DE69015401D1 - Instrument zur gleichzeitigen optischen Messung von thermischen und elektrischen Grössen. - Google Patents
Instrument zur gleichzeitigen optischen Messung von thermischen und elektrischen Grössen.Info
- Publication number
- DE69015401D1 DE69015401D1 DE69015401T DE69015401T DE69015401D1 DE 69015401 D1 DE69015401 D1 DE 69015401D1 DE 69015401 T DE69015401 T DE 69015401T DE 69015401 T DE69015401 T DE 69015401T DE 69015401 D1 DE69015401 D1 DE 69015401D1
- Authority
- DE
- Germany
- Prior art keywords
- instrument
- thermal
- optical measurement
- electrical quantities
- simultaneous optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Magnetic Variables (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Radiation Pyrometers (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1083002A JPH0670653B2 (ja) | 1989-03-31 | 1989-03-31 | 光温度・電気量測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69015401D1 true DE69015401D1 (de) | 1995-02-09 |
DE69015401T2 DE69015401T2 (de) | 1995-08-10 |
Family
ID=13790049
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69015401T Expired - Fee Related DE69015401T2 (de) | 1989-03-31 | 1990-03-30 | Instrument zur gleichzeitigen optischen Messung von thermischen und elektrischen Grössen. |
Country Status (4)
Country | Link |
---|---|
US (1) | US5053617A (de) |
EP (1) | EP0390581B1 (de) |
JP (1) | JPH0670653B2 (de) |
DE (1) | DE69015401T2 (de) |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0778526B2 (ja) * | 1991-08-29 | 1995-08-23 | 日本碍子株式会社 | 光磁界センサ |
AU643913B2 (en) * | 1992-02-21 | 1993-11-25 | Ngk Insulators, Ltd. | Optical magnetic field sensor |
DE4312183A1 (de) * | 1993-04-14 | 1994-10-20 | Siemens Ag | Optisches Meßverfahren zum Messen eines elektrischen Wechselstromes mit Temperaturkompensation und Vorrichtung zur Durchführung des Verfahrens |
DE69427219T2 (de) * | 1993-07-07 | 2001-11-15 | Tokin Corp., Sendai | Fühler für elektrische felder |
EP0668507B1 (de) * | 1993-07-07 | 2002-10-09 | NEC TOKIN Corporation | Fühler für elektrische felder |
CN1052071C (zh) * | 1993-07-07 | 2000-05-03 | 株式会社东金 | 电场传感器 |
US5561547A (en) * | 1994-02-04 | 1996-10-01 | Spectra-Physics Lasers, Inc. | Thermal lens of controlled ellipicity |
DE4436181A1 (de) * | 1994-10-10 | 1996-04-11 | Siemens Ag | Verfahren und Vorrichtung zum Messen einer elektrischen Wechselgröße mit Temperaturkompensation durch Fitting |
DE59505669D1 (de) * | 1994-10-12 | 1999-05-20 | Siemens Ag | Optisches messverfahren und optische messvorrichtung zum messen einer elektrischen wechselspannung oder eines elektrischen wechselfeldes mit temperaturkompensation |
JP3577349B2 (ja) * | 1994-12-27 | 2004-10-13 | 株式会社東芝 | 光変調型センサおよびこのセンサを用いたプロセス計測装置 |
DE19517128A1 (de) * | 1995-05-10 | 1996-11-14 | Siemens Ag | Verfahren und Anordnung zum Messen eines magnetischen Wechselfeldes mit Off-set-Faraday-Rotation zur Temperaturkompensation |
DE19624922A1 (de) * | 1996-06-21 | 1998-01-08 | Siemens Ag | Optisches Meßverfahren und optische Meßanordnung zum Messen einer Wechselgröße mit Temperaturkompensation mit Hilfe von Gleichsignalanteilen |
FR2751409A1 (fr) * | 1996-07-19 | 1998-01-23 | Univ Metz | Capteur thermo-optique de temperature utilisant le modulation electrique d'un signal optique |
US5696858A (en) * | 1996-08-01 | 1997-12-09 | The Texas A&M University System | Fiber Optics apparatus and method for accurate current sensing |
US6140634A (en) * | 1996-09-19 | 2000-10-31 | Siemens Aktiengesellschaft | Sensor for measuring electrical current strength and/or voltage |
DE19716477B4 (de) * | 1997-03-05 | 2011-11-10 | Areva T&D Sa | Verfahren und Einrichtung zur Messung einer elektrischen Spannung |
DE29707379U1 (de) * | 1997-04-24 | 1997-06-19 | PMK Mess- und Kommunikationstechnik GmbH, 63150 Heusenstamm | Gerät zur Messung von Hochspannung an Hochspannungsleitungen |
US6075592A (en) * | 1997-12-31 | 2000-06-13 | Telcordia Technologies, Inc. | Fiber-optics based micro-photoluminescence system |
DE19842487C1 (de) * | 1998-09-16 | 2000-02-10 | Siemens Ag | Verfahren und Anordnung zum Messen eines magnetischen Wechselfeldes mit Temperaturkompensation |
JP2001349872A (ja) * | 2000-06-06 | 2001-12-21 | Shimadzu Corp | 磁気センサ |
DE10140482B4 (de) | 2001-08-17 | 2008-11-13 | Siemens Ag | Verfahren und Vorrichtung zur Störgrößenkompensation eines optischen Sensors |
AUPR832901A0 (en) * | 2001-10-18 | 2001-11-08 | Australian National University, The | Electro-optically modulated birefringent filter and method for estimation of lackbody temperatures |
US6776522B2 (en) * | 2002-10-09 | 2004-08-17 | Steven J. Syracuse | Apparatus and system for monitoring temperature of high voltage conductors |
CN100498298C (zh) * | 2006-04-19 | 2009-06-10 | 中国科学院半导体研究所 | 变温显微磁光光谱系统 |
EP2380029B1 (de) * | 2009-01-16 | 2015-10-21 | Toyota Jidosha Kabushiki Kaisha | Auf grosser faraday-drehung basierender ultraempfindlicher magnetsensor |
CN101806623B (zh) * | 2010-04-07 | 2011-10-05 | 中国科学院半导体研究所 | 一种多功能反射式磁光光谱测量系统 |
CN102288839B (zh) * | 2011-05-12 | 2013-05-01 | 清华大学 | 光电集成三维电场传感器系统 |
CN102680408B (zh) * | 2012-05-15 | 2014-04-23 | 中国科学院半导体研究所 | 磁圆二向色性光电导谱测量系统 |
DE112014003851B4 (de) * | 2013-08-22 | 2020-12-24 | Leoni Kabel Gmbh | Sensorbaueinheit |
CN107091950B (zh) * | 2016-02-16 | 2021-01-19 | 姚晓天 | 基于光学传感原理集成了温度传感的反射式电流和磁场传感器 |
GB201719576D0 (en) * | 2017-11-24 | 2018-01-10 | Univ Southampton | Magnetic field sensors, methods of detecting a magnetic field, and related magnetically responsive light propagating components and optical devices |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4071751A (en) * | 1976-04-26 | 1978-01-31 | Rca Limited | Automatic optical bias control for light modulators |
US4094581A (en) * | 1977-01-31 | 1978-06-13 | Westinghouse Electric Corp. | Electro-optic modulator with compensation of thermally induced birefringence |
DE2812188A1 (de) * | 1978-03-20 | 1979-09-27 | Siemens Ag | Verfahren zur magnetooptischen strommessung |
JPS58109859A (ja) * | 1981-12-24 | 1983-06-30 | Sumitomo Electric Ind Ltd | 光による電圧・電界測定器 |
JPS58139082A (ja) * | 1982-02-15 | 1983-08-18 | Hitachi Ltd | 磁界測定装置 |
FR2524650A1 (fr) * | 1982-04-06 | 1983-10-07 | Thomson Csf | Magnetometre optique |
JPS5919875A (ja) * | 1982-07-27 | 1984-02-01 | Toshiba Corp | 磁界測定装置 |
FR2535464A1 (fr) * | 1982-10-28 | 1984-05-04 | Commissariat Energie Atomique | Dispositif de mesure de temperature et/ou d'intensite electrique a effet faraday |
JPS5981570A (ja) * | 1982-11-01 | 1984-05-11 | Hitachi Ltd | 光方式磁界測定装置 |
US4613811A (en) * | 1984-09-04 | 1986-09-23 | Westinghouse Electric Corp. | Faraday current sensor with fiber optic compensated by temperature, degradation, and linearity |
GB2164145B (en) * | 1984-09-04 | 1989-01-05 | Westinghouse Electric Corp | Temperature compensated current sensor involving faraday effect and fiber optics |
JPS61186861A (ja) * | 1985-02-14 | 1986-08-20 | Matsushita Electric Ind Co Ltd | 光フアイバ応用センサ装置 |
US4683421A (en) * | 1985-03-29 | 1987-07-28 | Westinghouse Electric Corp. | Drift compensation technique for a magneto-optic current sensor |
JPS62272158A (ja) * | 1986-05-20 | 1987-11-26 | Ngk Insulators Ltd | 検電装置 |
FR2599516B1 (fr) * | 1986-05-27 | 1988-08-12 | Commissariat Energie Atomique | Dispositif de mesure de champ electrostatique par une methode optique |
US4894608A (en) * | 1987-07-22 | 1990-01-16 | Square D Company | Electric current sensor using the faraday effect |
JPH0668508B2 (ja) * | 1988-03-03 | 1994-08-31 | 日本碍子株式会社 | 光電流・磁界計測方法及び装置 |
JPH0670651B2 (ja) * | 1988-07-09 | 1994-09-07 | 日本碍子株式会社 | 光による電・磁気量測定方法及び装置 |
-
1989
- 1989-03-31 JP JP1083002A patent/JPH0670653B2/ja not_active Expired - Lifetime
-
1990
- 1990-03-30 EP EP90303422A patent/EP0390581B1/de not_active Expired - Lifetime
- 1990-03-30 DE DE69015401T patent/DE69015401T2/de not_active Expired - Fee Related
- 1990-04-02 US US07/502,871 patent/US5053617A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0390581B1 (de) | 1994-12-28 |
DE69015401T2 (de) | 1995-08-10 |
EP0390581A2 (de) | 1990-10-03 |
JPH0670653B2 (ja) | 1994-09-07 |
EP0390581A3 (de) | 1991-07-03 |
JPH02262067A (ja) | 1990-10-24 |
US5053617A (en) | 1991-10-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |