DE69222118T2 - Jitter Analysator - Google Patents

Jitter Analysator

Info

Publication number
DE69222118T2
DE69222118T2 DE69222118T DE69222118T DE69222118T2 DE 69222118 T2 DE69222118 T2 DE 69222118T2 DE 69222118 T DE69222118 T DE 69222118T DE 69222118 T DE69222118 T DE 69222118T DE 69222118 T2 DE69222118 T2 DE 69222118T2
Authority
DE
Germany
Prior art keywords
jitter analyzer
jitter
analyzer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69222118T
Other languages
English (en)
Other versions
DE69222118D1 (de
Inventor
Mishio Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE69222118D1 publication Critical patent/DE69222118D1/de
Application granted granted Critical
Publication of DE69222118T2 publication Critical patent/DE69222118T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • H04L1/205—Arrangements for detecting or preventing errors in the information received using signal quality detector jitter monitoring

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Quality & Reliability (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Measuring Frequencies, Analyzing Spectra (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
DE69222118T 1991-10-18 1992-10-13 Jitter Analysator Expired - Fee Related DE69222118T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3270726A JPH05107287A (ja) 1991-10-18 1991-10-18 ジツタ解析装置

Publications (2)

Publication Number Publication Date
DE69222118D1 DE69222118D1 (de) 1997-10-16
DE69222118T2 true DE69222118T2 (de) 1998-02-05

Family

ID=17490105

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69222118T Expired - Fee Related DE69222118T2 (de) 1991-10-18 1992-10-13 Jitter Analysator

Country Status (4)

Country Link
US (1) US5293520A (de)
EP (1) EP0543139B1 (de)
JP (1) JPH05107287A (de)
DE (1) DE69222118T2 (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5557196A (en) * 1993-08-25 1996-09-17 Advantest Corporation Jitter analyzer
JPH07104018A (ja) * 1993-10-01 1995-04-21 Reader Denshi Kk ジッタ測定方法及び装置
US5610847A (en) * 1994-10-28 1997-03-11 Cadence Design Systems, Inc. Ratiometric fourier analyzer
US6263290B1 (en) * 1995-02-22 2001-07-17 Michael K. Williams Process and machine for signal waveform analysis
US5644495A (en) * 1995-04-07 1997-07-01 Delco Electronics Corporation Method and apparatus for wow and flutter analysis
US5812626A (en) * 1995-06-13 1998-09-22 Matsushita Electric Industrial Co., Ltd. Time counting circuit sampling circuit skew adjusting circuit and logic analyzing circuit
JP2002513471A (ja) 1997-03-13 2002-05-08 ウェイブクレスト・コーポレイション 直線傾斜発生回路を組み込んだ時間間隔測定システム
TW388795B (en) * 1997-12-24 2000-05-01 Via Tech Inc Auxiliary device and method for signal testing
CN1209631C (zh) * 1998-01-30 2005-07-06 波峰有限公司 用于抖动分析的方法
US6598004B1 (en) * 2000-08-28 2003-07-22 Advantest Corporation Jitter measurement apparatus and its method
US6574168B2 (en) * 2000-09-05 2003-06-03 Advantest Corporation Time measuring device and testing apparatus
GB2368651B (en) * 2000-10-31 2006-05-31 Consultronics Europ Ltd Method and apparatus for measurement of jitter
US6850051B2 (en) * 2001-03-26 2005-02-01 Mcgill University Timing measurement device using a component-invariant vernier delay line
US6590509B2 (en) * 2001-04-24 2003-07-08 Credence Systems Corporation Data recovery through event based equivalent time sampling
US6651016B1 (en) * 2001-12-21 2003-11-18 Credence Systems Corporation Jitter-corrected spectrum analyzer
CN100427958C (zh) * 2002-10-31 2008-10-22 联发科技股份有限公司 抖动测量装置与测量方法
US7050915B2 (en) * 2003-10-16 2006-05-23 Agilent Technologies, Inc. Periodic jitter characterization using pseudo-random sampling
US8295182B2 (en) * 2007-07-03 2012-10-23 Credence Systems Corporation Routed event test system and method
WO2009026435A1 (en) 2007-08-23 2009-02-26 Amherst Systems Associates, Inc. Waveform anomoly detection and notification systems and methods
FR2958058A1 (fr) * 2010-09-28 2011-09-30 Continental Automotive France Circuit electronique a cellules de comptage de temps totalement autonomes
US9952281B2 (en) 2013-07-04 2018-04-24 Nvidia Corporation Clock jitter and power supply noise analysis
WO2017193100A1 (en) * 2016-05-06 2017-11-09 Qelzal Corporation Event-based aircraft sense and avoid system

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4074358A (en) * 1976-12-02 1978-02-14 Bell Telephone Laboratories, Incorporated Test set for measuring jitter distortion of data pulses
US4253184A (en) * 1979-11-06 1981-02-24 Bell Telephone Laboratories, Incorporated Phase-jitter compensation using periodic harmonically related components
JPS6080786A (ja) * 1983-10-07 1985-05-08 Advantest Corp 時間間隔測定装置
US4876655A (en) * 1985-12-02 1989-10-24 Tektronix, Inc. Method and apparatus for evaluating jitter
JPS62284268A (ja) * 1986-06-02 1987-12-10 Advantest Corp 時間間隔分析装置
JPS62294993A (ja) * 1986-06-16 1987-12-22 Advantest Corp 時間−電圧変換装置
JPH073445B2 (ja) * 1986-11-04 1995-01-18 株式会社アドバンテスト 時間間隔分析装置
JPH0820473B2 (ja) * 1987-02-04 1996-03-04 株式会社 アドバンテスト 連続的周期−電圧変換装置
US4800571A (en) * 1988-01-11 1989-01-24 Tektronix, Inc. Timing jitter measurement display

Also Published As

Publication number Publication date
EP0543139A1 (de) 1993-05-26
EP0543139B1 (de) 1997-09-10
US5293520A (en) 1994-03-08
DE69222118D1 (de) 1997-10-16
JPH05107287A (ja) 1993-04-27

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee