DE69225612T2 - Optischer Spektralanalysator und Verfahren - Google Patents

Optischer Spektralanalysator und Verfahren

Info

Publication number
DE69225612T2
DE69225612T2 DE69225612T DE69225612T DE69225612T2 DE 69225612 T2 DE69225612 T2 DE 69225612T2 DE 69225612 T DE69225612 T DE 69225612T DE 69225612 T DE69225612 T DE 69225612T DE 69225612 T2 DE69225612 T2 DE 69225612T2
Authority
DE
Germany
Prior art keywords
spectrum analyzer
optical spectrum
optical
analyzer
spectrum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69225612T
Other languages
English (en)
Other versions
DE69225612D1 (de
Inventor
James Roy Stimpel
Zoltan D Azary
Kenneth Richards Wildnauer
Steven David Warwick
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of DE69225612D1 publication Critical patent/DE69225612D1/de
Application granted granted Critical
Publication of DE69225612T2 publication Critical patent/DE69225612T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2889—Rapid scan spectrometers; Time resolved spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/06—Scanning arrangements arrangements for order-selection
    • G01J2003/062—Scanning arrangements arrangements for order-selection motor-driven
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J2003/283—Investigating the spectrum computer-interfaced
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/2889—Rapid scan spectrometers; Time resolved spectrometry
    • G01J2003/2893—Rapid scan spectrometers; Time resolved spectrometry with rotating grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/30—Measuring the intensity of spectral lines directly on the spectrum itself

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
DE69225612T 1991-11-06 1992-10-20 Optischer Spektralanalysator und Verfahren Expired - Fee Related DE69225612T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/788,571 US5177560A (en) 1991-11-06 1991-11-06 Optical spectrum analyzer having adjustable sensitivity

Publications (2)

Publication Number Publication Date
DE69225612D1 DE69225612D1 (de) 1998-06-25
DE69225612T2 true DE69225612T2 (de) 1998-09-17

Family

ID=25144894

Family Applications (2)

Application Number Title Priority Date Filing Date
DE69208219T Expired - Fee Related DE69208219T2 (de) 1991-11-06 1992-10-20 Optischer Spektralanalysator
DE69225612T Expired - Fee Related DE69225612T2 (de) 1991-11-06 1992-10-20 Optischer Spektralanalysator und Verfahren

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE69208219T Expired - Fee Related DE69208219T2 (de) 1991-11-06 1992-10-20 Optischer Spektralanalysator

Country Status (4)

Country Link
US (1) US5177560A (de)
EP (2) EP0543160B1 (de)
JP (1) JP3731902B2 (de)
DE (2) DE69208219T2 (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5550747A (en) * 1994-03-07 1996-08-27 Hewlett-Packard Company Unbounded marker for spectrum analysis
JP3072465B2 (ja) * 1995-10-25 2000-07-31 富士通株式会社 バーコード読取装置
US6362476B1 (en) 1999-09-21 2002-03-26 Agere Systems Guardian Corp. Optical spectrum analyzer wavelength non-linearity measurement system
US7253897B2 (en) 2001-06-01 2007-08-07 Cidra Corporation Optical spectrum analyzer
EP1393026A1 (de) * 2001-06-01 2004-03-03 CiDra Corporation Optischer kanalüberwacher
US6639666B2 (en) * 2001-11-08 2003-10-28 Axsun Technologies, Inc. System and method for optical spectrum fast peak reporting
JP4016655B2 (ja) * 2001-12-26 2007-12-05 日本電気株式会社 光増幅器利得測定装置及び光増幅器利得測定方法
TWI232941B (en) * 2002-12-23 2005-05-21 Media Tek Inc Peak detector with double peak detection
US20050061779A1 (en) * 2003-08-06 2005-03-24 Walter Blumenfeld Laser ablation feedback spectroscopy
US7650589B2 (en) * 2003-08-15 2010-01-19 National Instruments Corporation Signal analysis function blocks and method of use
JP4522174B2 (ja) * 2004-07-14 2010-08-11 富士通株式会社 光測定装置
JP4912660B2 (ja) * 2005-10-19 2012-04-11 株式会社トプコン レベル検出装置
US7877698B1 (en) * 2006-10-06 2011-01-25 Meta Geek, LLC Spectrum analyzer user interface
US8576231B2 (en) 2005-11-28 2013-11-05 Ryan Woodings Spectrum analyzer interface
US8006195B1 (en) * 2005-11-28 2011-08-23 Meta Greek, LLC Spectrum analyzer interface
US8094034B2 (en) 2007-09-18 2012-01-10 Georgia Tech Research Corporation Detecting actuation of electrical devices using electrical noise over a power line
CN102150385B (zh) 2008-08-21 2015-11-25 尼斯迪卡有限公司 光信道监控器
US8805628B2 (en) 2009-09-25 2014-08-12 Belkin International, Inc. Systems and methods for measuring electrical power usage in a structure and systems and methods of calibrating the same
US9766277B2 (en) 2009-09-25 2017-09-19 Belkin International, Inc. Self-calibrating contactless power consumption sensing
US9291694B2 (en) 2010-07-02 2016-03-22 Belkin International, Inc. System and method for monitoring electrical power usage in an electrical power infrastructure of a building
US8624424B2 (en) * 2011-09-26 2014-01-07 Belkin International, Inc. Systems and methods to emulate high frequency electrical signatures
CN102829863B (zh) * 2012-03-09 2017-02-15 深圳市华唯计量技术开发有限公司 一种光谱仪的无高斯整型的数字多道脉冲分析器
US9200962B1 (en) * 2012-06-21 2015-12-01 The United States Of America As Represented By The Secretary Of The Navy Window calibration method for harmonic analysis of optical spectra
CN107110706A (zh) * 2014-11-06 2017-08-29 光谱引擎股份公司 光学测量方法和系统
CN111064327B (zh) * 2019-12-31 2021-06-18 江苏大学 一种基于声品质的驱动电机优化方法及系统
US11639873B2 (en) * 2020-04-15 2023-05-02 Viavi Solutions Inc. High resolution multi-pass optical spectrum analyzer
USD987459S1 (en) 2021-04-26 2023-05-30 Yokogawa Electric Corporation Spectrum analyzer

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5352180A (en) * 1976-10-22 1978-05-12 Hitachi Ltd Two light beams spectrophotometer
JPS6027934B2 (ja) * 1977-01-07 1985-07-02 株式会社日立製作所 分光光度計の最適感度検出装置
JPS54158288A (en) * 1978-06-05 1979-12-13 Hitachi Ltd Spectroscopic fluorescent photometer
DE2839949A1 (de) * 1978-09-14 1980-03-27 Zeiss Carl Fa Verfahren zum erfassen aufeinanderfolgender messwerte einer funktion
US4322807A (en) * 1980-03-07 1982-03-30 The Perkin-Elmer Corporation Safe memory system for a spectrophotometer
HU183949B (en) * 1982-06-07 1984-06-28 Koezponti Elelmiszeripari Method and apparatus for measuring spectrums
JPS60100727A (ja) * 1983-11-07 1985-06-04 Shimadzu Corp 分光分析装置
AU563817B2 (en) * 1983-11-23 1987-07-23 Varian Techtron Pty. Ltd. Statistical spectroscopic analysis
JPS60218041A (ja) * 1984-04-13 1985-10-31 Hitachi Ltd 分光光度計の波長表示方式
US4974209A (en) * 1988-09-02 1990-11-27 The Perkin-Elmer Corporation Interactive smoothing system

Also Published As

Publication number Publication date
DE69208219T2 (de) 1996-06-27
JPH0658811A (ja) 1994-03-04
DE69208219D1 (de) 1996-03-21
DE69225612D1 (de) 1998-06-25
EP0647837B1 (de) 1998-05-20
JP3731902B2 (ja) 2006-01-05
EP0543160A1 (de) 1993-05-26
US5177560A (en) 1993-01-05
EP0543160B1 (de) 1996-02-07
EP0647837A1 (de) 1995-04-12

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D.STAATES DELA

8339 Ceased/non-payment of the annual fee