DE69015401D1 - Instrument zur gleichzeitigen optischen Messung von thermischen und elektrischen Grössen. - Google Patents

Instrument zur gleichzeitigen optischen Messung von thermischen und elektrischen Grössen.

Info

Publication number
DE69015401D1
DE69015401D1 DE69015401T DE69015401T DE69015401D1 DE 69015401 D1 DE69015401 D1 DE 69015401D1 DE 69015401 T DE69015401 T DE 69015401T DE 69015401 T DE69015401 T DE 69015401T DE 69015401 D1 DE69015401 D1 DE 69015401D1
Authority
DE
Germany
Prior art keywords
instrument
thermal
optical measurement
electrical quantities
simultaneous optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69015401T
Other languages
English (en)
Other versions
DE69015401T2 (de
Inventor
Yuichi Kakizaki
Yoshinari Kozuka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NGK Insulators Ltd
Original Assignee
NGK Insulators Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NGK Insulators Ltd filed Critical NGK Insulators Ltd
Application granted granted Critical
Publication of DE69015401D1 publication Critical patent/DE69015401D1/de
Publication of DE69015401T2 publication Critical patent/DE69015401T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Magnetic Variables (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
  • Radiation Pyrometers (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
DE69015401T 1989-03-31 1990-03-30 Instrument zur gleichzeitigen optischen Messung von thermischen und elektrischen Grössen. Expired - Fee Related DE69015401T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1083002A JPH0670653B2 (ja) 1989-03-31 1989-03-31 光温度・電気量測定装置

Publications (2)

Publication Number Publication Date
DE69015401D1 true DE69015401D1 (de) 1995-02-09
DE69015401T2 DE69015401T2 (de) 1995-08-10

Family

ID=13790049

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69015401T Expired - Fee Related DE69015401T2 (de) 1989-03-31 1990-03-30 Instrument zur gleichzeitigen optischen Messung von thermischen und elektrischen Grössen.

Country Status (4)

Country Link
US (1) US5053617A (de)
EP (1) EP0390581B1 (de)
JP (1) JPH0670653B2 (de)
DE (1) DE69015401T2 (de)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0778526B2 (ja) * 1991-08-29 1995-08-23 日本碍子株式会社 光磁界センサ
AU643913B2 (en) * 1992-02-21 1993-11-25 Ngk Insulators, Ltd. Optical magnetic field sensor
DE4312183A1 (de) * 1993-04-14 1994-10-20 Siemens Ag Optisches Meßverfahren zum Messen eines elektrischen Wechselstromes mit Temperaturkompensation und Vorrichtung zur Durchführung des Verfahrens
DE69427219T2 (de) * 1993-07-07 2001-11-15 Tokin Corp., Sendai Fühler für elektrische felder
EP0668507B1 (de) * 1993-07-07 2002-10-09 NEC TOKIN Corporation Fühler für elektrische felder
CN1052071C (zh) * 1993-07-07 2000-05-03 株式会社东金 电场传感器
US5561547A (en) * 1994-02-04 1996-10-01 Spectra-Physics Lasers, Inc. Thermal lens of controlled ellipicity
DE4436181A1 (de) * 1994-10-10 1996-04-11 Siemens Ag Verfahren und Vorrichtung zum Messen einer elektrischen Wechselgröße mit Temperaturkompensation durch Fitting
DE59505669D1 (de) * 1994-10-12 1999-05-20 Siemens Ag Optisches messverfahren und optische messvorrichtung zum messen einer elektrischen wechselspannung oder eines elektrischen wechselfeldes mit temperaturkompensation
JP3577349B2 (ja) * 1994-12-27 2004-10-13 株式会社東芝 光変調型センサおよびこのセンサを用いたプロセス計測装置
DE19517128A1 (de) * 1995-05-10 1996-11-14 Siemens Ag Verfahren und Anordnung zum Messen eines magnetischen Wechselfeldes mit Off-set-Faraday-Rotation zur Temperaturkompensation
DE19624922A1 (de) * 1996-06-21 1998-01-08 Siemens Ag Optisches Meßverfahren und optische Meßanordnung zum Messen einer Wechselgröße mit Temperaturkompensation mit Hilfe von Gleichsignalanteilen
FR2751409A1 (fr) * 1996-07-19 1998-01-23 Univ Metz Capteur thermo-optique de temperature utilisant le modulation electrique d'un signal optique
US5696858A (en) * 1996-08-01 1997-12-09 The Texas A&M University System Fiber Optics apparatus and method for accurate current sensing
US6140634A (en) * 1996-09-19 2000-10-31 Siemens Aktiengesellschaft Sensor for measuring electrical current strength and/or voltage
DE19716477B4 (de) * 1997-03-05 2011-11-10 Areva T&D Sa Verfahren und Einrichtung zur Messung einer elektrischen Spannung
DE29707379U1 (de) * 1997-04-24 1997-06-19 PMK Mess- und Kommunikationstechnik GmbH, 63150 Heusenstamm Gerät zur Messung von Hochspannung an Hochspannungsleitungen
US6075592A (en) * 1997-12-31 2000-06-13 Telcordia Technologies, Inc. Fiber-optics based micro-photoluminescence system
DE19842487C1 (de) * 1998-09-16 2000-02-10 Siemens Ag Verfahren und Anordnung zum Messen eines magnetischen Wechselfeldes mit Temperaturkompensation
JP2001349872A (ja) * 2000-06-06 2001-12-21 Shimadzu Corp 磁気センサ
DE10140482B4 (de) 2001-08-17 2008-11-13 Siemens Ag Verfahren und Vorrichtung zur Störgrößenkompensation eines optischen Sensors
AUPR832901A0 (en) * 2001-10-18 2001-11-08 Australian National University, The Electro-optically modulated birefringent filter and method for estimation of lackbody temperatures
US6776522B2 (en) * 2002-10-09 2004-08-17 Steven J. Syracuse Apparatus and system for monitoring temperature of high voltage conductors
CN100498298C (zh) * 2006-04-19 2009-06-10 中国科学院半导体研究所 变温显微磁光光谱系统
EP2380029B1 (de) * 2009-01-16 2015-10-21 Toyota Jidosha Kabushiki Kaisha Auf grosser faraday-drehung basierender ultraempfindlicher magnetsensor
CN101806623B (zh) * 2010-04-07 2011-10-05 中国科学院半导体研究所 一种多功能反射式磁光光谱测量系统
CN102288839B (zh) * 2011-05-12 2013-05-01 清华大学 光电集成三维电场传感器系统
CN102680408B (zh) * 2012-05-15 2014-04-23 中国科学院半导体研究所 磁圆二向色性光电导谱测量系统
DE112014003851B4 (de) * 2013-08-22 2020-12-24 Leoni Kabel Gmbh Sensorbaueinheit
CN107091950B (zh) * 2016-02-16 2021-01-19 姚晓天 基于光学传感原理集成了温度传感的反射式电流和磁场传感器
GB201719576D0 (en) * 2017-11-24 2018-01-10 Univ Southampton Magnetic field sensors, methods of detecting a magnetic field, and related magnetically responsive light propagating components and optical devices

