DE69317250D1 - Verfahren zur uniformen Programmierung eines elektrisch programmierbaren Speichers und Speicher zur Durchführung des Verfahrens - Google Patents

Verfahren zur uniformen Programmierung eines elektrisch programmierbaren Speichers und Speicher zur Durchführung des Verfahrens

Info

Publication number
DE69317250D1
DE69317250D1 DE69317250T DE69317250T DE69317250D1 DE 69317250 D1 DE69317250 D1 DE 69317250D1 DE 69317250 T DE69317250 T DE 69317250T DE 69317250 T DE69317250 T DE 69317250T DE 69317250 D1 DE69317250 D1 DE 69317250D1
Authority
DE
Germany
Prior art keywords
memory
carrying
electrically programmable
uniform programming
programmable memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69317250T
Other languages
English (en)
Other versions
DE69317250T2 (de
Inventor
Olivier Rouy
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
SGS Thomson Microelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SA filed Critical SGS Thomson Microelectronics SA
Application granted granted Critical
Publication of DE69317250D1 publication Critical patent/DE69317250D1/de
Publication of DE69317250T2 publication Critical patent/DE69317250T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/14—Implementation of control logic, e.g. test mode decoders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/14—Implementation of control logic, e.g. test mode decoders
    • G11C29/16—Implementation of control logic, e.g. test mode decoders using microprogrammed units, e.g. state machines
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/36—Data generation devices, e.g. data inverters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
DE69317250T 1992-12-31 1993-12-16 Verfahren zur uniformen Programmierung eines elektrisch programmierbaren Speichers und Speicher zur Durchführung des Verfahrens Expired - Fee Related DE69317250T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9215993A FR2700056B1 (fr) 1992-12-31 1992-12-31 Procédé de programmation en champ uniforme d'une mémoire électriquement programmable et mémoire mettant en Óoeuvre le procédé.

Publications (2)

Publication Number Publication Date
DE69317250D1 true DE69317250D1 (de) 1998-04-09
DE69317250T2 DE69317250T2 (de) 1998-06-25

Family

ID=9437346

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69317250T Expired - Fee Related DE69317250T2 (de) 1992-12-31 1993-12-16 Verfahren zur uniformen Programmierung eines elektrisch programmierbaren Speichers und Speicher zur Durchführung des Verfahrens

Country Status (5)

Country Link
US (1) US5457651A (de)
EP (1) EP0606796B1 (de)
JP (1) JPH06282995A (de)
DE (1) DE69317250T2 (de)
FR (1) FR2700056B1 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7880636B2 (en) 2004-06-30 2011-02-01 Airbus Deutschland Gmbh Information display system for aircraft

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07192481A (ja) * 1993-12-27 1995-07-28 Mitsubishi Electric Corp 半導体記憶装置
US5650734A (en) * 1995-12-11 1997-07-22 Altera Corporation Programming programmable transistor devices using state machines
US6157210A (en) * 1997-10-16 2000-12-05 Altera Corporation Programmable logic device with circuitry for observing programmable logic circuit signals and for preloading programmable logic circuits
US6507881B1 (en) * 1999-06-10 2003-01-14 Mediatek Inc. Method and system for programming a peripheral flash memory via an IDE bus
TW200636471A (en) * 2005-04-01 2006-10-16 Mediatek Inc Method of parallel programmable memory and the system thereof

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5053990A (en) * 1988-02-17 1991-10-01 Intel Corporation Program/erase selection for flash memory
JPH04206094A (ja) * 1990-11-30 1992-07-28 Mitsubishi Electric Corp 不揮発性半導体記憶装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7880636B2 (en) 2004-06-30 2011-02-01 Airbus Deutschland Gmbh Information display system for aircraft

Also Published As

Publication number Publication date
JPH06282995A (ja) 1994-10-07
US5457651A (en) 1995-10-10
DE69317250T2 (de) 1998-06-25
EP0606796A1 (de) 1994-07-20
EP0606796B1 (de) 1998-03-04
FR2700056A1 (fr) 1994-07-01
FR2700056B1 (fr) 1995-02-10

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee