DE69024453D1 - Verbessertes Kalibrierungsverfahren - Google Patents
Verbessertes KalibrierungsverfahrenInfo
- Publication number
- DE69024453D1 DE69024453D1 DE69024453T DE69024453T DE69024453D1 DE 69024453 D1 DE69024453 D1 DE 69024453D1 DE 69024453 T DE69024453 T DE 69024453T DE 69024453 T DE69024453 T DE 69024453T DE 69024453 D1 DE69024453 D1 DE 69024453D1
- Authority
- DE
- Germany
- Prior art keywords
- calibration procedure
- improved calibration
- improved
- procedure
- calibration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8483—Investigating reagent band
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/10—Composition for standardization, calibration, simulation, stabilization, preparation or preservation; processes of use in preparation for chemical testing
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Biological Materials (AREA)
- Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1265281A JPH0816649B2 (ja) | 1989-10-13 | 1989-10-13 | 液体分析の校正方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69024453D1 true DE69024453D1 (de) | 1996-02-08 |
DE69024453T2 DE69024453T2 (de) | 1996-06-05 |
Family
ID=17415044
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69024453T Expired - Fee Related DE69024453T2 (de) | 1989-10-13 | 1990-10-11 | Verbessertes Kalibrierungsverfahren |
Country Status (4)
Country | Link |
---|---|
US (1) | US5348889A (de) |
EP (1) | EP0422646B1 (de) |
JP (1) | JPH0816649B2 (de) |
DE (1) | DE69024453T2 (de) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ATE155249T1 (de) * | 1991-09-09 | 1997-07-15 | Canon Kk | Quantitativer nachweis vom lipid |
US5441418A (en) * | 1993-05-20 | 1995-08-15 | Binney & Smith Inc. | Thermochromic drawing device |
JP3504750B2 (ja) * | 1993-12-22 | 2004-03-08 | オルソ−クリニカル ダイアグノスティクス,インコーポレイティド | 検量関係式の再校正法及び定量試験キット |
US5514635A (en) * | 1993-12-29 | 1996-05-07 | Optum Corporation | Thermal writing surface and method for making the same |
US5550053A (en) * | 1995-01-05 | 1996-08-27 | Si Industrial Instruments, Inc. | Method of calibrating an automatic chemical analyzer |
US6649075B1 (en) * | 1996-07-23 | 2003-11-18 | Applied Materials, Inc. | Method and apparatus for measuring etch uniformity of a semiconductor wafer |
US6277584B1 (en) | 1998-12-16 | 2001-08-21 | Dade Behring Inc. | Method for calibrating a chemical analyzer with improved accuracy at low signal levels |
WO2002025253A1 (en) * | 2000-09-25 | 2002-03-28 | Matsushita Electric Industrial Co., Ltd. | Device for chromatographic quantitative measurement |
US20060200070A1 (en) * | 2005-02-14 | 2006-09-07 | Callicoat David N | Method and apparatus for calibrating an analyte detection system with a calibration sample |
US7883898B2 (en) * | 2007-05-07 | 2011-02-08 | General Electric Company | Method and apparatus for measuring pH of low alkalinity solutions |
US8597190B2 (en) | 2007-05-18 | 2013-12-03 | Optiscan Biomedical Corporation | Monitoring systems and methods with fast initialization |
EP3156796A1 (de) | 2010-06-09 | 2017-04-19 | Optiscan Biomedical Corporation | Messung von analyten in einer flüssigkeitsprobe aus einem patienten |
EP2877952B1 (de) | 2012-07-27 | 2023-04-12 | Gen-Probe Incorporated | Dual-referenzkalibrierverfahren und system zum quantifizieren von polynukleotiden |
CN104019842B (zh) * | 2014-05-27 | 2016-08-31 | 格力电器(合肥)有限公司 | 校准工装和校准方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3992158A (en) * | 1973-08-16 | 1976-11-16 | Eastman Kodak Company | Integral analytical element |
JPS6358164A (ja) * | 1986-08-28 | 1988-03-12 | Shimadzu Corp | デ−タ処理装置 |
JPS63111446A (ja) * | 1986-10-29 | 1988-05-16 | Konica Corp | 分析装置 |
JPS63132166A (ja) * | 1986-11-21 | 1988-06-04 | Olympus Optical Co Ltd | 検量線設定方法 |
JPS63169539A (ja) * | 1987-01-07 | 1988-07-13 | Hitachi Ltd | 非直線性検量線作成用モデル関数自動選択機能を有する分析装置 |
JPH01124751A (ja) * | 1987-11-10 | 1989-05-17 | Konica Corp | 変換式の作成方法 |
JPH0746111B2 (ja) * | 1988-03-18 | 1995-05-17 | 株式会社日立製作所 | 試料分析方法及びこれを用いた自動分析装置 |
US5126952A (en) * | 1991-01-22 | 1992-06-30 | Eastman Kodak Company | Bar coding calibration |
-
1989
- 1989-10-13 JP JP1265281A patent/JPH0816649B2/ja not_active Expired - Fee Related
-
1990
- 1990-10-11 EP EP90119509A patent/EP0422646B1/de not_active Expired - Lifetime
- 1990-10-11 DE DE69024453T patent/DE69024453T2/de not_active Expired - Fee Related
-
1992
- 1992-09-04 US US07/940,770 patent/US5348889A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69024453T2 (de) | 1996-06-05 |
EP0422646A2 (de) | 1991-04-17 |
EP0422646B1 (de) | 1995-12-27 |
EP0422646A3 (en) | 1992-01-08 |
JPH0816649B2 (ja) | 1996-02-21 |
JPH03128439A (ja) | 1991-05-31 |
US5348889A (en) | 1994-09-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: FUJIFILM CORP., TOKIO/TOKYO, JP |
|
8339 | Ceased/non-payment of the annual fee |