DE69222425T2 - Methode und apparat zur multivariablen charakterisation der antwort eines optischen instruments - Google Patents

Methode und apparat zur multivariablen charakterisation der antwort eines optischen instruments

Info

Publication number
DE69222425T2
DE69222425T2 DE69222425T DE69222425T DE69222425T2 DE 69222425 T2 DE69222425 T2 DE 69222425T2 DE 69222425 T DE69222425 T DE 69222425T DE 69222425 T DE69222425 T DE 69222425T DE 69222425 T2 DE69222425 T2 DE 69222425T2
Authority
DE
Germany
Prior art keywords
multivariable
reply
characterization
optical instrument
instrument
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69222425T
Other languages
English (en)
Other versions
DE69222425D1 (de
Inventor
Harry Ruhl
Kenneth Beebe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dow Chemical Co
Original Assignee
Dow Chemical Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dow Chemical Co filed Critical Dow Chemical Co
Application granted granted Critical
Publication of DE69222425D1 publication Critical patent/DE69222425D1/de
Publication of DE69222425T2 publication Critical patent/DE69222425T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J2003/2866—Markers; Calibrating of scan
    • G01J2003/2879—Calibrating scan, e.g. Fabry Perot interferometer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/129—Using chemometrical methods

Landscapes

  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Mathematical Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE69222425T 1991-08-08 1992-08-06 Methode und apparat zur multivariablen charakterisation der antwort eines optischen instruments Expired - Fee Related DE69222425T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/742,620 US5357336A (en) 1991-08-08 1991-08-08 Method and apparatus for multivariate characterization of optical instrument response
PCT/US1992/006557 WO1993003341A1 (en) 1991-08-08 1992-08-06 Method and apparatus for multivariate characterization of optical instrument response

Publications (2)

Publication Number Publication Date
DE69222425D1 DE69222425D1 (de) 1997-10-30
DE69222425T2 true DE69222425T2 (de) 1998-02-05

Family

ID=24985575

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69222425T Expired - Fee Related DE69222425T2 (de) 1991-08-08 1992-08-06 Methode und apparat zur multivariablen charakterisation der antwort eines optischen instruments

Country Status (6)

Country Link
US (1) US5357336A (de)
EP (1) EP0598015B1 (de)
JP (1) JPH06509871A (de)
CA (1) CA2111963A1 (de)
DE (1) DE69222425T2 (de)
WO (1) WO1993003341A1 (de)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2283091B (en) * 1993-10-19 1997-10-01 John Christopher Richmond Apparatus and method for spectroscopic analysis
JP3212779B2 (ja) * 1993-11-12 2001-09-25 富士写真フイルム株式会社 光学式分析装置の分光器の機差補正方法
NZ300915A (en) * 1995-02-09 1998-12-23 Foss Electric As Method for standardizing a spectrometer generating an optical spectrum from a sample
US5710713A (en) * 1995-03-20 1998-01-20 The Dow Chemical Company Method of creating standardized spectral libraries for enhanced library searching
US5828445A (en) * 1995-03-30 1998-10-27 Chiron Diagnostics Corporation Method for measuring and reporting co-oximeter quality control results
US5914875A (en) * 1996-01-11 1999-06-22 Kabushiki Kaisha Toshiba Method and apparatus for diagnosing plant anomaly
GB9701627D0 (en) * 1997-01-27 1997-03-19 Plessey Telecomm Wavelength manager
US5850623A (en) * 1997-03-14 1998-12-15 Eastman Chemical Company Method for standardizing raman spectrometers to obtain stable and transferable calibrations
US6603549B2 (en) 2000-02-25 2003-08-05 Cymer, Inc. Convolution method for measuring laser bandwidth
US20030135547A1 (en) * 2001-07-23 2003-07-17 Kent J. Thomas Extensible modular communication executive with active message queue and intelligent message pre-validation
US20030083753A1 (en) * 2001-10-22 2003-05-01 Rajdeep Kalgutkar Photocuring system database
AU2002358459B2 (en) * 2002-01-10 2006-10-05 Foss Analytical A/S Method and means for correcting measuring instruments
US7233401B1 (en) * 2003-07-11 2007-06-19 Foothill Instruments, Llc Method and apparatus for measuring thickness of a material
DE102008050867B4 (de) * 2008-09-30 2011-12-08 Carl Zeiss Laser Optics Gmbh Verfahren zum Messen eines Spektrums einer schmalbandigen Lichtquelle sowie Spektrometeranordnung
CN102608095A (zh) * 2010-06-25 2012-07-25 清华大学 利用标准样品对拉曼光谱检测系统进行自动校准的方法
US8599381B2 (en) 2011-01-19 2013-12-03 Massachusetts Institute Of Technology Gas detector for atmospheric species detection
GB2513343A (en) * 2013-04-23 2014-10-29 Univ Singapore Methods related to instrument-independent measurements for quantitative analysis of fiber-optic Raman spectroscopy
CN105358946B (zh) * 2013-02-14 2017-07-14 曾海山 用于光谱测量系统的校准的光学基准
EP2963398B1 (de) * 2014-06-30 2016-08-03 Sick Ag Prüfverfahren für Spektrometer und Spektrometer mit Prüffunktion
CN106153192B (zh) * 2016-07-22 2017-12-29 浙江大学 一种利用多光谱相机虚拟响应值获取光谱反射比的方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3422370A (en) * 1965-07-19 1969-01-14 Sperry Rand Corp Variable frequency laser
US3373651A (en) * 1966-11-28 1968-03-19 Design Inc Interferometric spectrometer utilizing three fabry-perot etalons in series
GB1459777A (en) * 1972-12-20 1976-12-31 Varian Techtron Pty Ltd Spectrophotometer
US4092070A (en) * 1976-10-26 1978-05-30 Lansing Research Corporation Tuning of etalons in spectroscopic apparatus
US4172663A (en) * 1977-04-27 1979-10-30 Board of Trustees Leland Stanford Jr., University Optical wavelength meter
US4241997A (en) * 1978-12-11 1980-12-30 General Motors Corporation Laser spectrometer with frequency calibration
US4525067A (en) * 1982-10-22 1985-06-25 The United States Of America As Represented By The Secretary Of Commerce Twin-etalon scanning spectrometer
JPS60125801A (ja) * 1983-12-12 1985-07-05 Sumitomo Electric Ind Ltd 赤外透過材用反射防止膜
US4729657A (en) * 1986-06-23 1988-03-08 Miles Laboratories, Inc. Method of calibrating reflectance measuring devices
US4977563A (en) * 1987-09-26 1990-12-11 Mitsubishi Denki Kabushiki Kaisha Laser apparatus
US5125747A (en) * 1990-10-12 1992-06-30 Tytronics, Inc. Optical analytical instrument and method having improved calibration

Also Published As

Publication number Publication date
CA2111963A1 (en) 1993-02-18
JPH06509871A (ja) 1994-11-02
DE69222425D1 (de) 1997-10-30
EP0598015A4 (en) 1994-08-10
EP0598015B1 (de) 1997-09-24
EP0598015A1 (de) 1994-05-25
US5357336A (en) 1994-10-18
WO1993003341A1 (en) 1993-02-18

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee