DE69031501D1 - Vorrichtung und Verfahren zur Lichtmessung unter Verwendung eines Supraleiters - Google Patents
Vorrichtung und Verfahren zur Lichtmessung unter Verwendung eines SupraleitersInfo
- Publication number
- DE69031501D1 DE69031501D1 DE69031501T DE69031501T DE69031501D1 DE 69031501 D1 DE69031501 D1 DE 69031501D1 DE 69031501 T DE69031501 T DE 69031501T DE 69031501 T DE69031501 T DE 69031501T DE 69031501 D1 DE69031501 D1 DE 69031501D1
- Authority
- DE
- Germany
- Prior art keywords
- superconductor
- measuring light
- measuring
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000002887 superconductor Substances 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N60/00—Superconducting devices
- H10N60/80—Constructional details
- H10N60/84—Switching means for devices switchable between superconducting and normal states
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S505/00—Superconductor technology: apparatus, material, process
- Y10S505/70—High TC, above 30 k, superconducting device, article, or structured stock
- Y10S505/701—Coated or thin film device, i.e. active or passive
- Y10S505/702—Josephson junction present
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
Applications Claiming Priority (9)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1171918A JP2737004B2 (ja) | 1989-07-05 | 1989-07-05 | 信号検出方法 |
JP1171917A JP2737003B2 (ja) | 1989-07-05 | 1989-07-05 | 信号検出方法 |
JP1180285A JP2737006B2 (ja) | 1989-07-14 | 1989-07-14 | 信号検出器 |
JP1180286A JP2737007B2 (ja) | 1989-07-14 | 1989-07-14 | 信号検出器 |
JP1184424A JP2737008B2 (ja) | 1989-07-19 | 1989-07-19 | 光検出素子 |
JP1184425A JP2896788B2 (ja) | 1989-07-19 | 1989-07-19 | 光検出素子 |
JP1192528A JP2715320B2 (ja) | 1989-07-27 | 1989-07-27 | 光検出素子 |
JP1192529A JP2759508B2 (ja) | 1989-07-27 | 1989-07-27 | 光検出器 |
JP1192530A JP2715321B2 (ja) | 1989-07-27 | 1989-07-27 | 光検出器 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69031501D1 true DE69031501D1 (de) | 1997-10-30 |
DE69031501T2 DE69031501T2 (de) | 1998-03-05 |
Family
ID=27577522
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69009109T Expired - Fee Related DE69009109T2 (de) | 1989-07-05 | 1990-07-04 | Vorrichtung und Verfahren zur Lichtmessung. |
DE69031501T Expired - Fee Related DE69031501T2 (de) | 1989-07-05 | 1990-07-04 | Vorrichtung und Verfahren zur Lichtmessung unter Verwendung eines Supraleiters |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69009109T Expired - Fee Related DE69009109T2 (de) | 1989-07-05 | 1990-07-04 | Vorrichtung und Verfahren zur Lichtmessung. |
Country Status (3)
Country | Link |
---|---|
US (1) | US5155093A (de) |
EP (2) | EP0407166B1 (de) |
DE (2) | DE69009109T2 (de) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5768002A (en) * | 1996-05-06 | 1998-06-16 | Puzey; Kenneth A. | Light modulation system including a superconductive plate assembly for use in a data transmission scheme and method |
US6584245B1 (en) * | 1996-05-06 | 2003-06-24 | Teracomm Research, Inc | High speed data link including a superconductive plate assembly for use in a data transmission scheme and method |
JPH11346010A (ja) * | 1998-03-30 | 1999-12-14 | Sharp Corp | 光検出素子 |
JP2002074936A (ja) * | 2000-08-31 | 2002-03-15 | Canon Inc | 磁気デバイス |
JP2002084019A (ja) | 2000-09-08 | 2002-03-22 | Canon Inc | 磁気デバイス及び固体磁気メモリ |
US6738548B2 (en) * | 2001-04-19 | 2004-05-18 | Teracomm Research, Inc | Reduced four-wave mixing optical fiber for wavelength-division multiplexing |
DE10221442B4 (de) * | 2002-05-15 | 2005-09-22 | Xignal Technologies Ag | Induktives Element einer integrierten Schaltung |
US7410484B2 (en) * | 2003-01-15 | 2008-08-12 | Cryodynamics, Llc | Cryotherapy probe |
US7083612B2 (en) | 2003-01-15 | 2006-08-01 | Cryodynamics, Llc | Cryotherapy system |
US7273479B2 (en) * | 2003-01-15 | 2007-09-25 | Cryodynamics, Llc | Methods and systems for cryogenic cooling |
DE102004045105A1 (de) | 2004-03-19 | 2005-10-13 | Daimlerchrysler Ag | Verwendung eines Photovoltaik-Elementes als Sensor zur Funktionskontrolle von Sendern im infraroten Bereich |
JP2006079846A (ja) * | 2004-09-07 | 2006-03-23 | Canon Inc | 試料の断面評価装置及び試料の断面評価方法 |
US8571614B1 (en) | 2009-10-12 | 2013-10-29 | Hypres, Inc. | Low-power biasing networks for superconducting integrated circuits |