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4071751A (en) * 1976-04-26 1978-01-31 Rca Limited Automatic optical bias control for light modulators
US4094581A (en) * 1977-01-31 1978-06-13 Westinghouse Electric Corp. Electro-optic modulator with compensation of thermally induced birefringence
DE2812188A1 (de) * 1978-03-20 1979-09-27 Siemens Ag Verfahren zur magnetooptischen strommessung
JPS58109859A (ja) * 1981-12-24 1983-06-30 Sumitomo Electric Ind Ltd 光による電圧・電界測定器
JPS58139082A (ja) * 1982-02-15 1983-08-18 Hitachi Ltd 磁界測定装置
FR2524650A1 (fr) * 1982-04-06 1983-10-07 Thomson Csf Magnetometre optique
JPS5919875A (ja) * 1982-07-27 1984-02-01 Toshiba Corp 磁界測定装置
FR2535464A1 (fr) * 1982-10-28 1984-05-04 Commissariat Energie Atomique Dispositif de mesure de temperature et/ou d'intensite electrique a effet faraday
JPS5981570A (ja) * 1982-11-01 1984-05-11 Hitachi Ltd 光方式磁界測定装置
US4613811A (en) * 1984-09-04 1986-09-23 Westinghouse Electric Corp. Faraday current sensor with fiber optic compensated by temperature, degradation, and linearity
GB2164145B (en) * 1984-09-04 1989-01-05 Westinghouse Electric Corp Temperature compensated current sensor involving faraday effect and fiber optics
JPS61186861A (ja) * 1985-02-14 1986-08-20 Matsushita Electric Ind Co Ltd 光フアイバ応用センサ装置
US4683421A (en) * 1985-03-29 1987-07-28 Westinghouse Electric Corp. Drift compensation technique for a magneto-optic current sensor
JPS62272158A (ja) * 1986-05-20 1987-11-26 Ngk Insulators Ltd 検電装置
FR2599516B1 (fr) * 1986-05-27 1988-08-12 Commissariat Energie Atomique Dispositif de mesure de champ electrostatique par une methode optique
US4894608A (en) * 1987-07-22 1990-01-16 Square D Company Electric current sensor using the faraday effect
JPH0668508B2 (ja) * 1988-03-03 1994-08-31 日本碍子株式会社 光電流・磁界計測方法及び装置
JPH0670651B2 (ja) * 1988-07-09 1994-09-07 日本碍子株式会社 光による電・磁気量測定方法及び装置

Also Published As

Publication number Publication date
EP0390581B1 (de) 1994-12-28
DE69015401T2 (de) 1995-08-10
EP0390581A2 (de) 1990-10-03
JPH0670653B2 (ja) 1994-09-07
EP0390581A3 (de) 1991-07-03
JPH02262067A (ja) 1990-10-24
US5053617A (en) 1991-10-01

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee