DE69024453D1 - Verbessertes Kalibrierungsverfahren - Google Patents

Verbessertes Kalibrierungsverfahren

Info

Publication number
DE69024453D1
DE69024453D1 DE69024453T DE69024453T DE69024453D1 DE 69024453 D1 DE69024453 D1 DE 69024453D1 DE 69024453 T DE69024453 T DE 69024453T DE 69024453 T DE69024453 T DE 69024453T DE 69024453 D1 DE69024453 D1 DE 69024453D1
Authority
DE
Germany
Prior art keywords
calibration procedure
improved calibration
improved
procedure
calibration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69024453T
Other languages
English (en)
Other versions
DE69024453T2 (de
Inventor
Masaaki Terashima
Hajime Makiuchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Publication of DE69024453D1 publication Critical patent/DE69024453D1/de
Application granted granted Critical
Publication of DE69024453T2 publication Critical patent/DE69024453T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/8483Investigating reagent band
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00Chemistry: analytical and immunological testing
    • Y10T436/10Composition for standardization, calibration, simulation, stabilization, preparation or preservation; processes of use in preparation for chemical testing

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
DE69024453T 1989-10-13 1990-10-11 Verbessertes Kalibrierungsverfahren Expired - Fee Related DE69024453T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1265281A JPH0816649B2 (ja) 1989-10-13 1989-10-13 液体分析の校正方法

Publications (2)

Publication Number Publication Date
DE69024453D1 true DE69024453D1 (de) 1996-02-08
DE69024453T2 DE69024453T2 (de) 1996-06-05

Family

ID=17415044

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69024453T Expired - Fee Related DE69024453T2 (de) 1989-10-13 1990-10-11 Verbessertes Kalibrierungsverfahren

Country Status (4)

Country Link
US (1) US5348889A (de)
EP (1) EP0422646B1 (de)
JP (1) JPH0816649B2 (de)
DE (1) DE69024453T2 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE155249T1 (de) * 1991-09-09 1997-07-15 Canon Kk Quantitativer nachweis vom lipid
US5441418A (en) * 1993-05-20 1995-08-15 Binney & Smith Inc. Thermochromic drawing device
JP3504750B2 (ja) * 1993-12-22 2004-03-08 オルソ−クリニカル ダイアグノスティクス,インコーポレイティド 検量関係式の再校正法及び定量試験キット
US5514635A (en) * 1993-12-29 1996-05-07 Optum Corporation Thermal writing surface and method for making the same
US5550053A (en) * 1995-01-05 1996-08-27 Si Industrial Instruments, Inc. Method of calibrating an automatic chemical analyzer
US6649075B1 (en) * 1996-07-23 2003-11-18 Applied Materials, Inc. Method and apparatus for measuring etch uniformity of a semiconductor wafer
US6277584B1 (en) 1998-12-16 2001-08-21 Dade Behring Inc. Method for calibrating a chemical analyzer with improved accuracy at low signal levels
WO2002025253A1 (en) * 2000-09-25 2002-03-28 Matsushita Electric Industrial Co., Ltd. Device for chromatographic quantitative measurement
US20060200070A1 (en) * 2005-02-14 2006-09-07 Callicoat David N Method and apparatus for calibrating an analyte detection system with a calibration sample
US7883898B2 (en) * 2007-05-07 2011-02-08 General Electric Company Method and apparatus for measuring pH of low alkalinity solutions
US8597190B2 (en) 2007-05-18 2013-12-03 Optiscan Biomedical Corporation Monitoring systems and methods with fast initialization
EP3156796A1 (de) 2010-06-09 2017-04-19 Optiscan Biomedical Corporation Messung von analyten in einer flüssigkeitsprobe aus einem patienten
EP2877952B1 (de) 2012-07-27 2023-04-12 Gen-Probe Incorporated Dual-referenzkalibrierverfahren und system zum quantifizieren von polynukleotiden
CN104019842B (zh) * 2014-05-27 2016-08-31 格力电器(合肥)有限公司 校准工装和校准方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3992158A (en) * 1973-08-16 1976-11-16 Eastman Kodak Company Integral analytical element
JPS6358164A (ja) * 1986-08-28 1988-03-12 Shimadzu Corp デ−タ処理装置
JPS63111446A (ja) * 1986-10-29 1988-05-16 Konica Corp 分析装置
JPS63132166A (ja) * 1986-11-21 1988-06-04 Olympus Optical Co Ltd 検量線設定方法
JPS63169539A (ja) * 1987-01-07 1988-07-13 Hitachi Ltd 非直線性検量線作成用モデル関数自動選択機能を有する分析装置
JPH01124751A (ja) * 1987-11-10 1989-05-17 Konica Corp 変換式の作成方法
JPH0746111B2 (ja) * 1988-03-18 1995-05-17 株式会社日立製作所 試料分析方法及びこれを用いた自動分析装置
US5126952A (en) * 1991-01-22 1992-06-30 Eastman Kodak Company Bar coding calibration

Also Published As

Publication number Publication date
DE69024453T2 (de) 1996-06-05
EP0422646A2 (de) 1991-04-17
EP0422646B1 (de) 1995-12-27
EP0422646A3 (en) 1992-01-08
JPH0816649B2 (ja) 1996-02-21
JPH03128439A (ja) 1991-05-31
US5348889A (en) 1994-09-20

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: FUJIFILM CORP., TOKIO/TOKYO, JP

8339 Ceased/non-payment of the annual fee