AU2014327045B2 (en) | 2013-09-24 | 2019-08-08 | Adagio Medical, Inc. | Endovascular near critical fluid based cryoablation catheter and related methods |
WO2015160574A1 (en) | 2014-04-17 | 2015-10-22 | Adagio Medical, Inc. | Endovascular near critical fluid based cryoablation catheter having plurality of preformed treatment shapes |
JP6607938B2 (ja) | 2014-11-13 | 2019-11-20 | アダージョ メディカル インコーポレイテッド | 圧力調整型冷凍アブレーションシステム及び関連方法 |
US9945728B2 (en) | 2015-04-03 | 2018-04-17 | Raytheon Bbn Technologies Corp. | Graphene-based infrared single photon detector |
US10222416B1 (en) | 2015-04-14 | 2019-03-05 | Hypres, Inc. | System and method for array diagnostics in superconducting integrated circuit |
US9933310B2 (en) | 2015-06-17 | 2018-04-03 | Raytheon Bbn Technologies Corp. | Graphene-based infrared bolometer |
US9869592B2 (en) | 2015-06-17 | 2018-01-16 | Raytheon Bbn Technologies Corp. | Graphene-based bolometer |
US9799817B2 (en) | 2015-06-18 | 2017-10-24 | Raytheon Bbn Technologies Corp. | Josephson junction readout for graphene-based single photon detector |
US9577176B1 (en) * | 2015-06-18 | 2017-02-21 | Raytheon Bbn Technologies Corp. | Josephson junction readout for graphene-based single photon detector |
WO2017048965A1 (en) | 2015-09-18 | 2017-03-23 | Adagio Medical Inc. | Tissue contact verification system |
WO2017095756A1 (en) | 2015-11-30 | 2017-06-08 | Adagio Medical, Inc. | Ablation method for creating elongate continuous lesions enclosing multiple vessel entries |
CN111225626B (zh) | 2017-09-05 | 2023-11-14 | 艾达吉欧医疗公司 | 具有形状记忆探针的消融导管 |
KR20200106924A (ko) | 2018-01-10 | 2020-09-15 | 아다지오 메디컬, 인크. | 전도성 라이너를 갖는 절제 요소 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4334158A (en) * | 1980-06-06 | 1982-06-08 | International Business Machines Corporation | Superconducting switch and amplifier device |
DE3175179D1 (en) * | 1981-12-09 | 1986-09-25 | Ibm | Superconducting tunnel junction device |
JPS59210677A (ja) * | 1983-05-14 | 1984-11-29 | Nippon Telegr & Teleph Corp <Ntt> | ジヨセフソン接合を用いた光検出素子 |
DD248870A1 (de) * | 1986-02-03 | 1987-08-19 | Univ Schiller Jena | Anordnung zum hochempfindlichen nachweis elektromagnetischer strahlung mit supraleitendem quanteninterferenz- detektor |
US4843446A (en) * | 1986-02-27 | 1989-06-27 | Hitachi, Ltd. | Superconducting photodetector |
EP0301962B1 (de) * | 1987-07-27 | 1994-04-20 | Sumitomo Electric Industries Limited | Supraleitender Dünnfilm und Verfahren, um diesen zu präparieren |
EP0301902B1 (de) * | 1987-07-29 | 1993-09-29 | Sharp Kabushiki Kaisha | Verfahren und Anordnung zum Nachweisen eines Magnetfeldes mittels der Magneto-widerstandseigenschaften eines supraleitenden Materials |
JPS6450486A (en) * | 1987-08-20 | 1989-02-27 | Mitsubishi Electric Corp | Optical switch element |
US4814598A (en) * | 1987-09-03 | 1989-03-21 | Hypres, Inc. | Optical wavelength analyzer and image processing system utilizing Josephson junctions |
JPS6488318A (en) * | 1987-09-30 | 1989-04-03 | Nec Corp | Superconductive photodetector having memory function |
US4990487A (en) * | 1988-03-11 | 1991-02-05 | The University Of Tokyo | Superconductive optoelectronic devices |
US4970395A (en) * | 1988-12-23 | 1990-11-13 | Honeywell Inc. | Wavelength tunable infrared detector based upon super-schottky or superconductor-insulator-superconductor structures employing high transition temperature superconductors |
US4963852A (en) * | 1989-03-15 | 1990-10-16 | The United States Of America As Represented By The Secretary Of The Air Force | Superconductor switch |
-
1990
- 1990-07-04 DE DE69009109T patent/DE69009109T2/de not_active Expired - Fee Related
- 1990-07-04 DE DE69031501T patent/DE69031501T2/de not_active Expired - Fee Related
- 1990-07-04 EP EP90307302A patent/EP0407166B1/de not_active Expired - Lifetime
- 1990-07-04 EP EP93203066A patent/EP0590738B1/de not_active Expired - Lifetime
- 1990-07-05 US US07/548,212 patent/US5155093A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5155093A (en) | 1992-10-13 |
DE69031501T2 (de) | 1998-03-05 |
EP0407166A2 (de) | 1991-01-09 |
DE69009109T2 (de) | 1994-09-15 |
EP0590738A1 (de) | 1994-04-06 |
DE69009109D1 (de) | 1994-06-30 |
EP0590738B1 (de) | 1997-09-24 |
EP0407166B1 (de) | 1994-05-25 |
EP0407166A3 (en) | 1991-08-07 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |