DE69020791D1 - Dicken- oder Dichtemessgerät. - Google Patents

Dicken- oder Dichtemessgerät.

Info

Publication number
DE69020791D1
DE69020791D1 DE69020791T DE69020791T DE69020791D1 DE 69020791 D1 DE69020791 D1 DE 69020791D1 DE 69020791 T DE69020791 T DE 69020791T DE 69020791 T DE69020791 T DE 69020791T DE 69020791 D1 DE69020791 D1 DE 69020791D1
Authority
DE
Germany
Prior art keywords
thickness
disclosed
source
pin diode
measuring apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Revoked
Application number
DE69020791T
Other languages
English (en)
Other versions
DE69020791T2 (de
Inventor
John W Pettit
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Adaptive Technologies Inc
Original Assignee
Adaptive Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=23338991&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE69020791(D1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Adaptive Technologies Inc filed Critical Adaptive Technologies Inc
Publication of DE69020791D1 publication Critical patent/DE69020791D1/de
Application granted granted Critical
Publication of DE69020791T2 publication Critical patent/DE69020791T2/de
Anticipated expiration legal-status Critical
Revoked legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C48/00—Extrusion moulding, i.e. expressing the moulding material through a die or nozzle which imparts the desired form; Apparatus therefor
    • B29C48/25—Component parts, details or accessories; Auxiliary operations
    • B29C48/92—Measuring, controlling or regulating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D5/00—Control of dimensions of material
    • G05D5/02—Control of dimensions of material of thickness, e.g. of rolled material
    • G05D5/03—Control of dimensions of material of thickness, e.g. of rolled material characterised by the use of electric means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92009—Measured parameter
    • B29C2948/92114—Dimensions
    • B29C2948/92152—Thickness
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92323—Location or phase of measurement
    • B29C2948/92361—Extrusion unit
    • B29C2948/92409—Die; Nozzle zone
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92323—Location or phase of measurement
    • B29C2948/92438—Conveying, transporting or storage of articles
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92504—Controlled parameter
    • B29C2948/92609—Dimensions
    • B29C2948/92647—Thickness
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92819—Location or phase of control
    • B29C2948/92857—Extrusion unit
    • B29C2948/92904—Die; Nozzle zone
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
    • B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
    • B29C2948/00—Indexing scheme relating to extrusion moulding
    • B29C2948/92—Measuring, controlling or regulating
    • B29C2948/92819—Location or phase of control
    • B29C2948/92933—Conveying, transporting or storage of articles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/44—Resins; rubber; leather
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N9/00—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity
    • G01N9/24—Investigating density or specific gravity of materials; Analysing materials by determining density or specific gravity by observing the transmission of wave or particle radiation through the material
DE69020791T 1989-04-21 1990-04-19 Dicken- oder Dichtemessgerät. Revoked DE69020791T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/341,776 US5099504A (en) 1987-03-31 1989-04-21 Thickness/density mesuring apparatus

Publications (2)

Publication Number Publication Date
DE69020791D1 true DE69020791D1 (de) 1995-08-17
DE69020791T2 DE69020791T2 (de) 1996-03-07

Family

ID=23338991

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69020791T Revoked DE69020791T2 (de) 1989-04-21 1990-04-19 Dicken- oder Dichtemessgerät.

Country Status (7)

Country Link
US (1) US5099504A (de)
EP (1) EP0396283B1 (de)
JP (1) JPH0623650B2 (de)
KR (1) KR900016735A (de)
AT (1) ATE125037T1 (de)
CA (1) CA2014893A1 (de)
DE (1) DE69020791T2 (de)

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US6491938B2 (en) 1993-05-13 2002-12-10 Neorx Corporation Therapeutic inhibitor of vascular smooth muscle cells
FR2716259B1 (fr) * 1994-02-11 1996-04-19 Lorraine Laminage Dispositif pour la mesure du profil d'épaisseur d'un produit métallique sous forme de bande ou de plaque en défilement.
US5434774A (en) * 1994-03-02 1995-07-18 Fisher Controls International, Inc. Interface apparatus for two-wire communication in process control loops
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NL1012750C2 (nl) * 1999-07-30 2001-02-01 Dsm Nv Werkwijze voor het bepalen van de dichtheid van een vezel.
JP3517388B2 (ja) * 2000-06-14 2004-04-12 新光電気工業株式会社 バンプの検査方法及びバンプの検査装置
KR100449501B1 (ko) * 2001-12-21 2004-09-21 하이테콤시스템(주) 피혁의 조밀도 추출 장치, 방법 및 프로그램이 기록된기록매체
US7005639B2 (en) * 2003-07-28 2006-02-28 Abb Inc. System and method of composition correction for beta gauges
ES2247933B1 (es) * 2004-07-15 2007-05-16 Asociacion De Investigacion De Las Industrias Ceramicas A.I.C.E. Metodo y aparato no destructivo para la medida de la densidad en baldosas ceramicas.
KR100750961B1 (ko) * 2004-11-09 2007-08-22 한국생산기술연구원 섬유집합체 적층 밀도의 측정 방법 및 측정 장치
NZ538649A (en) 2005-03-07 2006-10-27 Inst Geolog Nuclear Sciences Estimating strengths of wooden supports using gamma rays
US7469033B2 (en) 2006-11-13 2008-12-23 Thermo Fisher Scientific Inc. Density measurement with gamma backscattering
US7903265B2 (en) * 2008-04-04 2011-03-08 Toyota Motor Engineering & Manufacturing North America, Inc. Method for measuring coating uniformity
US7937233B2 (en) 2008-04-17 2011-05-03 3M Innovative Properties Company Preferential defect marking on a web
CN101671809B (zh) * 2008-09-08 2012-09-19 鸿富锦精密工业（深圳）有限公司 镀膜装置
CN101629890B (zh) * 2009-08-17 2011-07-06 昆明理工大学 浮子式光纤光栅液体密度计
US8586913B2 (en) 2011-01-10 2013-11-19 Schlumberger Technology Corporation Fluidic density measurements based on beta particles detection
US9465061B2 (en) 2012-05-16 2016-10-11 Transtech Systems, Inc. In-process material characterization
JP2014062822A (ja) * 2012-09-21 2014-04-10 Sony Corp 微小粒子分析装置及び微小粒子分析方法
GB201402266D0 (en) * 2014-02-10 2014-03-26 Mechtronic Ltd Apparatus for determining identity and/or quantity of a fuel
US10527570B2 (en) 2016-01-12 2020-01-07 Transtech Systems, Inc. Determining location of electromagnetic impedance spectrographic analysis using electromagnetic impedance tomography
GB2559164B (en) * 2017-01-27 2021-11-10 Teraview Ltd Method and system for measuring coating thicknesses
GB201716550D0 (en) 2017-10-10 2017-11-22 British American Tobacco Investments Ltd Rod inspection method and apparatus
DE102019135733B3 (de) * 2019-12-23 2021-01-21 Jenoptik Automatisierungstechnik Gmbh Verfahren zur Herstellung eines Verkleidungsteils
CN112614780A (zh) * 2020-12-16 2021-04-06 上海华力微电子有限公司 一种晶圆尖峰退火监控方法
CN114833024B (zh) * 2021-02-01 2024-01-05 浙江华正新材料股份有限公司 提高半固化片基重均匀性的方法及上胶机
DE102021115492A1 (de) 2021-04-14 2022-10-20 MTU Aero Engines AG Verfahren zur charakterisierung einer beschichtung

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Also Published As

Publication number Publication date
US5099504A (en) 1992-03-24
CA2014893A1 (en) 1990-10-21
EP0396283A2 (de) 1990-11-07
JPH0363511A (ja) 1991-03-19
JPH0623650B2 (ja) 1994-03-30
ATE125037T1 (de) 1995-07-15
DE69020791T2 (de) 1996-03-07
EP0396283B1 (de) 1995-07-12
EP0396283A3 (de) 1992-09-23
KR900016735A (ko) 1990-11-14

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Legal Events

Date Code Title Description
8363 Opposition against the patent
8331 Complete revocation