DE69226394T2 - Magnetooptisches Element und Magnetfeldmessgerät - Google Patents

Magnetooptisches Element und Magnetfeldmessgerät

Info

Publication number
DE69226394T2
DE69226394T2 DE69226394T DE69226394T DE69226394T2 DE 69226394 T2 DE69226394 T2 DE 69226394T2 DE 69226394 T DE69226394 T DE 69226394T DE 69226394 T DE69226394 T DE 69226394T DE 69226394 T2 DE69226394 T2 DE 69226394T2
Authority
DE
Germany
Prior art keywords
magneto
magnetic field
measuring device
optical element
field measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69226394T
Other languages
English (en)
Other versions
DE69226394D1 (de
Inventor
Nobuki Itoh
Hirokazu Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Application granted granted Critical
Publication of DE69226394D1 publication Critical patent/DE69226394D1/de
Publication of DE69226394T2 publication Critical patent/DE69226394T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/032—Measuring direction or magnitude of magnetic fields or magnetic flux using magneto-optic devices, e.g. Faraday or Cotton-Mouton effect
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F10/00—Thin magnetic films, e.g. of one-domain structure
    • H01F10/26—Thin magnetic films, e.g. of one-domain structure characterised by the substrate or intermediate layers
    • H01F10/28—Thin magnetic films, e.g. of one-domain structure characterised by the substrate or intermediate layers characterised by the composition of the substrate
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B19/00—Liquid-phase epitaxial-layer growth
    • C30B19/02—Liquid-phase epitaxial-layer growth using molten solvents, e.g. flux
    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/10—Inorganic compounds or compositions
    • C30B29/16—Oxides
    • C30B29/22—Complex oxides
    • C30B29/28—Complex oxides with formula A3Me5O12 wherein A is a rare earth metal and Me is Fe, Ga, Sc, Cr, Co or Al, e.g. garnets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/032—Measuring direction or magnitude of magnetic fields or magnetic flux using magneto-optic devices, e.g. Faraday or Cotton-Mouton effect
    • G01R33/0322—Measuring direction or magnitude of magnetic fields or magnetic flux using magneto-optic devices, e.g. Faraday or Cotton-Mouton effect using the Faraday or Voigt effect
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F1/00—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties
    • H01F1/01—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials
    • H01F1/03—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity
    • H01F1/12—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of soft-magnetic materials
    • H01F1/34—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of soft-magnetic materials non-metallic substances, e.g. ferrites
    • H01F1/342—Oxides
    • H01F1/344—Ferrites, e.g. having a cubic spinel structure (X2+O)(Y23+O3), e.g. magnetite Fe3O4
    • H01F1/346—[(TO4) 3] with T= Si, Al, Fe, Ga
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F10/00—Thin magnetic films, e.g. of one-domain structure
    • H01F10/08—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers
    • H01F10/10—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition
    • H01F10/18—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being compounds
    • H01F10/20—Ferrites
    • H01F10/24—Garnets
    • H01F10/245—Modifications for enhancing interaction with electromagnetic wave energy
DE69226394T 1991-04-25 1992-04-23 Magnetooptisches Element und Magnetfeldmessgerät Expired - Fee Related DE69226394T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3095812A JPH0782164B2 (ja) 1991-04-25 1991-04-25 磁気光学素子及び磁界測定装置

Publications (2)

Publication Number Publication Date
DE69226394D1 DE69226394D1 (de) 1998-09-03
DE69226394T2 true DE69226394T2 (de) 1999-03-11

Family

ID=14147840

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69226394T Expired - Fee Related DE69226394T2 (de) 1991-04-25 1992-04-23 Magnetooptisches Element und Magnetfeldmessgerät

Country Status (5)

Country Link
US (1) US5212446A (de)
EP (1) EP0510621B1 (de)
JP (1) JPH0782164B2 (de)
KR (1) KR970000907B1 (de)
DE (1) DE69226394T2 (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3144928B2 (ja) * 1991-12-19 2001-03-12 株式会社東芝 光センサ
JPH05333124A (ja) * 1992-06-03 1993-12-17 Mitsubishi Gas Chem Co Inc 反射型光磁界センサヘッド
US5889609A (en) 1992-07-31 1999-03-30 Fujitsu Limited Optical attenuator
US5485079A (en) * 1993-03-29 1996-01-16 Matsushita Electric Industrial Co., Ltd. Magneto-optical element and optical magnetic field sensor
JPH07206593A (ja) * 1994-01-07 1995-08-08 Mitsubishi Gas Chem Co Inc 光アイソレータ用ファラデー回転子
JP3458865B2 (ja) * 1994-05-23 2003-10-20 三菱瓦斯化学株式会社 低飽和磁界ビスマス置換希土類鉄ガーネット単結晶、および、その用途
US5502373A (en) * 1994-06-15 1996-03-26 Eaton Corporation Magneto-optical current measurement apparatus
JP3490143B2 (ja) * 1994-07-01 2004-01-26 信越化学工業株式会社 酸化物ガーネット単結晶
JP3193945B2 (ja) * 1995-03-17 2001-07-30 松下電器産業株式会社 磁気光学素子及び光磁界センサ
JP3667827B2 (ja) * 1995-08-29 2005-07-06 富士通株式会社 ファラデー回転子
JP3153452B2 (ja) * 1995-11-17 2001-04-09 松下電器産業株式会社 光磁界センサ
JPH09230013A (ja) * 1996-02-21 1997-09-05 Matsushita Electric Ind Co Ltd 光磁界センサプローブ及び磁気光学素子
JP3739471B2 (ja) * 1996-03-01 2006-01-25 富士通株式会社 光可変減衰器
JP3773601B2 (ja) * 1996-09-18 2006-05-10 富士通株式会社 ファラデー回転子
JPH10161076A (ja) * 1996-11-29 1998-06-19 Fujitsu Ltd 磁気光学効果を利用した光デバイス
US6496300B2 (en) 1998-02-27 2002-12-17 Fujitsu Limited Optical amplifier
US6441955B1 (en) 1998-02-27 2002-08-27 Fujitsu Limited Light wavelength-multiplexing systems
JP3781553B2 (ja) * 1998-05-06 2006-05-31 株式会社リコー 光シャッター
US7166997B2 (en) * 2002-10-07 2007-01-23 Seagate Technology Llc Complex transverse AC magneto-optic susceptometer for determination of volume and anisotropy field distribution in recording media
KR100563628B1 (ko) * 2003-02-13 2006-03-27 김유곤 광자계센서 및 상기 광자계센서를 이용한 광자계측정장치
FR2856791B1 (fr) * 2003-06-27 2005-11-04 Centre Nat Rech Scient Procede et dispositif d'imagerie magneto-optique
US8289818B2 (en) 2008-12-31 2012-10-16 Infinitum Solutions, Inc. Magneto-optic write-head characterization using the recording medium as a transducer layer
US8659291B2 (en) * 2008-12-31 2014-02-25 Infinitum Solutions, Inc. Magneto-optical detection of a field produced by a sub-resolution magnetic structure
CN101458312B (zh) * 2009-01-04 2012-07-11 上海舜宇海逸光电技术有限公司 光纤磁光探测装置
US8427929B2 (en) 2010-09-08 2013-04-23 Infinitum Solutions, Inc. Sub-optical-resolution kerr signal detection for perpendicular write-head characterization
RU2692047C1 (ru) * 2018-02-14 2019-06-19 Акционерное общество "Научно-исследовательский институт материаловедения им. А.Ю. Малинина" Магнитооптический элемент и считывающее устройство с таким элементом
CN113124935B (zh) * 2021-04-21 2022-10-14 华北电力大学 一种油浸式变压器漏磁温度复合传感器及测量方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58139082A (ja) * 1982-02-15 1983-08-18 Hitachi Ltd 磁界測定装置
FR2572844B1 (fr) * 1984-11-02 1986-12-26 Commissariat Energie Atomique Materiau magnetique du type grenat, film magnetique a forte rotation faraday comportant un tel materiau et son procede de fabrication
JPH0766044B2 (ja) * 1985-06-29 1995-07-19 株式会社東芝 磁界センサ
JPS62186220A (ja) * 1986-02-12 1987-08-14 Sony Corp 光アイソレ−タ
FR2622969B1 (fr) * 1987-11-05 1993-01-22 Gen Electric Debitmetre avec affichage par commutateur optique a effet de faraday
JPH0731232B2 (ja) * 1988-06-10 1995-04-10 松下電器産業株式会社 磁界測定装置
US5075546A (en) * 1988-06-10 1991-12-24 Matsushita Electric Industrial Co., Ltd. Magnetic field measurement apparatus
JPH0288430A (ja) * 1988-09-26 1990-03-28 Tokin Corp 磁気光学ガーネット
JPH0748425B2 (ja) * 1988-09-30 1995-05-24 信越化学工業株式会社 マイクロ波素子
JPH03282414A (ja) * 1990-03-30 1991-12-12 Tokin Corp 磁界センサ用ファラデー回転子

Also Published As

Publication number Publication date
EP0510621A2 (de) 1992-10-28
JPH04324817A (ja) 1992-11-13
EP0510621A3 (en) 1993-12-08
EP0510621B1 (de) 1998-07-29
JPH0782164B2 (ja) 1995-09-06
KR970000907B1 (ko) 1997-01-21
US5212446A (en) 1993-05-18
DE69226394D1 (de) 1998-09-03
KR920020233A (ko) 1992-11-20

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee