DE69130472T2 - Ein dc SQUID Element und Verfahren zu dessen Herstellung - Google Patents

Ein dc SQUID Element und Verfahren zu dessen Herstellung

Info

Publication number
DE69130472T2
DE69130472T2 DE69130472T DE69130472T DE69130472T2 DE 69130472 T2 DE69130472 T2 DE 69130472T2 DE 69130472 T DE69130472 T DE 69130472T DE 69130472 T DE69130472 T DE 69130472T DE 69130472 T2 DE69130472 T2 DE 69130472T2
Authority
DE
Germany
Prior art keywords
manufacture
squid element
squid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69130472T
Other languages
English (en)
Other versions
DE69130472D1 (de
Inventor
Kei Shinada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=17258518&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE69130472(T2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of DE69130472D1 publication Critical patent/DE69130472D1/de
Application granted granted Critical
Publication of DE69130472T2 publication Critical patent/DE69130472T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/035—Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
    • G01R33/0354—SQUIDS
    • G01R33/0358—SQUIDS coupling the flux to the SQUID
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N60/00—Superconducting devices
    • H10N60/10—Junction-based devices
    • H10N60/12—Josephson-effect devices
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/70—High TC, above 30 k, superconducting device, article, or structured stock
    • Y10S505/701—Coated or thin film device, i.e. active or passive
    • Y10S505/702—Josephson junction present
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/825—Apparatus per se, device per se, or process of making or operating same
    • Y10S505/842—Measuring and testing
    • Y10S505/843—Electrical
    • Y10S505/845—Magnetometer
    • Y10S505/846—Magnetometer using superconductive quantum interference device, i.e. squid

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)
  • Measuring Magnetic Variables (AREA)
DE69130472T 1990-09-20 1991-09-19 Ein dc SQUID Element und Verfahren zu dessen Herstellung Expired - Fee Related DE69130472T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2253974A JP2780473B2 (ja) 1990-09-20 1990-09-20 Ｄｃ―ｓｑｕｉｄ素子およびその製造方法

Publications (2)

Publication Number Publication Date
DE69130472D1 DE69130472D1 (de) 1998-12-17
DE69130472T2 true DE69130472T2 (de) 1999-05-12

Family

ID=17258518

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69130472T Expired - Fee Related DE69130472T2 (de) 1990-09-20 1991-09-19 Ein dc SQUID Element und Verfahren zu dessen Herstellung

Country Status (5)

Country Link
US (1) US5227645A (de)
EP (1) EP0477012B1 (de)
JP (1) JP2780473B2 (de)
CN (1) CN1029057C (de)
DE (1) DE69130472T2 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2964112B2 (ja) * 1992-08-11 1999-10-18 セイコーインスツルメンツ株式会社 直流駆動型超伝導量子干渉素子
JPH10154397A (ja) * 1996-11-25 1998-06-09 Kokusai Chodendo Sangyo Gijutsu Kenkyu Center 高温超電導ランダムアクセスメモリ
US6078517A (en) * 1998-12-04 2000-06-20 Trw Inc. Superconducting memory cell with directly-coupled readout
US6147032A (en) 1999-05-19 2000-11-14 Trw Inc. Method for indirect Ion implantation of oxide superconductive films
CN101303398B (zh) * 2002-02-26 2011-05-25 心脏磁力成像公司 次-皮可特斯拉磁场检测器
CN100399594C (zh) * 2004-11-29 2008-07-02 中国科学院物理研究所 一种增加超导量子干涉器件灵敏度的方法
CN102944855B (zh) * 2012-10-16 2016-01-20 中国科学院上海微系统与信息技术研究所 一种全集成sbc超导量子干涉器件
CN104377299B (zh) * 2014-08-21 2017-09-26 中国科学院上海微系统与信息技术研究所 无磁屏蔽环境下抑制磁场干扰的squid器件的结构
CN107229021B (zh) * 2017-05-22 2019-07-19 中国科学院上海微系统与信息技术研究所 三维磁场测量组件及制备方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4403189A (en) * 1980-08-25 1983-09-06 S.H.E. Corporation Superconducting quantum interference device having thin film Josephson junctions
US4588947A (en) * 1983-12-30 1986-05-13 International Business Machines Corporation Integrated miniature DC SQUID susceptometer for measuring properties of very small samples
JPS6147676A (ja) * 1984-08-13 1986-03-08 Fujitsu Ltd 超伝導量子干渉素子
EP0246419B1 (de) * 1986-05-21 1991-04-10 Siemens Aktiengesellschaft SQUID-Magnetometer für eine Vorrichtung zur Messung schwacher Magnetfelder
FR2622020B1 (fr) * 1987-10-20 1990-02-02 Thomson Csf Dispositif magnetometrique supraconducteur
NL8702607A (nl) * 1987-11-02 1989-06-01 Philips Nv Inrichting voor het uitlezen van informatie uit een magnetisch registratiemedium.
US5053834A (en) * 1990-08-31 1991-10-01 Quantum Magnetics, Inc. High symmetry dc SQUID system

Also Published As

Publication number Publication date
DE69130472D1 (de) 1998-12-17
EP0477012A3 (en) 1992-07-15
JPH04130680A (ja) 1992-05-01
CN1060926A (zh) 1992-05-06
JP2780473B2 (ja) 1998-07-30
CN1029057C (zh) 1995-06-21
US5227645A (en) 1993-07-13
EP0477012B1 (de) 1998-11-11
EP0477012A2 (de) 1992-03-25

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Legal Events

Date Code Title Description
8320 Willingness to grant licences declared (paragraph 23)
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee