DE69127283T2 - Ausrichtsystem und -verfahren für eine prüfhalterung - Google Patents

Ausrichtsystem und -verfahren für eine prüfhalterung

Info

Publication number
DE69127283T2
DE69127283T2 DE69127283T DE69127283T DE69127283T2 DE 69127283 T2 DE69127283 T2 DE 69127283T2 DE 69127283 T DE69127283 T DE 69127283T DE 69127283 T DE69127283 T DE 69127283T DE 69127283 T2 DE69127283 T2 DE 69127283T2
Authority
DE
Germany
Prior art keywords
board
fixture
test
probes
tooling pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69127283T
Other languages
English (en)
Other versions
DE69127283D1 (de
Inventor
Mark Swart
Charles Johnston
Loan David Van
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Everett Charles Technologies Inc
Original Assignee
Everett Charles Contact Products Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=24107925&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE69127283(T2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Priority claimed from US07/648,453 external-priority patent/US5321351A/en
Application filed by Everett Charles Contact Products Inc filed Critical Everett Charles Contact Products Inc
Publication of DE69127283D1 publication Critical patent/DE69127283D1/de
Application granted granted Critical
Publication of DE69127283T2 publication Critical patent/DE69127283T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2891—Features relating to contacting the IC under test, e.g. probe heads; chucks related to sensing or controlling of force, position, temperature
DE69127283T 1990-05-25 1991-05-24 Ausrichtsystem und -verfahren für eine prüfhalterung Expired - Fee Related DE69127283T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US52895790A 1990-05-25 1990-05-25
US07/648,453 US5321351A (en) 1990-05-25 1991-01-31 Test fixture alignment system
PCT/US1991/003688 WO1991019392A1 (en) 1990-05-25 1991-05-24 Test fixture alignment system

Publications (2)

Publication Number Publication Date
DE69127283D1 DE69127283D1 (de) 1997-09-18
DE69127283T2 true DE69127283T2 (de) 1998-01-02

Family

ID=24107925

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69127283T Expired - Fee Related DE69127283T2 (de) 1990-05-25 1991-05-24 Ausrichtsystem und -verfahren für eine prüfhalterung

Country Status (5)

Country Link
EP (1) EP0531428B1 (de)
JP (1) JPH0833434B2 (de)
AT (1) ATE156958T1 (de)
DE (1) DE69127283T2 (de)
WO (1) WO1991019392A1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5408189A (en) * 1990-05-25 1995-04-18 Everett Charles Technologies, Inc. Test fixture alignment system for printed circuit boards
FR2692048B1 (fr) * 1992-06-09 1996-09-06 Everett Charles Tech Montage d'essai.
US5416428A (en) * 1993-02-09 1995-05-16 Everett Charles Technologies, Inc. Marker probe
US5442299A (en) * 1994-01-06 1995-08-15 International Business Machines Corporation Printed circuit board test fixture and method
DE4406538A1 (de) 1994-02-28 1995-08-31 Mania Gmbh Leiterplatten-Prüfeinrichtung mit Prüfadapter und Verfahren zum Einstellen desselben
US9523735B2 (en) * 2014-10-08 2016-12-20 Eastman Kodak Company Electrical test system with vision-guided alignment
CN112649628A (zh) * 2020-12-14 2021-04-13 华虹半导体(无锡)有限公司 探针卡的维护校正方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4668982A (en) * 1985-06-17 1987-05-26 The Perkin-Elmer Corporation Misregistration/distortion correction scheme
US4943767A (en) * 1986-08-21 1990-07-24 Tokyo Electron Limited Automatic wafer position aligning method for wafer prober
GB8700754D0 (en) * 1987-01-14 1987-02-18 Int Computers Ltd Test apparatus for printed circuit boards
JP2622573B2 (ja) * 1988-01-27 1997-06-18 キヤノン株式会社 マーク検知装置及び方法
CA1314085C (en) * 1988-05-25 1993-03-02 Andras G. Fule Linear interpolation for a component placement robot

Also Published As

Publication number Publication date
DE69127283D1 (de) 1997-09-18
EP0531428A4 (en) 1993-05-12
JPH0833434B2 (ja) 1996-03-29
EP0531428A1 (de) 1993-03-17
ATE156958T1 (de) 1997-08-15
EP0531428B1 (de) 1997-08-13
JPH05506719A (ja) 1993-09-30
WO1991019392A1 (en) 1991-12-12

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Legal Events

Date Code Title Description
8363 Opposition against the patent
8339 Ceased/non-payment of the annual fee