiconductor memory having refresh function
US6738861B2 (en) * 2001-09-20 2004-05-18 Intel Corporation System and method for managing data in memory for reducing power consumption
US6608783B2 (en) 2001-12-27 2003-08-19 Infineon Technologies North America Corp. Twisted bit-line compensation
US6570794B1 (en) 2001-12-27 2003-05-27 Infineon Technologies North America Corp. Twisted bit-line compensation for DRAM having redundancy
US6603694B1 (en) * 2002-02-05 2003-08-05 Infineon Technologies North America Corp. Dynamic memory refresh circuitry
US6618314B1 (en) 2002-03-04 2003-09-09 Cypress Semiconductor Corp. Method and architecture for reducing the power consumption for memory devices in refresh operations
EP1408510A3 (de) * 2002-05-17 2005-05-18 Matsushita Electric Industrial Co., Ltd. Speichersteuerungsapparat, Verfahren und Programm dazu
US6665224B1 (en) 2002-05-22 2003-12-16 Infineon Technologies Ag Partial refresh for synchronous dynamic random access memory (SDRAM) circuits
US6862238B1 (en) 2003-09-25 2005-03-01 Infineon Technologies Ag Memory system with reduced refresh current
US7099221B2 (en) * 2004-05-06 2006-08-29 Micron Technology, Inc. Memory controller method and system compensating for memory cell data losses
US7116602B2 (en) * 2004-07-15 2006-10-03 Micron Technology, Inc. Method and system for controlling refresh to avoid memory cell data losses
US7158434B2 (en) * 2005-04-29 2007-01-02 Infineon Technologies, Ag Self-refresh circuit with optimized power consumption
US7894289B2 (en) * 2006-10-11 2011-02-22 Micron Technology, Inc. Memory system and method using partial ECC to achieve low power refresh and fast access to data
US7900120B2 (en) * 2006-10-18 2011-03-01 Micron Technology, Inc. Memory system and method using ECC with flag bit to identify modified data
CN109817257B (zh) * 2018-12-27 2020-10-13 西安紫光国芯半导体有限公司 一种动态存储器刷新操作下的省电方法和动态存储器

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63152096A (ja) * 1986-12-17 1988-06-24 Hitachi Ltd 半導体記憶装置
JP2617779B2 (ja) * 1988-08-31 1997-06-04 三菱電機株式会社 半導体メモリ装置
EP0484760A3 (en) * 1990-11-08 1992-07-15 Kabushiki Kaisha Toshiba Memory refresh control system upon connection of extension unit
US5148546A (en) * 1991-04-22 1992-09-15 Blodgett Greg A Method and system for minimizing power demands on portable computers and the like by refreshing selected dram cells

Also Published As

Publication number Publication date
JPH06318393A (ja) 1994-11-15
DE69322947T2 (de) 1999-09-09
US5331601A (en) 1994-07-19
KR100263273B1 (ko) 2000-08-01
EP0609577A2 (de) 1994-08-10
EP0609577B1 (de) 1999-01-07
KR940020414A (ko) 1994-09-16
EP0609577A3 (de) 1995-07-19

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee