DE69032785D1 - Strahlungsdetektormatrix mit strahlungsempfindlichen brücken - Google Patents

Strahlungsdetektormatrix mit strahlungsempfindlichen brücken

Info

Publication number
DE69032785D1
DE69032785D1 DE69032785T DE69032785T DE69032785D1 DE 69032785 D1 DE69032785 D1 DE 69032785D1 DE 69032785 T DE69032785 T DE 69032785T DE 69032785 T DE69032785 T DE 69032785T DE 69032785 D1 DE69032785 D1 DE 69032785D1
Authority
DE
Germany
Prior art keywords
radiation
detector matrix
bridges
sensitive
radiation detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69032785T
Other languages
English (en)
Other versions
DE69032785T2 (de
Inventor
Jan Grinberg
Murray Welkowsky
Chiung-Sheng Wu
Paul Braatz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
DirecTV Group Inc
Original Assignee
Hughes Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hughes Electronics Corp filed Critical Hughes Electronics Corp
Application granted granted Critical
Publication of DE69032785D1 publication Critical patent/DE69032785D1/de
Publication of DE69032785T2 publication Critical patent/DE69032785T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
    • G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
    • G01J5/22—Electrical features thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
    • G01J5/53—Reference sources, e.g. standard lamps; Black bodies
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14649—Infrared imagers
    • H01L27/1465—Infrared imagers of the hybrid type
DE69032785T 1989-06-21 1990-01-30 Strahlungsdetektormatrix mit strahlungsempfindlichen brücken Expired - Fee Related DE69032785T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US07/370,109 US4922116A (en) 1988-08-04 1989-06-21 Flicker free infrared simulator with resistor bridges
PCT/US1990/000525 WO1990016082A1 (en) 1989-06-21 1990-01-30 Radiation detector array using radiation sensitive bridges

Publications (2)

Publication Number Publication Date
DE69032785D1 true DE69032785D1 (de) 1999-01-07
DE69032785T2 DE69032785T2 (de) 1999-07-22

Family

ID=23458258

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69032785T Expired - Fee Related DE69032785T2 (de) 1989-06-21 1990-01-30 Strahlungsdetektormatrix mit strahlungsempfindlichen brücken

Country Status (6)

Country Link
US (1) US4922116A (de)
EP (1) EP0429566B1 (de)
JP (1) JPH07111371B2 (de)
DE (1) DE69032785T2 (de)
IL (1) IL93311A (de)
WO (1) WO1990016082A1 (de)

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US5576553A (en) * 1994-09-23 1996-11-19 Adachi; Yoshi Two dimensional thermal image generator
US5783831A (en) * 1994-10-05 1998-07-21 Colebrand Limited Radiation emitting device
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US5600148A (en) 1994-12-30 1997-02-04 Honeywell Inc. Low power infrared scene projector array and method of manufacture
FI102696B1 (fi) * 1995-02-22 1999-01-29 Instrumentarium Oy Kaksoissäteilylähdekokoonpano ja mittausanturi
US5617318A (en) * 1995-05-08 1997-04-01 Northrop Grumman Corporation Dynamically reconfigurable data processing system
JP3344163B2 (ja) * 1995-06-06 2002-11-11 三菱電機株式会社 赤外線撮像素子
FR2735574B1 (fr) * 1995-06-15 1997-07-18 Commissariat Energie Atomique Dispositif de detection bolometrique pour ondes millimetriques et submillimetriques et procede de fabrication de ce dispositif
DE69632137T2 (de) * 1995-08-03 2005-04-14 Johnson, Edward A., Bedford Filament für infrarotstrahlung und herstellungsverfahren
US6515285B1 (en) 1995-10-24 2003-02-04 Lockheed-Martin Ir Imaging Systems, Inc. Method and apparatus for compensating a radiation sensor for ambient temperature variations
US7495220B2 (en) * 1995-10-24 2009-02-24 Bae Systems Information And Electronics Systems Integration Inc. Uncooled infrared sensor
JP3839487B2 (ja) * 1995-11-15 2006-11-01 ロッキード マーティン アイアール イメージング システムズ インク デュアルバンドマルチレベルマイクロブリッジ検出器
IL124691A (en) * 1995-12-04 2001-06-14 Lockheed Martin Ir Imaging Sys Infrared radiation detector having a reduced active area
US5914488A (en) * 1996-03-05 1999-06-22 Mitsubishi Denki Kabushiki Kaisha Infrared detector
US5910659A (en) * 1996-04-30 1999-06-08 The United States Of America As Represented By The Secretary Of Commerce Flat panel thermal infrared generator
US6249002B1 (en) 1996-08-30 2001-06-19 Lockheed-Martin Ir Imaging Systems, Inc. Bolometric focal plane array
US6791610B1 (en) 1996-10-24 2004-09-14 Lockheed Martin Ir Imaging Systems, Inc. Uncooled focal plane array sensor
EP0859536B1 (de) * 1997-02-15 2005-01-19 Siemens Building Technologies AG Infrarot-Strahler und dessen Verwendung
US5751006A (en) * 1997-05-05 1998-05-12 The United States Of America As Represented By The Secretary Of The Navy Water heated panels for simulating the infrared signature of a target
US5969369A (en) * 1997-08-29 1999-10-19 Fogarty; Charles M. Infrared emissive module
US6002132A (en) * 1997-10-27 1999-12-14 The United States Of America As Represented By The Secretary Of The Air Force Thermionic thermal detector and detector array
US6124145A (en) * 1998-01-23 2000-09-26 Instrumentarium Corporation Micromachined gas-filled chambers and method of microfabrication
KR20000004151A (ko) * 1998-06-30 2000-01-25 전주범 볼로메터의 개선된 구조
EP1117978B1 (de) * 1998-08-31 2005-06-15 Daewoo Electronics Corporation Mit einem schlangenartigen spannungsausgleichenden element versehenes bolometer
WO2000012986A1 (en) * 1998-08-31 2000-03-09 Daewoo Electronics Co., Ltd. Bolometer including a reflective layer
JP4089033B2 (ja) * 1998-09-25 2008-05-21 松下電工株式会社 センサ
US6465798B1 (en) * 1999-04-02 2002-10-15 Indigo Systems Corporation Large area infrared scene emitter RIIC
DE10016688C2 (de) * 2000-04-04 2003-12-24 Deutsch Zentr Luft & Raumfahrt Verfahren zur Detektion von Tieren und/oder Gelegen von Bodenbrütern in deren natürlichem Lebensraum sowie Einrichtungen zur Durchführung des Verfahrens
EP1279011A2 (de) 2000-05-01 2003-01-29 BAE SYSTEMS Information and Electronic Systems Integration, Inc. Verfahren und vorrichtung zur kompensation der temperaturschwankungen eines sthrahlungssensors
US6596998B1 (en) * 2000-07-31 2003-07-22 Westinghouse Electric Company Llc Method and system for identifying the source of a signal
US6683310B2 (en) 2001-06-18 2004-01-27 Honeywell International Inc. Readout technique for microbolometer array
US20040187904A1 (en) * 2003-02-05 2004-09-30 General Electric Company Apparatus for infrared radiation detection
US7030378B2 (en) * 2003-08-05 2006-04-18 Bae Systems Information And Electronic Systems Integration, Inc. Real-time radiation sensor calibration
US20060006787A1 (en) * 2004-07-06 2006-01-12 David Champion Electronic device having a plurality of conductive beams
EP1856678B1 (de) * 2005-02-25 2015-01-14 Kevin Liddiard Sicherheits-mikrobolometer-infrarotsensor
US9341444B2 (en) 2005-11-23 2016-05-17 Robert Levine Thermal electric images
CN104298078A (zh) * 2009-05-14 2015-01-21 4233999加拿大股份有限公司 利用发光二极管单片阵列来提供高分辨率图像的系统和方法
KR101180647B1 (ko) * 2011-01-10 2012-09-19 한국과학기술원 마이크로 볼로미터에서 필 팩터를 높이기 위한 픽셀 디자인
TWI554914B (zh) * 2012-06-27 2016-10-21 鴻海精密工業股份有限公司 觸控面板及觸摸式液晶顯示屏
CN103557943B (zh) * 2013-11-05 2016-08-24 北京仿真中心 一种红外场景模拟装置

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US4329312A (en) * 1969-11-14 1982-05-11 Affiliated Hospital Products, Inc. Method of making gloves
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CS190760B1 (en) * 1976-07-13 1979-06-29 Jan Svoboda Reference source of the heat radiation
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US4387301A (en) * 1981-04-20 1983-06-07 Hughes Aircraft Company Target for calibrating and testing infrared detection devices
US4378489A (en) * 1981-05-18 1983-03-29 Honeywell Inc. Miniature thin film infrared calibration source
US4463262A (en) * 1981-09-21 1984-07-31 The United States Of America As Represented By The Secretary Of The Air Force Thick film radiation detector
DE3240180A1 (de) * 1982-10-29 1984-05-03 Siemens AG, 1000 Berlin und 8000 München Halbleiter-strahlungsdetektor, insbesondere fuer infrarotstrahlung
US4537471A (en) * 1983-12-23 1985-08-27 Hughes Aircraft Company Liquid crystal pixel driver circuit and matrix display
DE3411186A1 (de) * 1984-03-27 1985-10-10 Battelle-Institut E.V., 6000 Frankfurt Vorrichtung zum automatischen ueberpruefen und erkennen von objekten
FR2570494B1 (fr) * 1984-09-17 1986-12-26 Int Standard Electric Corp Detecteur d'infrarouge, dispositif de vision de nuit en faisant usage et methode pour le fabriquer
DE3437397A1 (de) * 1984-10-12 1986-04-17 Drägerwerk AG, 2400 Lübeck Infrarot-strahler
JPH0680477B2 (ja) * 1985-02-06 1994-10-12 キヤノン株式会社 液晶表示パネル及び駆動方法
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Also Published As

Publication number Publication date
WO1990016082A1 (en) 1990-12-27
IL93311A0 (en) 1990-11-29
IL93311A (en) 1993-01-14
EP0429566A1 (de) 1991-06-05
JPH07111371B2 (ja) 1995-11-29
DE69032785T2 (de) 1999-07-22
US4922116A (en) 1990-05-01
JPH04500437A (ja) 1992-01-23
EP0429566B1 (de) 1998-11-25

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee